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X-ray diffraction inspection system

  • US 5,007,072 A
  • Filed: 08/03/1988
  • Issued: 04/09/1991
  • Est. Priority Date: 08/03/1988
  • Status: Expired due to Fees
First Claim
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1. A method of inspecting parcels to detect the presence of selected crystalline materials in the presence of other crystalline and noncrystalline materials comprising:

  • generating x-ray radiation from a source;

    conveying a parcel containing crystalline and non-crystalline materials to be inspected continuously past the source to irradiate the materials with the radiation;

    detecting radiation scattered by crystalline material within the parcel at a predetermined angle; and

    analyzing a spectrum of the detected radiation to detect the presence of a selected crystalline material on or within the parcel.

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