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Integrated semiconductor circuit for thermal measurements

  • US 5,064,296 A
  • Filed: 06/22/1990
  • Issued: 11/12/1991
  • Est. Priority Date: 06/23/1989
  • Status: Expired due to Term
First Claim
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1. Integrated semiconductor circuit for measurements of thermal signals, comprisinga thermal signal comparator (8) having a first thermal input, a second thermal input and an electrical digital output;

  • a feedback loop connected between the output and the first input of the comparator, said feedback loop comprising a digital-analog (DA) signal converter (3) which provides an analog thermal output;

    an adder unit for heat currents having an output connected to a heat capacity having a temperature output connected to the first thermal input of said comparator;

    said feedback loop comprising a gating unit having a first input connected to the output of the comparator, a second input connected to a clock pulse and a digital electric output connected to the input of the digital-analog (DA) converter.

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