High order sigma delta oversampled analog-to-digital converter integrated circuit network with minimal power dissipation and chip area requirements

• US 5,065,157 A
• Filed: 04/06/1990
• Issued: 11/12/1991
• Est. Priority Date: 04/06/1990
• Status: Expired due to Term

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Ribner, David B., Baertsch, Richard D.
• Primary Examiner(s): Pellinen, A. D.
• Assistant Examiner(s): Young, Brian K.
• Application Number:
  US07/505,382
• Time in Patent Office: 585 Days
• Field of Search: 341/143, 341/122, 341/123, 341/144, 341/155, 341/158, 341/166, 341/167, 341/200, 375/27, 375/28, 375/33, 364/724.04, 332/11 D, 357/40, 357/51
• US Class Current: 341/143
• CPC Class Codes: H03M 3/32 with special provisions or arrangements for power saving, e.g. by allowing a sleep mode, using lower supply voltage for downstream stages, using multiple clock domains, by selectively turning on stages when needed
• CPC Class Codes: H03M 3/414 having multiple quantisers arranged in cascaded loops, each of the second and further loops processing the quantisation error of the loop preceding it, i.e. multiple stage noise shaping [MASH] type

Abstract

An improved high order interpolative oversampled (sigma delta) analog-to-digital converter network including a plurality of cascade-coupled integrator stages is formed on a single integrated circuit chip in a manner that conserves power and chip area. Each integrator stage includes a differential amplifier, at least one input capacitor and at least one feedback capacitor. The power dissipation and occupied chip area are minimized by down-sizing the chip area occupied by the capacitors and differential amplifiers (op amps) in all but the first integrator stage. The high gain of the first integrator stage makes the noise contribution of subsequent integrator stages negligible so that the higher noise of the subsequent integrator stages is tolerable.

Claims

1. In a sigma delta analog-to-digital converter network formed on an integrated circuit chip, the improvement comprising:

a first integrator comprising a differential amplifier, an associated input capacitor and an associated feedback capacitor; and

one or more subsequent integrators each comprising a differential amplifier, an associated input capacitor and an associated feedback capacitor, said one or more subsequent integrators being responsive to output voltage from said first integrator;

the differential amplifier of each of said subsequent integrators and the input and feedback capacitors associated therewith being smaller in area than said differential amplifier of said first integrator and the input and feedback capacitors associated therewith so as to minimize power dissipation in said subsequent integrators.

2. The analog-to-digital converter network improvement of claim 1, wherein:

said capacitors associated with said first integrator are larger in capacitance than the corresponding capacitors of said subsequent integrators to minimize kT/C noise in said first integrator, where k is Boltzmann'"'"'s constant, T is absolute temperature (°

K.) of said first integrator and C is the capacitance of the input capacitor coupled to said first integrator (farads).

3. The analog-to-digital converter network improvement of claim 2, wherein:

said differential amplifier of said first integrator is of larger power rating than the differential amplifiers of said subsequent integrators, so as to charge and discharge said larger capacitors associated with said first integrator as rapidly as the capacitors associated with said subsequent integrators.

4. A third order sigma delta analog-to-digital converter network formed on an integrated circuit chip, comprising:

a second order modulator including first and second integrators coupled in cascade such that the output of said first integrator is coupled to the input of said second integrator;

an analog-to-digital converter, the output of said second integrator being coupled to the input of said analog-to-digital converter for converting an analog input signal into a first digital output signal corresponding to the analog input signal plus a second order differential quantization noise component;

means responsive to the output signal of said analog-to-digital converter for generating an analog output signal corresponding to said first digital output signal less any quantization noise of said second order modulator;

a first order modulator comprising a third integrator coupled to the output of said second integrator and an analog-to-digital converter coupled to the output of said third integrator for converting the analog output signal of said second integrator into a second digital output signal corresponding to said analog output signal plus a first order differential quantization noise component; and

means responsive to said first and second digital output signals of said second order and first order modulators, respectively, for eliminating the first and second order differential quantization noise components therefrom and generating a digital output signal corresponding to the analog input signal,

each of said second and third integrators occupying less area of said chip than said first integrator.

