Scrap detector

• US 5,042,947 A
• Filed: 09/24/1990
• Issued: 08/27/1991
• Est. Priority Date: 06/04/1987
• Status: Expired due to Fees

• Current Assignee: TEC Consult GmbH
• Original Assignee: Metallgesellschaft AG (GEA Group AG)
• Inventors: Sattler, Hans-Peter, Loree, Thomas R., Hohla, Kristian, Potzschke, Manfred
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US07/588,496
• Time in Patent Office: 337 Days
• Field of Search: 356/317, 356/318, 356/313, 250/458.1, 250/459.1, 250/461.1, 209/578, 209/579
• US Class Current: 356/318
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01N 21/718 Laser microanalysis, i.e. with formation of sample plasma
• CPC Class Codes: G01N 21/85 Investigating moving fluids or granular solids

Abstract

Disclosed is a process and apparatus to analyze metal particles to determine their composition and to generate a sorting signal. The particles are exposed to a pulsed laser beam by which they are partly vaporized to form a plasma so that the particles are cleaned and the cleaned area is subsequently partially vaporized by a pulsed laser beam to form a plasma. The spectral lines of the plasma are inspected for an identification of the composition of the metal particles. The required inspection rate of 30 particles per second can readily be achieved or even exceeded if a defined narrow wavelength range or a defined wavelength is filtered from the total radiation that is emitted by the plasma and the intensities of the filtered partial radiations are related to each other to obtain ratios, which are compared with adjustable limiting values. A sorting signal is derived from the result of said comparison. The inspection rate can be improved in that the partial radiation is subjected to a comparison only for a defined interval of time.

Claims

1. A process of analyzing metal particles for their chemical composition by laser-induced breakdown spectroscopy and of generating a sorting signal, said process comprising:

(1) irradiating the surface of a metal particle using a cleaning pulse from a first UV-gas-laser;

(2) removing the plasma produced by the cleaning pulse using an air jet of at least 10 m/sec.;

(b

     3) producing a plasma by directing an analysis pulse from the first UV-gas-laser or another UV-gas-laser to the cleaned surface;

(b

     4) filtering predetermined, selectable wavelengths from the total radiation of the plasma produced by the analysis pulse;

(5) measuring the radiation intensities of the filtered wavelengths; and

(b

     6) generating a sorting signal based on comparison of the measures of the radiation intensities with adjustable predetermined values.

2. The process of claim 1 wherein the filtering of the predetermined selectable wavelengths constitutes a filtering of a predetermined narrow wavelength range.

3. The process of claim 1 wherein the radiation of the plasma is used for the analysis for a predetermined time.

4. The process of claim 1 wherein more than one measurement of radiation intensity is derived and a plurality of predetermined limiting values are used for the comparison.

5. The process of claim 1 wherein the metal particles differ in size and shape.

6. The process of claim 1 wherein the laser is used with an optical system which provides a measurement independent of the distance between the laser source and the particle surface if that distance varies within a defined range.

7. The process of claim 1 wherein the laser is fired by a trigger signal which is generated in response to the metal particle entering into an inspection path.

8. The process of claim 1 wherein the metal particles traverse more than one inspection path in succession.

9. The process of claim 1 wherein all measured values and data and the generated sorting signal are by electronic means.

10. The process of claim 1 wherein the plasma radiation generated by the first irradiation to clean the metal particle surface is examined for wavelengths characteristic of aluminum.

11. The process of claim 10 wherein the analysis laser pulse is discontinued if aluminum is detected.

12. The process of claim 1 wherein the particles are processed at a rate of at least 30 particles per second.

13. The process of claim 12 wherein the particles have an average size generally in the range of about 15 to 65 mm.

14. In a process of analyzing metal particles having an average size of from 15 to 65 mm and at a rate of at least 30 particles per second for their chemical composition by laser-induced breakdown spectroscopy (LIBS) and of generating a sorting signal, the improvement of

(1) using a pulsed UV-gas-laser;

(2) irradiating a surface of the metal particles to partially clean the surface;

(3) removing the plasma produced by the cleaning pulse with an air jet of at least 10 m/sec;

(4) producing a plasma by directing a laser pulse to the cleaned surface, the plasma being characteristic of the metal particle composition;

(5) filtering predetermined, selectable wavelengths from the total radiation of the plasma;

(6) deriving numerical ratios from the radiation intensities of the filtered wavelengths; and

(7) generating a sorting signal in dependence on a comparison of said derived ratios with adjustable limiting values.

15. Apparatus for carrying out the process of claim 14 comprising:

means for transporting metal particles along an inspection path;

a trigger signal generator having a trigger detector and trigger electronics for generating a trigger signal in response to the entrance of a particle into the inspection path;

means for partly cleaning the surface of the metal particles by irradiation with a first UV-gas-laser pulse;

jet means for withdrawing plasma formed when cleaning the particle by irradiation, said jet means having velocity of at least 10 m/sec;

means for irradiating the particle with a second UV-gas-laser pulse to produce a characteristic plasma;

at least one spectral filter means and a corresponding number of spectral detector means associated with each spectral filter means;

electronic circuitry for evaluating and comparing the spectral intensities which have been obtained by said spectral detector means;

computer means for processing the measured values and data which have been obtained and for generating a sorting signal.

16. The process of claim 14 wherein the predetermined selectable wavelengths filtered are in a predetermined range of wavelengths.

17. The process of claim 14 wherein the radiation of the plasma is used for the analysis for a predetermined time.

18. The process of claim 14 wherein more than one ratio is derived and a plurality of predetermined limiting values are used for the comparison.

19. The process of claim 14 wherein the laser is fired by a trigger signal which is generated in response to the metal particle entering into an inspection path.

20. The process of claim 14 wherein the metal particles traverse more than one inspection path in succession.