Apparatus for measuring the quiescent current of an integrated monolithic digital circuit
First Claim
1. An arrangement for measuring a quiescent current of an integrated monolithic digital circuit comprising a transistor current sensor for receiving the IC quiescent current and which includes a first connection terminal for coupling to a supply terminal of the integrated monolithic circuit and with a voltage second connection terminal for coupling to a supply, characterized in that the arrangement comprises voltage stabilization means for stabilizing a voltage at the first connection terminal and signal processing means coupled to the voltage stabilization means for signal processing of the quiescent current.
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Accused Products
Abstract
An arrangement for measuring the quiescent current of a digital IC includes a current sensor connected in series with the IC and the voltage supply, a voltage stabilization circuit for stabilizing the voltage across the IC and a signal processing circuit coupled thereto for processing the measured quiescent current. The quiescent current is measured when no flip-flops are switched in the IC. By means of the arrangement, it is possible to measure rapidly and accurately whether the quiescent current assumes an abnormal value, which indicates that the IC contains defects. The signal processing circuit may include a current mirror which is coupled to a current comparator circuit supplying a digital output signal for determining the existence of a defect.
74 Citations
21 Claims
- 1. An arrangement for measuring a quiescent current of an integrated monolithic digital circuit comprising a transistor current sensor for receiving the IC quiescent current and which includes a first connection terminal for coupling to a supply terminal of the integrated monolithic circuit and with a voltage second connection terminal for coupling to a supply, characterized in that the arrangement comprises voltage stabilization means for stabilizing a voltage at the first connection terminal and signal processing means coupled to the voltage stabilization means for signal processing of the quiescent current.
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18. Apparatus for testing an integrated monolithic digital circuit comprising:
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a transistor current sensor for receiving a quiescent current of aid integrated circuit, circuit means including first and second connection terminals for coupling the transistor current sensor to a supply terminal of said integrated circuit and to a voltage supply terminal, respectively, voltage stabilization means coupled in a feedback circuit between said first connection terminal and a control electrode of the transistor current sensor for stabilizing the voltage at the first connection terminal, and signal processing means coupled to said circuit means for processing said quiescent current so as to provide an indication of the condition of said integrated circuit. - View Dependent Claims (19, 20)
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Specification