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Built-in current testing of integrated circuits

  • US 5,025,344 A
  • Filed: 02/22/1990
  • Issued: 06/18/1991
  • Est. Priority Date: 11/30/1988
  • Status: Expired due to Term
First Claim
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1. A semiconductor integrated circuit comprising:

  • a main circuit assembly and a built-in current testing fault-detecting assembly on a unitary substrate;

    said fault-detecting assembly being connected in circuit with at least a portion of said main circuit assembly to detect the quiescent current flow through said integrated circuit portion a predetermined period after the application of timing signals to said built-in current testing fault-detecting assembly;

    said fault-detecting assembly and integrated circuit portion being connected in series between local ground and the global ground of said integrated portion; and

    said fault-detecting assembly being responsive to abnormal quiescent current flow through said integrated circuit portion while ignoring normal high operational currents in said integration circuit during the timing period as an indication of defects within said integrated circuit portion;

    whereby the speed of said fault detecting assembly matches the circuit under test.

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