Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations

• US 5,015,951 A
• Filed: 03/20/1989
• Issued: 05/14/1991
• Est. Priority Date: 10/02/1987
• Status: Expired

• Current Assignee: Massachusetts Institute of Technology
• Original Assignee: Massachusetts Institute of Technology
• Inventors: Melcher, James R.
• Primary Examiner(s): Snow, Walter E.
• Application Number:
  US07/325,695
• Time in Patent Office: 785 Days
• Field of Search: 324/232, 324/233, 324/239-243, 324/222, 324/223, 324/228, 324/234
• US Class Current: 324/232
• CPC Class Codes: G01N 27/72 by investigating magnetic variables
• CPC Class Codes: G01R 27/2635 Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells

Abstract

Devices and analytical techniques are disclosed for measuring spatial profiles of complex permeability and conductivity of a material by multiple wavenumber interrogations. Coil array structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporal frequency "ω") from the coil array structures are attenuated by varying degrees in the material undergoing analysis, depending on the wavenumber ("k"), thereby permitting the derivation of composite complex permeability/conductivity profile.

Claims

1. An apparatus for measuring a property of a material, the apparatus comprising:

an array of electromagnetic elements capable of imposing a magnetic field in a material and sensing a resulting electromagnetic response;

a wavenumber controller connected to said array for applying a current to subsets of said electromagnetic elements and thereby defining fundamental wavenumbers associated with said imposed magnetic field in the material; and

an analyzer connected to said wavenumber controller, including means for comparing the resulting responses sensed by said electromagnetic array at different wavenumbers to predictions in order to derive a spatial profile of complex permeability or conductivity in the material.

2. The apparatus of claim 1 wherein the electromagnetic array comprises a plurality of electrically-driven layered coils.

3. The apparatus of claim 1 wherein the electromagnetic array comprises a plurality of layered coil arrays having conduction paths distributed so as to approximate a sinusoidal distribution.

4. The apparatus of claim 1 wherein the electromagnetic array further comprises a plurality of driver coil arrays and at least one sensor coil array, the driver coil arrays each having a different wavelength and each disposed at a different location on the surface of the material.

5. The apparatus of claim 4 wherein the sensing array of coils comprises a plurality of layered coil arrays capable of sensing the flux induced at the surface of the material at a plurality of wavelengths.

6. The apparatus of claim 4 wherein the electromagnetic array further comprises a plurality of coil elements formed as intermeandering conductors.

7. The apparatus of claim 4 wherein the wavenumber controller further comprises electronic switches for applying one current to the appropriate driver coil array.

8. The apparatus of claim 4 wherein the wavenumber controller further comprises means for connecting the terminals of the sensor coil array or arrays so that a signal is detected at the wavelength that is the same as that of a corresponding the driver coil array.

9. The apparatus of claim 1 wherein the permeability/conductivity analyzer is a microcomputer programmed to measure the permeability/conductivity of the material at multiple wavelengths based upon a parametric model of the material and further includes means for performing interactive analyses to obtain a refined spatial profile.

10. A method for measuring the properties of a material, the method comprising:

disposing an array of electromagnetic elements in proximity to a material, the electromagnetic elements being adapted to impose a magnetic field in the material and sense a resulting electromagnetic response;

interrogating the material with a magnetic field at multiple wavelengths defines by subsets of said electromagnetic elements;

sensing the resulting electromagnetic response at multiple wavelengths; and

deriving a spatial profile of at least one property of the material from said electromagnetic response.

11. The method of claim 10 wherein the step of interrogating the material further includes sequentially interrogating the material at multiple wavelengths.

12. The method of claim 10 wherein the step of interrogating the material further includes simultaneously interrogating the material at multiple wavelengths.

13. A method for measuring the properties of a material, the method comprising:

disposing an array of electromagnetic elements in proximity to a material, the electromagnetic elements being adapted to impose a magnetic field in the material and sense a resulting electromagnetic response;

interrogating the material with a magnetic field at multiple wavelengths defined by subsets of said electromagnetic elements;

sensing the resulting electromagnetic response at multiple wavelengths to derive a spatial profile of at least one property of the material;

measuring the gain at the shortest wavelength to derive a profile estimation for a first material layer; and

measuring the gain with at least one longer wavelength to derive a profile estimation for a subsequent material layer.

14. The method of claim 13 wherein the method further includes employing a parametric model to obtain said estimations for the first and subsequent material layers.

15. The method of claim 13 wherein a linear model is employed to represent the layers.

16. The method of claim 13 wherein an exponential model is employed to represent the layers.

17. The method of claim 13 wherein a continuous model is employed to represent the layers.

18. The method of claim 13 wherein a step function model is employed to represent the layers.

19. The method of claim 13 wherein the method further includes refining the estimate of each layer based on a prior estimation of all the layers other than the one being refined.

20. The method of claim 18 wherein the step of refining the estimate is iteratively repeated for each layer until a best fit to a parametric model is obtained.