Apparatus comprising an electrostatic wafer cassette
First Claim
1. A method for manufacturing an article, comprising the steps of:
- providing a semiconductor wafer having first and second major surfaces and a processing layer overlying at least a portion of the first surface;
providing means for securing the wafer, the securing means including a charge plate;
electrostatically flattening the wafer against the charge plate;
exposing the processing layer to actinic radiation; and
performing at least one additional step toward completion of the article,CHARACTERIZED IN THATthe securing means further comprise means for storing an electrical charge, the charge storage means being adapted to maintain an electrical potential difference, without connection to a source of electrical energy external to the securing means, for a period of time that is longer than an average exposure time associated with said exposing step; and
the flattening step comprises the steps of creating an electrical potential difference between the wafer and the charge plate, and maintaining the potential difference by means of the charge storage means.
1 Assignment
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Accused Products
Abstract
Disclosed is apparatus comprising an electrostatic cassette assembly for securing a semiconductor wafer during lithographic processing such as direct-write particle-beam lithography. The cassette assembly comprises a cassette body and an electrostatic chuck installable in, and removeable from, the cassette body. The electrostatic chuck comprises a charge plate having a thin dielectric layer on its upper surface, against which the wafer is flattened by Coulombic force. Charge storage means are included for maintaining an electrical potential difference between the wafer and the charge plate even in the absence of connection to a source of electrical energy external to the assembly.
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Citations
4 Claims
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1. A method for manufacturing an article, comprising the steps of:
- providing a semiconductor wafer having first and second major surfaces and a processing layer overlying at least a portion of the first surface;
providing means for securing the wafer, the securing means including a charge plate;
electrostatically flattening the wafer against the charge plate;
exposing the processing layer to actinic radiation; and
performing at least one additional step toward completion of the article,CHARACTERIZED IN THAT the securing means further comprise means for storing an electrical charge, the charge storage means being adapted to maintain an electrical potential difference, without connection to a source of electrical energy external to the securing means, for a period of time that is longer than an average exposure time associated with said exposing step; and the flattening step comprises the steps of creating an electrical potential difference between the wafer and the charge plate, and maintaining the potential difference by means of the charge storage means. - View Dependent Claims (2, 3, 4)
- providing a semiconductor wafer having first and second major surfaces and a processing layer overlying at least a portion of the first surface;
Specification