5. The third order sigma delta analog-to-digital converter network of claim 4, wherein:

each of said integrators comprises a differential amplifier, at least one input capacitor and at least one feedback capacitor,

the differential amplifier of each of said second and third integrators, respectively, and said input capacitor and feedback capacitor coupled to each of said second and third integrators, respectively, occupying less area of said chip in comparison with said differential amplifier of said first integrator and said input and feedback capacitors coupled thereto, so as to maintain power dissipation in each of said second and third integrators at a lower level than power dissipation in said first integrator.

6. The third order sigma delta analog-to-digital converter network of claim 5, wherein:

said capacitors coupled to said first integrator are of larger capacitance than the corresponding capacitors coupled to said second and third integrators, so as to minimize kT/C noise in said first integrator, where k is Boltzmann'"'"'s constant, T is absolute temperature (°

K.) of said first integrator and C is the capacitance of the input capacitor coupled to said first integrator (farads).

7. The third order sigma delta analog-to-digital converter network of claim 6, wherein:

said differential amplifier of said first integrator is of larger power rating than the differential amplifiers of said subsequent integrators so as to charge and discharge said capacitors coupled to said first integrator as rapidly as the capacitors coupled to said second and third integrators.

8. On an integrated circuit chip, a third order sigma delta analog-to-digital converter network, comprising:

a second order modulator including first and second integrators coupled in cascade such that the output of said first integrator is coupled to the input of said second integrator, a first comparator coupled to the output of said second integrator for providing a first digital output signal, and a first switched reference voltage source responsive to said first comparator;

a first order modulator including a third integrator coupled to the output of said second integrator, a second comparator coupled to the output of said third integrator for providing a second digital output signal, and a second switched reference voltage source responsive to said second comparator;

said third integrator responding to the output signal of said second integrator and to said second switched reference voltage source to provide an analog output signal to said second comparator;

a digital multiplier for multiplying said second digital output signal from said first order modulator;

a digital subtractor for providing a digital difference signal between the digital output signal of said second order modulator and the multiplied digital output signal of said first order modulator;

a digital double differentiator coupled to the output of said digital subtractor for twice differentiating said digital difference signal to produce a resultant digital signal including a second order differential noise component from said second order modulator and a third order differential noise component from said first order modulator;

a digital adder for adding said first digital output signal and said resultant digital signal to produce a third digital output signal; and

a digital decimation filter responding to said third digital output signal,

each of said integrators comprising a differential amplifier, at least one input capacitor and at least one feedback capacitor,

each differential amplifier of said second and third integrators and the capacitors respectively coupled thereto occupying less area of said chip than the differential amplifier of said first integrator and the capacitors respectively coupled thereto so as to maintain power dissipation in said second and third integrators below power dissipation in said first integrator.

9. The analog-to-digital converter network of claim 8, wherein:

said capacitors coupled to said first integrator are of larger capacitance than the corresponding capacitors coupled to said second and third integrators, so as to minimize kT/C noise in said first integrator, where k is Boltzmann'"'"'s constant, T is absolute temperature (°

K.) of said first integrator and C is the capacitance of the input capacitor coupled to said first integrator (farads).

10. The analog-to-digital converter network of claim 9, wherein:

said differential amplifier of said first integrator is of larger power rating than the differential amplifiers of said second and third integrators so as to charge and discharge said capacitors coupled to said first integrator as rapidly as the capacitors coupled to said second and third integrators.

11. The analog-to-digital converter of claim 8 including a first latch coupled to the output of said first comparator, the output of said first latch being coupled to said first switched reference voltage source, and a second latch coupled to the output of said second comparator, the output of said second latch being coupled to said second switched reference voltage source.

12. The analog-to-digital converter of claim 8 wherein each said differential amplifier includes balanced inputs and balanced outputs.