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Method and apparatus for testing logic circuitry by applying a logical test pattern

  • US 5,072,178 A
  • Filed: 06/04/1990
  • Issued: 12/10/1991
  • Est. Priority Date: 06/09/1989
  • Status: Expired due to Fees
First Claim
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1. A logic circuit testing apparatus comprising:

  • a first storage means for storing test data including a plurality of logical test patterns;

    a second storage means for storing each of the logical test patterns in correspondence to a group of tester pins;

    a third storage means for storing control data to control a data convert means;

    a data convert means for converting data from said first storage means on the basis of the control data stored in said third storage means;

    a test means for testing a logic circuit which applies the logical test patterns from said second storage means to the logic circuit; and

    control means for selectively controlling each of the first, second, and the third storage means, the data convert means, and the test means,said control means transferring the test data from the first storage means, via the data convert means which logically converts the data on the basis of the control data from the third storage means or directly, to the second storage means to be stored as a logical test pattern,said control means transferring logical test pattern stored in the second storage means to the test means to test the logic circuit.

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