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Apparatus and method for transient thermal infrared spectrometry

  • US 5,070,242 A
  • Filed: 07/02/1990
  • Issued: 12/03/1991
  • Est. Priority Date: 01/13/1989
  • Status: Expired due to Term
First Claim
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1. A method for enabling analysis of a material comprising the steps of:

  • cooling a thin surface layer portion of the material to transiently generate a temperature differential between the thin surface layer portion and a lower portion of the material sufficient to alter the thermal infrared emission spectrum of the material from the black-body thermal infrared emission spectrum of the material; and

    detecting the altered thermal infrared emission spectrum of the material while the altered thermal infrared emission spectrum is sufficiently free of self-absorption by the material of emitted infrared radiation, prior to the temperature differential propagating into the lower portion of the material to an extent such that the altered thermal infrared emission spectrum is no longer sufficiently free of self-absorption by the material of emitted infrared radiation, so that the detected altered thermal infrared emission spectrum is indicative of characteristics relating to molecular composition of the material.

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