MOS type field effect transistor formed on a semiconductor layer on an insulator substrate
First Claim
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1. A SOI-MOSFET comprising:
- source and drain regions formed of respective impurity regions of a first type in a thin semiconductor layer deposited not more than 1500 Å
in thickness on an insulator;
a channel region of a second impurity type formed in said thin semiconductor layer between said source region and said drain region, said channel region having a predetermined impurity concentration;
a gate electrode positioned adjacent said channel region and separated from said semiconductor layer by an insulator layer deposited on said semiconductor layer;
at least one floating carrier storage region having an impurity concentration of the second type higher than the predetermined impurity concentration of said channel region for removing and storing excess carriers of the second type from said channel region into said at least one floating carrier storage region, andan insulating film formed on upper surfaces of said source and drain regions and in lateral contact with, and completely covering, side edges of said source drain regions and of said at least one floating carrier storage region.
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Abstract
A SOI-MOSFET formed on a thin semiconductor layer (3) having a thickness not more than 1500Å includes a charge carrier absorbing region (9a, 9b, 9c) contacting with at least a portion of the bottom of a channel region (6) of a first conductivity type and with at least a portion of the bottom of a source region (7, 7a) of a second conductivity type. The carrier absorbing region (9a, 9b, 9c) absorbs excess carriers of the first conductivity type contained in the channel region (6).
60 Citations
22 Claims
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1. A SOI-MOSFET comprising:
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source and drain regions formed of respective impurity regions of a first type in a thin semiconductor layer deposited not more than 1500 Å
in thickness on an insulator;a channel region of a second impurity type formed in said thin semiconductor layer between said source region and said drain region, said channel region having a predetermined impurity concentration; a gate electrode positioned adjacent said channel region and separated from said semiconductor layer by an insulator layer deposited on said semiconductor layer; at least one floating carrier storage region having an impurity concentration of the second type higher than the predetermined impurity concentration of said channel region for removing and storing excess carriers of the second type from said channel region into said at least one floating carrier storage region, and an insulating film formed on upper surfaces of said source and drain regions and in lateral contact with, and completely covering, side edges of said source drain regions and of said at least one floating carrier storage region. - View Dependent Claims (2, 3)
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4. A SOI-MOSFET comprising:
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source and drain regions formed of respective impurity regions of a first type in a thin semiconductor layer deposited not more than 1500 Å
in thickness on an insulator;a channel region of a second impurity type formed in said thin semiconductor layer between said source region and said drain region, said channel region having a predetermined impurity concentration; a gate electrode positioned adjacent said channel region and separated from said semiconductor layer by an insulator layer deposited on said semiconductor layer; a carrier storage region having an impurity concentration of the second type higher than the predetermined impurity concentration of said channel region whereby excess carriers of the second type are removed from said channel region into said carrier storage region;
said carrier storage region being formed in said semiconductor layer in contact with at least a portion of the bottom of said channel region and with at least a portion of the bottom of said source region; anda metal silicide layer formed on said source region and having a non-uniform depth, a portion of said metal silicide layer being of such depth that said portion of said metal silicide layer is passed locally through said source region to reach said carrier storage region.
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5. A SOI-MOSFET comprising:
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source and drain regions formed of respective impurity regions of a first type in a thin semiconductor layer deposited not more than 1500 Å
in thickness on an insulator;a channel region of a second impurity formed in said thin semiconductor layer between said source region and said drain region, said channel region having a predetermined impurity concentration; a gate electrode positioned adjacent said channel region and separated from said semiconductor layer by an insulator layer deposited on said semiconductor layer; a carrier storage region having an impurity concentration of the second type higher than the predetermined impurity concentration of said channel region whereby excess carriers of the second type are removed from said channel region into said carrier storage, said carrier storage region being formed in said semiconductor layer in contact with at least a portion of the bottom of said channel region and with at least a portion of the bottom of said source region; and an aluminum layer formed on said source region, said aluminum layer including alloy spikes locally passing through said source region to reach said carrier storage region.
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6. A SOI-MOSFET comprising:
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source and drain regions formed of respective impurity regions of a first type in a thin semiconductor layer deposited not more than 1500 Å
in thickness on an insulator, said drain region including a lightly doped drain;a channel region of a second impurity type formed in said thin semiconductor layer between said source region and said drain region, said channel region having a predetermined impurity concentration; a gate electrode positioned adjacent said channel region and separated from said semiconductor layer by an insulator layer deposited on said semiconductor layer; and at least one carrier storage region having an impurity concentration of the second type higher than the predetermined impurity concentration of said channel region whereby excess carriers of the second type are removed from said channel region into said carrier storage region. - View Dependent Claims (7, 8, 9)
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10. A SOI-MOSFET comprising:
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source and drain regions formed of respective impurity regions of a first type in a thin semiconductor layer deposited not more than 1500 Å
in thickness on an insulator,a channel region of a second impurity type formed in said thin semiconductor layer between said source region and said drain region; a gate electrode positioned adjacent said channel region and separated from said semiconductor layer by an insulator layer deposited on said semiconductor layer; and a crystal defect region having crystal defects whereby excess carriers of the second type are removed from said channel region into said crystal defect region. - View Dependent Claims (11, 12)
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13. A SOI-MOSFET comprising in combination,
an insulator; -
a thin semiconductor layer deposited on said insulator; a source region and a drain region formed of respective impurity regions of a first type in said thin semiconductor layer; a channel region of a second impurity type formed in said thin semiconductor layer between said source region and said drain region; a gate electrode positioned adjacent said channel region and separated from said thin semiconductor layer by an insulator layer deposited on said thin semiconductor layer; at least one floating carrier removal means for removing and storing excess carriers of the second type from said channel region into said at least one carrier removal means, and an insulating film formed on upper surfaces of said source and drain regions, and in lateral contact with, and completely covering, side edges of source and drain regions and of said at least one floating carrier storage region;
whereinsaid thin semiconductor layer is not more than 1500 Å
thick such that application of a voltage to said gate electrode will cause the channel region as a whole to form a depletion layer. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification