×

Near-field lorentz force microscopy

  • US 4,992,659 A
  • Filed: 07/27/1989
  • Issued: 02/12/1991
  • Est. Priority Date: 07/27/1989
  • Status: Expired due to Fees
First Claim
Patent Images

1. An apparatus for measuring a magnetic field in a sample using a scanning tunneling microscope having a tip comprising:

  • drive means for controlling the distance between the tip and a surface of the sample and a position of the tip for enabling scanning of the surface and for providing a signal indicative of the position of the tip relative to the sample;

    generator means coupled to said tip for providing a current signal at a frequency substantially equal to the resonance frequency of said tip for generating a current between said tip and the surface for causing the tip to undergo vibratory motion in the presence of a magnetic field;

    detector means disposed for measuring the motion of the tip in a direction substantially parallel to the plane of the surface of the sample and providing a signal indicative of such motion, andcomputer means coupled to said detector means and said drive means for providing an output signal indicative of a position of the tip and a magnetic field magnitude corresponding to the position.

View all claims
  • 3 Assignments
Timeline View
Assignment View
    ×
    ×