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Optimal test generation for finite state machine models

  • US 4,991,176 A
  • Filed: 06/07/1989
  • Issued: 02/05/1991
  • Est. Priority Date: 06/07/1989
  • Status: Expired due to Fees
First Claim
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1. A method for developing test sequences for evaluating a design or operation of a finite state machine, said finite state machine characterized by a state diagram having states and original edges interconnecting the states, said method comprising the steps of:

  • evaluating unique input/output sequences for each state of said finite state machine so that the unique input/output sequence selected for each state exhibits a minimum cost among all unique input/output sequences evaluated for that state;

    expanding said state diagram as a test graph including said states, said original edges, and a plurality of test edges interconnecting the states, said plurality of test edges for testing original edges of the state diagram;

    evaluating said test graph for symmetry and, if not symmetric, duplicating selected test edges of said plurality to make said test graph symmetric with a minimum cost; and

    generating a tour of the symmetric test graph wherein each test edge is traversed at least once, so that said tour includes said test sequence for said finite state machine at a minimum cost.

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