Method and apparatus for testing logic circuitry by applying a logical test pattern
First Claim
1. A logic circuit testing apparatus comprising:
- a first storage means for storing test data including a plurality of logical test patterns;
a second storage means for storing each of the logical test patterns in correspondence to a group of tester pins;
a third storage means for storing control data to control a data convert means;
a data convert means for converting data from said first storage means on the basis of the control data stored in said third storage means;
a test means for testing a logic circuit which applies the logical test patterns from said second storage means to the logic circuit; and
control means for selectively controlling each of the first, second, and the third storage means, the data convert means, and the test means,said control means transferring the test data from the first storage means, via the data convert means which logically converts the data on the basis of the control data from the third storage means or directly, to the second storage means to be stored as a logical test pattern,said control means transferring logical test pattern stored in the second storage means to the test means to test the logic circuit.
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Abstract
A testing method of a logic circuit which can change test data in a testing apparatus and an apparatus which is used for the testing method are disclosed. The logic circuit testing apparatus having a first storage to store test data including a plurality of test patterns and a second storage to store each of the test patterns in correspondence to a group of tester pins further has a transfer circuit including a data converter to change the test patterns from the first storage and a third storage to store control data to control the data converter. The transfer circuit transfers each of the test patterns from the first storage to the second storage. When the test pattern is transferred by the transfer circuit, the test pattern is changed by the data converter by the control data.
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Citations
13 Claims
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1. A logic circuit testing apparatus comprising:
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a first storage means for storing test data including a plurality of logical test patterns; a second storage means for storing each of the logical test patterns in correspondence to a group of tester pins; a third storage means for storing control data to control a data convert means; a data convert means for converting data from said first storage means on the basis of the control data stored in said third storage means; a test means for testing a logic circuit which applies the logical test patterns from said second storage means to the logic circuit; and control means for selectively controlling each of the first, second, and the third storage means, the data convert means, and the test means, said control means transferring the test data from the first storage means, via the data convert means which logically converts the data on the basis of the control data from the third storage means or directly, to the second storage means to be stored as a logical test pattern, said control means transferring logical test pattern stored in the second storage means to the test means to test the logic circuit. - View Dependent Claims (2)
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3. A logic circuit testing apparatus comprising:
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a first storage means for storing logic circuit test data including a plurality of logical test patterns; a second storage means for storing each of the logical test patterns in correspondence to a group of tester pins; a third storage means for storing control data to control a data convert means; a data convert means for converting data from said first storage means on the basis of the control data stored in said third storage means; wherein said data convert means includes a logic circuit to selectively execute a plurality of kinds of logic operations between the logical test patterns from the first storage means and data representative of change of the test data stored in the third storage means, and said control data includes said data representative of a change of the test data and operation designation information to designate arbitrary one of said plurality of kinds of logic operations, a test means for testing a logic circuit which applies the logical test patterns from said second storage means to the logic circuit. - View Dependent Claims (4, 5, 6, 7, 8, 9, 10)
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11. A method for testing a logic circuit comprising the steps of:
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holding test data including a plurality of logical test patterns in a first storage; holding control data in a third storage; changing logically the logical test patterns from the first storage on the basis of control data from a third storage to transfer to a second storage; holding the transferred logical test patterns into the second storage in correspondence to a group of test pins; and applying the logical test pattern held in the second storage to said logic circuit. - View Dependent Claims (12, 13)
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Specification