Capacitive semiconductive sensor with hinged diaphragm for planar movement

• US 4,998,179 A
• Filed: 02/28/1989
• Issued: 03/05/1991
• Est. Priority Date: 02/28/1989
• Status: Expired due to Term

• Current Assignee: Control Systems Incorporated (Siemens AG), VTI Holding Oy
• Original Assignee: United Technologies Corporation (Raytheon Technologies Corporation d/b/a RTX)
• Inventors: Grantham, Daniel H., Swindal, James L.
• Primary Examiner(s): GRIFFIN, DONALD
• Application Number:
  US07/317,236
• Time in Patent Office: 735 Days
• Field of Search: 361/283, 73/718, 73/724, 29/25.42
• US Class Current: 361/283.4
• CPC Class Codes: G01L 9/0073 using a semiconductive diaphragm

Abstract

A semiconductive sensor or transducer (100), for example, a pressure sensor utilizing capacitance variations to sense pressure variations, of the silicon-on-silicon type, in which a "hinge" (111A) in the form of a relatively thin, encircling area is provided at the outer peripheral edge of the diaphragm, causing the central region (117) of the diaphragm (111) to move in a linear, non-curved or planar manner (compare FIG. 2 to FIG. 1), providing a linear response or frequency output. A first embodiment (FIG. 3) of the hinged silicon-on-silicon capacitive pressure sensor, which is basically cylindrical in shape, has the hinge formed by etching, milling or machining away some of the thickness of the diaphragm at its outer peripheral edge. In a second embodiment (FIG. 4) the hinge is formed by etching away some of the thickness of the diaphragm at its outer peripheral edge and using a glass layer to control the etching using a selective chemical enchant which is selective for silicon but does not attack the glass; while a third embodiment (FIG. 5) uses aluminum in place of the glass. In a fourth embodiment (FIG. 6) the hinge is formed effectively on the opposite side of the diaphragm from the shown in the embodiments of FIGS. 3-5. The hinge structure can be used in other forms of semiconductive transducers, which use the relative movement of a semiconductive diaphragm with respect to another semiconductive layer or substrate.

Claims

1. In a capacitive semiconductor sensor for pressure sensing and the like, including

a conductive substrate of semiconductor material;

a conductive diaphragm of semiconductor material, said diaphragm having an inner, central region and an outer area, said diaphragm being capable of flexing movement in its central region due to the action of physical changes to be sensed; and

a non-conductive, dielectric layer between the semiconductive substrate and the semiconductive diaphragm, said layer providing peripheral wall(s) extending between and joining said semiconductive substrate and said semiconductive diaphragm;

an evacuated reference chamber being formed between said semiconductive substrate and said semiconductive diaphragm and being closed off by said peripheral wall(s) formed by said dielectric layer between said semiconductive substrate and said semiconductive diaphragm;

the flexing movement of said semiconductive diaphragm due to the physical changes, causing the capacitance of the sensor to vary;

the improvement comprising;

a "hinge" provided at the outer, peripheral area of said diaphragm, said hinge including an area surrounding said central region of substantially less thickness than the thickness of the central region of said diaphragm, causing the central region of said diaphragm to remain planar as it moves linearly up and down under the action of the physical changes as the hinge flexes;

said diaphragm comprising three, composite layers;

a first silicon layer;

a second silicon layer; and

an intermediate layer of a material which acts as an etch stop to a silicon etching chemical;

one of said silicon layers having a continuous, surrounding etched out trough forming said hinge.

2. The capacitive semiconductive sensor of claim 1, wherein:

said diaphragm is disc shaped; and

wherein;

said hinge includes a continuous, circular, indented trough surrounding said central region decreasing the effective thickness of said diaphragm at said hinge.

3. The capacitive semiconductive sensor of claim 1, wherein:

the ratio of the thicknesses of said central region to said hinge is of the order of about ten to one (10;

1).

4. The capacitive semiconductive sensor of claim 1, wherein there is further included:

a mesa on the interior side of said semiconductive substrate extending into said reference chamber; and

wherein;

said hinge has a periphery substantially coextensive with the periphery of said mesa.

5. The capacitive semiconductive sensor of claim 1, wherein:

said trough is located on the interior side of said diaphragm, said central region extending down into said reference chamber; and

wherein;

said semiconductive substrate is substantially flat across its interior surface devoid of any mesa.

6. The capacitive semiconductive sensor of claim 1, wherein:

said intermediate layer is glass.

7. The capacitive semiconductive sensor of claim 1, wherein:

said intermediate layer is aluminum.

8. The capacitive semiconductive sensor of claim 1, wherein:

the thickness of said hinge is about three mils and the thickness of said central region is about twenty-file mils.

9. A method of linearizing the frequency output of a capacitive, semiconductive-dielectric-semiconductive sensor, which sensor includes

a conductive substrate of semiconductor material;

a conductive diaphragm of semiconductor material, said diaphragm having an inner, central region and an outer area, said diaphragm being capable of flexing movement in its central region due to the action of physical changes to be senses; and

a non-conductive, dielectric layer between the semiconductive substrate and the semiconductive diaphragm, said layer providing peripheral wall(s) extending between and joining said semiconductive substrate and said semiconductive diaphragm;

an evacuated reference chamber being formed between said semiconductive substrate and said semiconductive diaphragm and being closed off by said peripheral wall(s) formed by said dielectric layer between said semiconductive substrate and said semiconductive diaphragm;

the flexing movement of said semiconductive diaphragm due to the physical changes, causing the capacitance of the sensor to vary;

comprising the following step(s);

forming a "hinge" at the outer, peripheral area of said diaphragm by including an area surrounding said central region of substantially less thickness than the thickness of the central region of said diaphragm, causing the central region of said diaphragm to remain planar as it moves linearly up and down under the action of the physical changes as the hinge flexes;

there being included the further steps of;

forming said diaphragm from at least three composite layers, including two silicon layers and an intermediate layer of a material other than silicon which can serve as a etch stop for a chemical used to etch out silicon; and

forming said hinge in said composite layers by etching out the silicon in one of the silicon layers until the etching chemical reaches the intermediate, etch stop layer.

10. The method of claim 9, wherein there is included the following step(s):

using a diaphragm made completely of silicon and integrally forming said hinge by removing a portion of the silicon to form an indented trough in the silicon.

11. The method of claim 10, wherein there is included the following step(s):

etching out the hinge.

12. The method of claim 10, wherein there is included the following step(s):

machining out the hinge.

13. The method of claim 9, wherein there is included the following step(s):

forming the diaphragm by depositing the intermediate layer on one of the silicon layers which has the desired hinge thickness and bonding it to the second silicon layer which is thick enough to serve as the non-deflecting central region; and

etching out the silicon in the second layer in the peripheral outer areas of the hinge to form the hinge.

14. The method of claim 9, wherein there is included the following step(s):

placing said second layer on the interior side of the diaphragm extending into the reference chamber; and

using a substrate base which is substantially flat on its interior side facing into the reference cavity devoid of any mesa.