Imaging apparatus and method

• US 5,047,633 A
• Filed: 05/03/1990
• Issued: 09/10/1991
• Est. Priority Date: 05/08/1989
• Status: Expired due to Fees

• Current Assignee: Amersham International Plc (General Electric Company), Siemens AG
• Original Assignee: Amersham International Plc (General Electric Company)
• Inventors: McKay, Ian A., Finlan, Martin F.
• Primary Examiner(s): Anderson, Bruce C.
• Application Number:
  US07/518,543
• Time in Patent Office: 495 Days
• Field of Search: 250/306, 250/307, 250/423 F
• US Class Current: 850/1
• CPC Class Codes: G01Q 20/00 Monitoring the movement or position of the probe
• CPC Class Codes: G01Q 20/02 by optical means
• CPC Class Codes: G01Q 60/16 Probes, their manufacture, or their related instrumentation, e.g. holders
• CPC Class Codes: G01Q 70/06 Probe tip arrays
• CPC Class Codes: Y10S 977/874 Probe tip array

Abstract

Apparatus for the high resolution imaging of macromolecules and interactions involving macromolecules. The apparatus comprises a surface (10) on which the macromolecule under test is placed and a plurality of fine probes (13). Means (not shown) are provided for scanning each of the probes (13) across a small area of the surface 10 in such a way that the total output from the probes covers the whole surface. Means (not shown) such as a scanning tunnelling and/or atomic force detector are used to monitor the movement of the individual probes in a direction transverse to the surface (10) and display means (not shown) are used to display the transverse movement of the probes, being illustrative of the topography of the surface.

Claims

1. A method for the high resolution imaging of macromolecules and interactions involving macromolecules, said method comprising placing a molecule under test on a surface, said surface being notionally subdivided into a plurality of individual areas, scanning said surface at high resolution by means of scanning tunnelling and/or atomic force microscope apparatus incorporating a plurality of fine probes each associated with one of said areas, said scanning comprising scanning each of said probes across its individual area, detecting movement of each of said probes in a direction transverse to the surface due to undulations in the surface, and displaying the resultant of said scanning so that the topography of the surface can be ascertained.

2. The method according to claim 1 further comprising immobilizing the macromolecule under test onto the surface.

3. The method as claimed in claim 2 wherein one end of the marcomolecule is attached to the surface and a fluid is then caused to flow across the surface so that the molecule is aligned in a particular direction.

4. Apparatus for the high resolution imaging of macromolecules and interactions involving macromolecules, said apparatus comprising a surface on which a molecule under test is placed for analysis, said surface being notionally subdivided into a plurality of individual areas, a plurality of fine probes each associated with one of said areas, means for simultaneously moving said probes across the surface in such a way that each probe scans across its associated area, means for monitoring the movement of said probes in a direction transverse to the surface due to undulations in the surface, and display means for displaying the output from said monitoring means being illustrative of the topography of the surface.

5. Apparatus as claimed in claim 4 including means for lightly biassing each probe onto the surface.

6. Apparatus as claimed in claim 5 wherein the probes are mounted on a frame, and wherein the apparatus further comprises means for causing scanning movement of said frame such as to cause said probes to simultaneously execute scanning movement over their associated areas.

7. Apparatus as claimed in claim 4 wherein the probes are mounted on a frame, and wherein the apparatus further comprises means for causing scanning movement of said frame such as to cause said probes to simultaneously execute scanning movement over their associated areas.

8. Apparatus as claimed in claim 7 wherein said frame comprises a sheet of material which has been micromachined to define a plurality of fingers, each finger being attached at one end to the sheet and being free at the other end, said other (free) end carrying a respective one of said probes.

9. Apparatus as claimed in claim 8 wherein said fingers are arranged in rows in the manner of teeth of a comb and wherein a plurality of rows are machined from a single sheet in order to provide a two-dimensional array of probes.

10. Apparatus as claimed in any one of claims 7, 8 or 9 wherein two similar frames carrying probes are provided:

a first frame being arranged so that its probes monitor the surface, and a second frame being positioned overlying the first frame so that the movement of each probe on the first frame may be monitored by a corresponding probe on the second frame.

11. Apparatus as claimed in claim 10 and wherein, on at least that part of said sheet forming the fingers of said second frame, there is deposited at least one layer of piezoelectric material, and wherein said monitoring means includes electrical connections made to said piezoelectric material whereby movement of each of said fingers may be monitored by monitoring the electrical current generated by said piezoelectric material.

12. Apparatus as claimed in claim 11 wherein said monitoring means incorporates an scanning tunnelling detector for monitoring movement of each probe.

13. Apparatus as claimed in claim 10 wherein said monitoring means incorporates an optical interferometric detector for monitoring movement of each probe.

14. Apparatus as claimed in claim 10 wherein said monitoring means incorporates an inductive detector for monitoring movement of each probe.

15. Apparatus as claimed in claim 10 wherein said monitoring means incorporates an scanning tunnelling detector for monitoring movement of each probe.

16. Apparatus as claimed in any one of claims 4, 5, 7, 8, and 10 wherein said monitoring means incorporates an optical interferometric detector for monitoring movement of each probe.

17. Apparatus as claimed in any one of claims 4, 5, 7, 8 and 10 wherein said monitoring means incorporates an inductive detector for monitoring movement of each probe.

18. Apparatus as claimed in any one of claims 4, 5, 7, 8 and 10 wherein said monitoring means incorporates a scanning tunnelling detector for monitoring movement of each probe.