Interactive adaptive inference system
First Claim
1. A human interactive adaptive inference system having an operative program for predicting causes of a previously unobserved fault appearing in an electric or electronic device or assembly from relationships with other known and previously stored fault data and information gathered for said electric or electronic device or assembly in prior tests, said adaptive inference system comprising:
- a) testing means for performing position dependent, time-ordered tests upon electrical or electronic devices or assemblies to provide a test data array containing a pattern of faults;
b) storage means defining a reference array containing stored data and information representing patterns of faults of said electric or electronic device or assembly, and data and information patterns of said electrical or electronic device or assembly that conforms to operating requirements, said reference array having means for receiving and incorporating information representative of human judgment, which incorporated information is added to the fault patterns;
c) display means operatively connected to said data array of said testing means and said reference array of said storage means for displaying fault data and information;
d) means operatively connected to said data array of said testing means and said reference array of said storage means for entering human judgment information to said fault patterns to assist in obtaining a diagnostic analysis of said fault patterns; and
e) comparison means operatively connected to said data array of said testing means and said reference array of said storage means for providing a diagnostic analysis of said electrical or electronic device or assembly in accordance with said entered human judgment information, said comparison means being able to discern variances in fault data patterns from data patterns obtained from previously tested conforming electrical and electronic devices or assemblies, whereby said human interactive adaptive inference system is able to learn and predict causes of faults that were not previously experienced or stored within said human interactive adaptive inference system.
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Abstract
A human interactive adaptive inference system for testing electric or electronic devices or assemblies. The system includes a testing mechanism for performing position-dependent, time-ordered tests upon electrical or electronic devices or assemblies. The testing mechanism provides a test data array. The testing mechanism has manually provided test parameters and is adapted to operate under at least one of a plurality of operating modes. A reference array is also provided to contain acceptable data for comparison with test data. A reference comparator is connected to the test data array and to the reference array for providing a diagnostic analysis of the electrical or electronic device or assemblies.
21 Citations
4 Claims
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1. A human interactive adaptive inference system having an operative program for predicting causes of a previously unobserved fault appearing in an electric or electronic device or assembly from relationships with other known and previously stored fault data and information gathered for said electric or electronic device or assembly in prior tests, said adaptive inference system comprising:
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a) testing means for performing position dependent, time-ordered tests upon electrical or electronic devices or assemblies to provide a test data array containing a pattern of faults; b) storage means defining a reference array containing stored data and information representing patterns of faults of said electric or electronic device or assembly, and data and information patterns of said electrical or electronic device or assembly that conforms to operating requirements, said reference array having means for receiving and incorporating information representative of human judgment, which incorporated information is added to the fault patterns; c) display means operatively connected to said data array of said testing means and said reference array of said storage means for displaying fault data and information; d) means operatively connected to said data array of said testing means and said reference array of said storage means for entering human judgment information to said fault patterns to assist in obtaining a diagnostic analysis of said fault patterns; and e) comparison means operatively connected to said data array of said testing means and said reference array of said storage means for providing a diagnostic analysis of said electrical or electronic device or assembly in accordance with said entered human judgment information, said comparison means being able to discern variances in fault data patterns from data patterns obtained from previously tested conforming electrical and electronic devices or assemblies, whereby said human interactive adaptive inference system is able to learn and predict causes of faults that were not previously experienced or stored within said human interactive adaptive inference system. - View Dependent Claims (2, 3, 4)
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Specification