Sensor having a cantilever

• US 5,079,958 A
• Filed: 03/12/1990
• Issued: 01/14/1992
• Est. Priority Date: 03/17/1989
• Status: Expired due to Fees

• Current Assignee: Olympus Optical Corporation Limited (Olympus Corporation)
• Original Assignee: Olympus Optical Corporation Limited (Olympus Corporation)
• Inventors: Takase, Tsugio, Okada, Takao, Adachi, Hideo, Tomabechi, Hideo, Kajimura, Hiroshi, Shimazu, Hisanari
• Primary Examiner(s): Ruehl, Charles A.
• Application Number:
  US07/492,811
• Time in Patent Office: 673 Days
• Field of Search: 73/865.5, 73/432.1, 73/580, 73/862.61, 73/861.73, 73/117.4, 73/24.03, 73/28.01, 73/28.03, 73/28.05, 73/150 r, 73/862.64
• US Class Current: 73/862.625
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01B 7/06 for measuring thickness measuring during the manufacture of coatings C23C14/54
• CPC Class Codes: G01Q 10/06 Circuits or algorithms therefor
• CPC Class Codes: G01Q 20/00 Monitoring the movement or position of the probe
• CPC Class Codes: G01Q 20/02 by optical means
• CPC Class Codes: G01Q 60/16 Probes, their manufacture, or their related instrumentation, e.g. holders
• CPC Class Codes: Y10S 977/852 for detection of specific nanostructure sample or nanostructure-related property

Abstract

A sensor comprises a tiny cantilever of a thin film having a detection region at its free end portion, a detector for detecting a displacement of the cantilever caused by material acting on the detecting region, and calculation unit for calculating an amount of the material acting on the detection region, based on the displacement of the cantilever which has been detected by the detector, thereby to measure the intensity of a particle-stream applied to the detection region or the thickness of a film formed on the detection region.

Claims

1. A sensor comprising:

a tiny cantilever sized at the micron level made of a thin film, and fixed at one end, and having a free end portion;

a detection region located on the free end portion of said cantilever;

displacement-detecting means for detecting a displacement of said cantilever due to material acting directly on said detection region; and

calculation means for calculating an amount of the material acting on said detection region, based on the displacement of said cantilever which has been detected by said displacement-detecting means, thereby to measure the intensity of a particle-stream applied directly to said detection region or the thickness of a thin film formed on said detection region.

2. The sensor according to claim 1, wherein said displacement-detecting means comprises an electrically conductive probe attached to the free end portion of said cantilever facing a conductive reference member, and is designed to detect the displacement of said cantilever from changes in a tunnel current generated when a bias voltage is applied between the probe and the reference member.

3. The sensor according to claim 1, wherein said displacement-detecting means has cantilever-driving means for vibrating said cantilever at a characteristic frequency specific to said cantilever, and frequency-detecting means for detecting changes in the frequency at which said cantilever is vibrated, which have resulting from the material acting on said cantilever, whereby the displacement of said cantilever is determined from the changes in the frequency.

4. The sensor according to claim 1, wherein said displacement-detecting means comprises a probe attached to the free end portion of said cantilever, servo control means for bending said cantilever in such a direction as to compensate for changes in a physical quantity which occurs between the probe and a reference member facing the probe, and servo amount-detecting means for detecting a servo amount which the servo control means has applied to the probe.

5. The sensor according to claim 4, wherein said physical quantity is a tunnel current flowing between said probe and said reference member.

6. The sensor according to claim 4, wherein said physical quantity is an atomic force generated between said probe and said reference member.

7. The sensor according to claim 1, wherein said detection region is defined by an opening made in a wall of a housing containing said cantilever and located above the free end portion of said cantilever.

8. The sensor according to claim 1, wherein said one end of said cantilever is held by a piezoelectric member.

9. A sensor comprising:

a plurality of tiny cantilevers made of a thin film, and fixed at one end, and having a free end;

a plurality of detection regions formed, respectively, on those portions of said cantilevers which are located close to the free end portions of said cantilevers;

displacement-detecting means for detecting a displacement of each of said cantilevers from material acting on the detection region formed on the cantilever; and

calculation means for calculating an amount of the material acting on said detection regions, based on the displacements of said cantilevers which have been detected by said displacement-detecting means, thereby to measure the intensities of particle-streams applied to said detection regions or the thicknesses of thin films formed on said detection regions.

10. The sensor according to claim 9, wherein said detection regions are defined by openings made in that wall of a housing containing said cantilevers, which opposes the free end portions of said cantilevers.

11. The sensor according to claim 9, wherein said cantilevers extend parallel to one another, said one end of each cantilever is held by a piezoelectric member, and the free ends of said cantilevers are aligned at the same level.

12. A sensor comprising:

at least one tiny cantilever sized at the micron level made of a thin film, and fixed at one end, and having a free end portion;

a detection region located on the free end portion of said at least one cantilever;

displacement-detecting means for detecting a displacement of said at least one cantilever due to material acting directly on said detection region; and

calculation means for calculating an amount of the material acting on said detection region, based on the displacement of said at least one cantilever which has been detected by said displacement-detecting means, thereby to measure the intensity of a particle-stream applied to said detection region or the thickness of a thin film formed on said detection region.

13. The sensor according to claim 12, wherein said detection region is defined by an opening made in that wall of a housing containing said at least one cantilever, which opposes the free end portion of said at least one cantilever.

14. The sensor according to claim 12, wherein a plurality of cantilevers are provided which extend parallel to one another, said one end of each cantilever is held by a piezoelectric member, and the free ends of said cantilevers are aligned at the same level.

15. A sensor for measuring the thickness of a film deposited on a flat surface of a sample place adjacent said sensor, comprising:

a cantilever made of a thin film fixed at one end, and having a free end portion;

a detection region located on the free end portion of said cantilever and having a surface substantially parallel to the flat surface of said sample;

displacement detecting means for detecting a displacement of said cantilever due to a film formed on the surface of said detection region simultaneously with a film forming on said sample surface; and

means responsive to the detected displacement of said cantilever for determining an amount of the material forming said film deposited on said detection region to thereby measure the thickness of the film formed on said detection region and said sample surface.

16. A sensor for measuring the intensity of a particle stream flowing in a given direction, comprising:

a cantilever made of a thin film fixed at one end, and having a free end portion;

a detection region located on the free end portion of said cantilever and having a flat surface substantially perpendicular to said given direction;

displacement detecting means for detecting a displacement of said cantilever along said given direction due to application of said particle stream to the surface of said detection region; and

means responsive to the detected displacement of said cantilever for determining an amount of the material in said particle stream acting on the surface of said detection region to thereby measure the intensity of said particle stream.