Surface analysis method and apparatus
First Claim
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1. A method of analyzing a surface by using a probe beam, comprising the steps of:
- measuring the intensity profile of a probe beam at the surface of a sample;
measuring the distribution of a detected signal along the surface of the sample by scanning the surface of the sample with the probe beam; and
carrying out mathematic transformation for each of the intensity profile and the distribution of the detected signal.
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Abstract
A method of and an apparatus for analyzing a surface are disclosed, in which the intensity profile of a probe beam at the surface of a sample is measured, the intensity distribution of a detection signal along the surface of the sample is measured by scanning the surface of the sample with the probe beam, and mathematical transformation is carried out for each of the measured intensity profile and the measured signal-intensity distribution, to make surface analysis with high resolution.
32 Citations
34 Claims
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1. A method of analyzing a surface by using a probe beam, comprising the steps of:
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measuring the intensity profile of a probe beam at the surface of a sample; measuring the distribution of a detected signal along the surface of the sample by scanning the surface of the sample with the probe beam; and carrying out mathematic transformation for each of the intensity profile and the distribution of the detected signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. An apparatus for analyzing a surface, comprising:
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means for generating a probe beam; means for irradiating the surface of a sample with the probe beam; means for measuring the intensity profile of the probe beam at the surface of the sample; means for scanning the surface of the sample with the probe beam; means for detecting a signal caused by irradiating the surface of the sample with the probe beam, and for measuring the distribution of the signal along the surface of the sample; and means for carrying out mathematical transformation for each of the measured intensity profile and the measured signal distribution. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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Specification