Built-in current testing of integrated circuits

• US 5,025,344 A
• Filed: 02/22/1990
• Issued: 06/18/1991
• Est. Priority Date: 11/30/1988
• Status: Expired due to Term

• Current Assignee: Carnegie Mellon University
• Original Assignee: Carnegie Mellon University
• Inventors: Nigh, Phillip J., Maly, Wojciech P.
• Primary Examiner(s): Deboer, Todd E.
• Application Number:
  US07/483,569
• Time in Patent Office: 481 Days
• Field of Search: 361/42, 361/45, 361/54-58, 361/87, 361/93, 361/100, 361/91, 361/86, 340/650, 324/73 PC, 324/51, 323/276-279, 371/3, 371/20, 371/72
• US Class Current: 361/88
• CPC Class Codes: G01R 31/2884 using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2855 takes precedence
• CPC Class Codes: G01R 31/3004 Current or voltage test

Abstract

A built in current sensor on a unitary substrate with an integrated circuit is provided to sense abnormal quiescent current flow through the integrated circuit after a timing phase as an indication of defects such as shorts and open circuits, while ignoring normal high current peaks. A comparator is provided along with an adjustable reference current to provide a virtual ground voltage which represents that induced by a normal quiescent current through a fault-free integrated circuit. A breaker circuit may be provided for indication, or power disconnection of the integrated circuit, upon the occurrence of current flow above a predetermined value.

Claims

1. A semiconductor integrated circuit comprising:

a main circuit assembly and a built-in current testing fault-detecting assembly on a unitary substrate;

said fault-detecting assembly being connected in circuit with at least a portion of said main circuit assembly to detect the quiescent current flow through said integrated circuit portion a predetermined period after the application of timing signals to said built-in current testing fault-detecting assembly;

said fault-detecting assembly and integrated circuit portion being connected in series between local ground and the global ground of said integrated portion; and

said fault-detecting assembly being responsive to abnormal quiescent current flow through said integrated circuit portion while ignoring normal high operational currents in said integration circuit during the timing period as an indication of defects within said integrated circuit portion;

whereby the speed of said fault detecting assembly matches the circuit under test.

2. The semiconductor integrated circuit of claim 1 wherein said fault-detecting assembly includes a differential amplifier responsive to said abnormal current flow while ignoring said normal high currents.

3. The semiconductor integrated circuit of claim 2 wherein a first timing signal and a second timing signal are provided to said fault-detecting assembly to establish timing periods for the detection of the quiescent current flow through said fault-detecting assembly.

4. The semiconductor integrated circuit of claim 3 wherein said fault-detecting assembly includes a reference voltage which is adjusted such that the virtual ground voltage of said fault-detecting assembly represents that induced by a normal quiescent current flow through a fault-free integrated circuit portion.

5. The semiconductor integrated circuit of claim 4 wherein said first and second timing signals are provided by a timer and are applied out of phase to said differential amplifier.

6. The semiconductor integrated circuit of claim 5 wherein current flow in said fault detecting assembly occurring at the beginning and during the periods established between reversal of polarity of said first and second timing signals indicates a fault in said integrated circuit when the quiescent current flow does not decrease to substantially zero during said timing periods.

12. The semiconductor integrated circuit of claim 1 wherein said circuit breaker is connected to turn off the power to said integrated circuit upon the occurrence of a high current fault in excess of a second predetermined current flow in said integrated current portion.

13. The semiconductor integrated circuit of claim 1 wherein an external voltage tester is connectable to the integrated circuit to enable use of the external tester in combination with said built-in fault-detecting current tester assembly.

14. The semiconductor integrated circuit of claim 13 wherein the magnitude of the abnormal current flow through said differential amplifier is indicative of the nature of the fault in said integrated circuit.

7. A semiconductor integrated circuit comprising:

a main circuit assembly and a built-in current testing fault-detecting assembly on a unitary substrate;

said fault-detecting assembly being connected in circuit with at least a portion of said main circuit assembly to detect the quiescent current flow through said integrated circuit portion;

said fault-detecting assembly and integrated circuit portion being connected in series between local ground and the global ground of said integrated portion;

said fault-detecting assembly including a differential amplifier responsive to abnormal quiescent current flow through said integrated circuit portion while ignoring normal high operational currents in said integration circuit as an indication of defects within said integrated circuit portion; and

a transistor connected between virtual ground and global ground which is responsive to the quiescent current flow through said integrated circuit;

whereby the magnitude of the abnormal current flow through said fault detecting assembly is indicative of the nature of the fault in said integrated circuit.

8. The semiconductor integrated circuit of claim 7 wherein said fault detecting assembly is responsive to substantially small differences in quiescent current providing high resolution at low current levels which are significantly below the level of the high currents ignored by said fault detecting assembly.

9. The semiconductor integrated circuit of claim 7 wherein said fault-detecting assembly includes a circuit breaker actuated in response to predetermined high current flow through said integrated circuit.

10. The semiconductor integrated circuit of claim 9 wherein said circuit breaker is connected in parallel with said transistor.

11. The semiconductor integrated circuit of claim 10 wherein circuitry is provided in said circuit breaker to indicate a high latch-up related current fault in said portion of said main circuit assembly.

15. The semiconductor integrated circuit of claim 7 wherein one or more additional integrated circuit portions are connected in circuit with an additional fault detecting assembly for each of said integrated circuit portions.

16. The semiconductor integrated circuit of claim 15 wherein said fault-detecting assemblies comprises a differential amplifier including phased signals Phi 1 and Phi 2 responsive to abnormal quiescent current flow therethrough while ignoring normal high current peaks in said integrated circuit.

17. The semiconductor integrated circuit of claim 16 wherein each of said reference voltages is adjusted such that the virtual ground voltage of each of said fault-detecting assemblies represents that induced by a normal quiescent current through a fault-free integrated circuit portion.