Capacitive semiconductive sensor with hinged diaphragm for planar movement
First Claim
1. In a capacitive semiconductor sensor for pressure sensing and the like, includinga conductive substrate of semiconductor material;
- a conductive diaphragm of semiconductor material, said diaphragm having an inner, central region and an outer area, said diaphragm being capable of flexing movement in its central region due to the action of physical changes to be sensed; and
a non-conductive, dielectric layer between the semiconductive substrate and the semiconductive diaphragm, said layer providing peripheral wall(s) extending between and joining said semiconductive substrate and said semiconductive diaphragm;
an evacuated reference chamber being formed between said semiconductive substrate and said semiconductive diaphragm and being closed off by said peripheral wall(s) formed by said dielectric layer between said semiconductive substrate and said semiconductive diaphragm;
the flexing movement of said semiconductive diaphragm due to the physical changes, causing the capacitance of the sensor to vary;
the improvement comprising;
a "hinge" provided at the outer, peripheral area of said diaphragm, said hinge including an area surrounding said central region of substantially less thickness than the thickness of the central region of said diaphragm, causing the central region of said diaphragm to remain planar as it moves linearly up and down under the action of the physical changes as the hinge flexes;
said diaphragm comprising three, composite layers;
a first silicon layer;
a second silicon layer; and
an intermediate layer of a material which acts as an etch stop to a silicon etching chemical;
one of said silicon layers having a continuous, surrounding etched out trough forming said hinge.
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Accused Products
Abstract
A semiconductive sensor or transducer (100), for example, a pressure sensor utilizing capacitance variations to sense pressure variations, of the silicon-on-silicon type, in which a "hinge" (111A) in the form of a relatively thin, encircling area is provided at the outer peripheral edge of the diaphragm, causing the central region (117) of the diaphragm (111) to move in a linear, non-curved or planar manner (compare FIG. 2 to FIG. 1), providing a linear response or frequency output. A first embodiment (FIG. 3) of the hinged silicon-on-silicon capacitive pressure sensor, which is basically cylindrical in shape, has the hinge formed by etching, milling or machining away some of the thickness of the diaphragm at its outer peripheral edge. In a second embodiment (FIG. 4) the hinge is formed by etching away some of the thickness of the diaphragm at its outer peripheral edge and using a glass layer to control the etching using a selective chemical enchant which is selective for silicon but does not attack the glass; while a third embodiment (FIG. 5) uses aluminum in place of the glass. In a fourth embodiment (FIG. 6) the hinge is formed effectively on the opposite side of the diaphragm from the shown in the embodiments of FIGS. 3-5. The hinge structure can be used in other forms of semiconductive transducers, which use the relative movement of a semiconductive diaphragm with respect to another semiconductive layer or substrate.
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Citations
14 Claims
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1. In a capacitive semiconductor sensor for pressure sensing and the like, including
a conductive substrate of semiconductor material; -
a conductive diaphragm of semiconductor material, said diaphragm having an inner, central region and an outer area, said diaphragm being capable of flexing movement in its central region due to the action of physical changes to be sensed; and a non-conductive, dielectric layer between the semiconductive substrate and the semiconductive diaphragm, said layer providing peripheral wall(s) extending between and joining said semiconductive substrate and said semiconductive diaphragm;
an evacuated reference chamber being formed between said semiconductive substrate and said semiconductive diaphragm and being closed off by said peripheral wall(s) formed by said dielectric layer between said semiconductive substrate and said semiconductive diaphragm;
the flexing movement of said semiconductive diaphragm due to the physical changes, causing the capacitance of the sensor to vary;
the improvement comprising;a "hinge" provided at the outer, peripheral area of said diaphragm, said hinge including an area surrounding said central region of substantially less thickness than the thickness of the central region of said diaphragm, causing the central region of said diaphragm to remain planar as it moves linearly up and down under the action of the physical changes as the hinge flexes; said diaphragm comprising three, composite layers; a first silicon layer; a second silicon layer; and an intermediate layer of a material which acts as an etch stop to a silicon etching chemical;
one of said silicon layers having a continuous, surrounding etched out trough forming said hinge. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of linearizing the frequency output of a capacitive, semiconductive-dielectric-semiconductive sensor, which sensor includes
a conductive substrate of semiconductor material; -
a conductive diaphragm of semiconductor material, said diaphragm having an inner, central region and an outer area, said diaphragm being capable of flexing movement in its central region due to the action of physical changes to be senses; and a non-conductive, dielectric layer between the semiconductive substrate and the semiconductive diaphragm, said layer providing peripheral wall(s) extending between and joining said semiconductive substrate and said semiconductive diaphragm;
an evacuated reference chamber being formed between said semiconductive substrate and said semiconductive diaphragm and being closed off by said peripheral wall(s) formed by said dielectric layer between said semiconductive substrate and said semiconductive diaphragm;
the flexing movement of said semiconductive diaphragm due to the physical changes, causing the capacitance of the sensor to vary;comprising the following step(s); forming a "hinge" at the outer, peripheral area of said diaphragm by including an area surrounding said central region of substantially less thickness than the thickness of the central region of said diaphragm, causing the central region of said diaphragm to remain planar as it moves linearly up and down under the action of the physical changes as the hinge flexes; there being included the further steps of; forming said diaphragm from at least three composite layers, including two silicon layers and an intermediate layer of a material other than silicon which can serve as a etch stop for a chemical used to etch out silicon; and forming said hinge in said composite layers by etching out the silicon in one of the silicon layers until the etching chemical reaches the intermediate, etch stop layer. - View Dependent Claims (10, 11, 12, 13, 14)
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Specification