Unpredictable fault detection using adaptive inference testing techniques

• US 5,001,714 A
• Filed: 11/07/1989
• Issued: 03/19/1991
• Est. Priority Date: 11/07/1989
• Status: Expired due to Fees

• Current Assignee: Array Analysis Incorporated
• Original Assignee: Array Analysis Incorporated
• Inventors: Prestas, Gregory C., Stark, William D.
• Primary Examiner(s): Dixon, Joseph L.
• Application Number:
  US07/433,594
• Time in Patent Office: 497 Days
• Field of Search: 364/580, 364/579, 364/513, 364/480, 364/481, 364/483, 364/554, 364/138, 364/188, 371/21.4, 371/21.6, 371/22.1, 371/22.4, 371/23, 371/15.1, 371/24, 371/25.1, 371/26, 371/29.1, 324/77 RA, 324/114, 324/121 R, 324/158 R
• US Class Current: 714/737
• CPC Class Codes: G01R 31/2846 using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
• CPC Class Codes: G06F 11/2205 using arrangements specific to the hardware being tested
• CPC Class Codes: G06F 11/2257 using expert systems
• CPC Class Codes: G06F 11/32 with visual or acoustical indication of the functioning of the machine
• CPC Class Codes: Y10S 706/916 Electronic or computer, internal or network, circuit

Abstract

A method of using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly. A position-dependent, time-ordered test is performed upon the device or assembly to provide a comprehensive error analysis. The error analysis includes an array of error data and information that is time interdependent. Once fault data is stored in memory, a newly-detected fault can be compared with the stored faults. A relationship between the stored fault data and the detected fault is determined. The system indicates the cause of the detected fault to the operator based on stored fault data that is most probably related to the detected fault. Possibilites of faults within the device or assembly are then displayed. This system analysis and range of potential causes can be evaluated by an operator. In this manner, faults not having been contemplated by stored data and information in the adaptive inference system and not bearing a direct relationship to a problem being reviewed can be identified.

Claims

1. A method of using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly and predicting a cause of a fault that was not observed in a prior test from relationships with other known faults and fault information, comprising the steps of:

(a) performing a position-dependent, timeordered test upon an electrical or electronic device or assembly to provide a comprehensive error analysis, said error analysis utilizing stored error information, comprising fault data;

(b) detecting and identifying faults that were unobserved, nor expected to be observed or detected from a prior test or from stored data and information, or bearing no direct relationship to a problem being reviewed;

(c) locating these unexpected faults despite their possible physical remoteness within said electrical or electronic device or assembly;

(d) comparing said detected and identified faults with stored fault data and information; and

(e) displaying all possible faults within said electrical or electronic device or assembly.

2. The method of using an adaptive inference system of claim 1, further comprising the steps of:

(d) observing displayed fault data and information;

(e) making an evaluation of said fault data and information; and

(f) updating stored data and information in said library of said adaptive inference test system to include said evaluation.

3. The method of using an adaptive inference system of claim 2, wherein the evaluation step (e) further comprises the step of:

(g) testing said electrical or electronic device or assembly for at least one of the observed displayed faults in said displayed fault data and information.

4. The method of using an adaptive inference system of claim 3, further comprising the step of:

(h) introducing data from said stored data to an electrical or electronic device or assembly under test.

5. The method of using an adaptive inference system of claim 4, further comprising the step of:

(i) applying data from said stored test data to another electrical or electronic device or assembly under test.

6. The method of using an adaptive inference system of claim 1, further comprising the steps of:

(d) applying a stimulus to said electrical or electronic device or assembly under test; and

(e) observing displayed test data due to said stimulus.

7. The method of using an adaptive inference system of claim 6, further comprising the step of:

(f) storing said test data due to said stimulus.

8. The method of using an adaptive inference system of claim 7, wherein said data includes J-Tag data.

9. Apparatus for using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly, said adaptive inference system comprising:

(a) testing means for performing a position-dependent, time-ordered test upon an electrical or electronic device or assembly to provide a comprehensive error analysis, said testing means comprising a library of error information, having fault data;

(b) means for detecting and identifying faults that were unobserved nor expected to be observed or detected from a prior test or from stored data and information or bearing no direct relationship to a problem being reviewed and despite their possible physical remoteness within said electrical or electronic device or assembly;

(c) means for storing fault data and information operatively connected to said testing means and said means for detecting and identifying,

(d) comparing means operatively connected to said testing means, said means for detecting and identifying and said storage means for comparing said detected faults with stored fault data and information; and

(e) display means connected to said comparing means for displaying all possibilities of faults within said device or assembly.

10. The apparatus for using an adaptive inference system of claim 9, further comprising:

(e) means for updating stored data and information in said adaptive inference test system with information representative of an evaluation of fault data and information.

11. The apparatus for using an adaptive inference system of claim 10, wherein said testing means further comprises:

(f) means for testing at least one of said faults in said displayed fault data and information.

12. The apparatus for using an adaptive inference system of claim 11, further comprising:

(g) means for introducing data from said stored data of said library to an electrical or electronic device or assembly under test.

13. The apparatus for using an adaptive inference system of claim 12, further comprising:

(h) means for applying data from said stored data of said library to another electrical or electronic device or assembly under test.

14. The apparatus for using an adaptive inference system of claim 9, further comprising:

(e) means for applying a stimulus to said electrical or electronic device or assembly under test.

15. The apparatus for using an adaptive inference system of claim 14, further comprising:

(f) means for storing said test data due to said stimulus.

16. The apparatus for using an adaptive inference system of claim 15, wherein said data includes J-Tag data.

17. An adaptive inference test method having an ability to predict the cause of a previously unobserved fault from its relationship with other known faults during the testing of electrical or electronic devices or assemblies, said adaptive inference test method comprising the steps of:

(a) reducing actual test failure data to a synopsis or fault pattern;

(b) saving said failure data in a data base file on a test-by-test basis;

(c) assigning to each test failure a fault diagnosis or comment;

(d) comparing current test failure data with saved failure data; and

(e) displaying a diagnosis of said current test failure utilizing fault diagnoses in said data base to provide a description of closely matching previous failures, whereby previously unobserved faults can be predicted.

18. The adaptive inference test method of claim 17, wherein said database file is menu driven.

19. An adaptive inference test apparatus having an ability to predict the cause of a previously unobserved fault from its relationship with other known faults during the testing of electrical or electronic devices or assemblies, said adaptive inference test apparatus comprising:

(a) fault pattern means for reducing actual test failure data to a synopsis or fault pattern;

(b) storing means operatively connected to said fault pattern means for saving said failure data in a database file on a test-by-test basis;

(c) assigning means operatively connected to said storing means for assigning to each test failure a fault diagnosis or comment;

(d) comparison means operatively connected to said storing means for comparing current test failure data with saved failure data; and

(e) a display operatively connected to said comparison means for displaying a diagnosis of said current test failure utilizing fault diagnoses in said data base to provide a description of closely matching previous failures, whereby previously unobserved faults can be predicted.

20. The adaptive inference test apparatus of claim 19, wherein said database file is menu driven.