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Marking techniques for identifying integrated circuit parts at the time of testing

  • US 5,043,657 A
  • Filed: 07/13/1990
  • Issued: 08/27/1991
  • Est. Priority Date: 07/13/1990
  • Status: Expired due to Term
First Claim
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1. The method of marking and subsequently identifying each one of a large group of IC parts comprising semiconductor chips formed with integrated circuitry designed for a specific functional purpose, such marking and identifying being carried out to enable part-identified tests to be performed on the functioning of the integrated circuitry of each part, said method comprising the steps of:

  • forming on each chip at least one circuit element additional to said integrated circuitry;

    trimming a parameter of each said additional circuit element while making measurements of an electrical value affected by said parameter;

    said trimming being carried out so as to provide for each said additional circuit element an electrical value which is unique to the corresponding part;

    conducting said tests to obtain a series of test data for said parts respectively;

    determining said trimmed electrical values for each of the tested parts; and

    storing said series of test data respectively in association with a parameter-value-generated identification of the corresponding part, thereby to permit analyses of the test data to be made and associated with the tested part respectively.

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