Pattern recognition apparatus

• US 5,065,440 A
• Filed: 08/23/1990
• Issued: 11/12/1991
• Est. Priority Date: 03/09/1990
• Status: Expired due to Term

• Current Assignee: Eastman Kodak Company
• Original Assignee: Eastman Kodak Company
• Inventors: Yoshida, Naoko, Takizawa, Yoshinori
• Primary Examiner(s): Razavi, Michael
• Application Number:
  US07/571,364
• Time in Patent Office: 446 Days
• Field of Search: 382/308, 382/34, 382/42, 382/47, 382/41, 382/49, 364/728.03, 364/728.04, 358/101, 358/401, 358/448, 340/730, 340/731
• US Class Current: 382/219
• CPC Class Codes: G06V 10/751 Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching

Abstract

A pattern recognition apparatus is capable of high-speed, automatic recognition of input images with a high degree of accuracy. The apparatus has an extended range of tolerance to shifts in the relative position of the input images and provides insensible regions about reference patterns which are shifted horizontally.

Claims

1. A pattern recognition apparatus in which pattern recognition is based on a comparison of an input image with predetermined multiple reference patterns comprising:

first storage means for storing second reference pixel data of second reference patterns formed by providing an insensible region of ±

W pixels around a contour of each of the predetermined multiple reference pattern, wherein W is an integer greater than zero;

second storage means for storing third reference pixel data of third reference patterns which are second reference patterns shifted horizontally by a prescribed pixel amount;

comparison means for comparing input image pattern pixel data with pixel data stored in the first and second storage means other than insensible region pixel data;

correlation value calculation means for calculating the degree of correlation between an input image pattern and reference based on the result of the comparison by the comparison means; and

decision means which uses the correlation value calculated by the correlation value calculation means to specify the input pattern to one of the multiple reference patterns.

2. Pattern recognition apparatus of claim 1 further including third storage means for storing fourth reference pixel data of fourth reference patterns which are second reference patterns shifted horizontally by a prescribed pixel amount in a direction opposite to the shifted direction of the third reference patterns and wherein the comparison means further compares input image pattern data with data stored in the fourth storage means.

3. The pattern recognition apparatus of claim 1 where the insensible region is ±

1 pixel around the contour of each of the predetermined multiple reference patterns.