Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions

• US 5,085,502 A
• Filed: 04/30/1987
• Issued: 02/04/1992
• Est. Priority Date: 04/30/1987
• Status: Expired due to Fees

• Current Assignee: Videk, Inc. (Ribbon Communications, Inc.)
• Original Assignee: Eastman Kodak Company
• Inventors: Womack, Kenneth H., Outterson, David H., Kwarta, Brian J., Reda, James R.
• Primary Examiner(s): Rosenberger, Richard A.
• Application Number:
  US07/045,110
• Time in Patent Office: 1,741 Days
• Field of Search: 356/775, 356/376, 356/243, 356/1
• US Class Current: 356/605
• CPC Class Codes: G01B 11/2504 Calibration devices
• CPC Class Codes: H04N 9/3185 Geometric adjustment, e.g. keystone or convergence optical or mechanical adjustment of convergence H04N9/317; using scanning means H04N3/22; optical or mechanical adjustments of projectors not peculiar to the presence of an electronic spatial light modulator G03B21/14

Abstract

Projectors and cameras disposed about an object under test obtain digital moire information of overlapping aspects (views) of the object. The system is calibrated using a calibration pattern of straight lines on a flat reference surface and a projected pattern of lines which are perpendicular to the lines of the calibration pattern and contain marker fringes between predetermined lines. Each aspect is calibrated individually by stepping the calibration pattern along the axis of each camera so as to obtain a plurality of tables which relate phase information to distance in each of a plurality of planes spaced successively closer to the camera. The calibration tables define a calibrated volume in space between the cameras and projectors. When the object under test is located in this volume, the video signals from the camera are converted into digital moire information. This information is directly related to the calibration information and is converted with the aid of the calibration information into absolute distance measurements along the perimeters of cross-sections through the object.

Claims

1. A method for measuring the profile of an object by digital moire interferometry which comprises the following steps:

calibrating a volume in space in which volume the object is disposed during measurement to provide reference phase information identifying the locations in distance from an origin of a coordinate system of a multiplicity of sets of positions in said volume, each of said sets being in a different one of a multiplicity of parallel planes spaced a known distance from each other in said volume;

obtaining phase information from the profile of said object in said volume at said plurality of positions;

identifying from the phase information obtained from said profile, the ones of said planes on opposite sides of said profile; and

determining from the differences between said phase information from said profile and said sets of phase information for said planes on said opposite sides of said profile absolute distance measurements of the dimensions of said profile, at least through a cross-section thereof.

2. The method according to claim 1 wherein said object is three dimensional and said calibrating step is by repeating said calibrating step for a plurality of angularly offset aspects rotated about said calibration axis in the plane at the origin of the coordinate system of said volume, a different plurality of said parallel planes in each of said aspects being perpendicular to radial lines through an axis of rotation, the angular offset being the angle between said radial lines.

3. The method according to claim 2 wherein there are at least three of said aspects and said angle is 120°

.

4. A method for measuring the profile of an object by digital moire interferometry which comprises the following steps:

calibrating a volume in space in which volume the object is disposed during measurement to provide reference phase information identifying the locations in distance from an origin of a coordinate system of a plurality of sets of positions in said volume, each of said sets being in a different one of a plurality of parallel planes spaced a known distance from each other in said volume;

obtaining phase information from the profile of said object in said volume at said plurality of positions;

identifying from the phase information obtained from said profile, the ones of said planes on opposite sides of said profile;

determining from the differences between said phase information from said profile and said sets of phase information for said planes on said opposite sides of said profile absolute distance measurements of the dimensions of said profile, at least through a cross-section thereof; and

wherein said calibrating step is carried out by illuminating a target having a pattern of lines spaced from each other and paralleling a first of three orthogonal axes;

deriving a plurality of first tables each containing data representing a matrix of values representing distances from phase variations in the intensity of light reflected from said target at said set of positions from each of said plurality of said planes, said set of positions being along a second of said orthogonal axes which is also perpendicular to said lines of said target, said planes being spaced along a third of said orthogonal axes, each of said tables being derived with said target pattern disposed in a different one of said plurality of parallel planes;

projecting a ruling having a plurality of spaced parallel lines upon said target pattern so that the lines of said ruling are perpendicular to the lines of said target;

optically making at least a predetermined one of said ruling lines;

deriving a table containing data representing the difference in the phase of the variations in the intensity of the reflected light from said marked line and from a window spaced at a predetermined position along said first axis, said last named table identifying the positions of each of said planes along said third of said orthogonal axes;

deriving a second plurality of tables each containing data representing a matrix of phase information derived from the variations in the intensity of light reflected from said target pattern with said ruling projected thereon at said set of positions in each of said plurality of planes; and

said step of determining said dimensions comprising the steps of deriving said dimensions of said profile along said second axis from those of said first plurality of tables for planes straddling said profile and from the phase information from said object, and deriving said dimensions along said third of said axes from those of said second plurality of tables for the planes straddling said profile and from the phase information from said object.

5. The method according to claim 4 further comprising rotating said target about an axis of rotation parallel to said first axis to a plurality of angularly spaced portions and moving said target along said third axis to position said pattern in each of said planes, and carrying out said steps for deriving said tables at each of said planes in each of said angularly spaced positions.

6. The method according to claim 4 wherein said phase information is obtained by illuminating a camera having a sensor defining a matrix of pixel positions along said first and second axes, deriving digital data signals from each of said positions, convolving said digital data from those of said positions in successive areas, each constituting a convolution window, with digital signals representing sine and cosine functions to provide digital outputs, and deriving said phase information in accordance with said digital outputs.

7. The method according to claim 4 whereby said first axis is a vertical y axis, said second axis is a horizontal x axis, and said third axis is a horizontal z axis.

8. The method according to claim 4 wherein said optical marking step is carried out by projecting a marked area at said predetermined one line.

9. The method according to claim 8 wherein said marking step is carried out by projecting a plurality of said marked areas, one at said predetermined line and another at a line spaced a predetermined number of lines from said predetermined one line, each of said areas having different intensity of illumination.

10. The method according to claim 9 wherein said marking step is carried out by projecting a plurality of said marked areas spaced from each other along said marked lines, at least one of said areas being centrally disposed of its respective line.

11. The method according to claim 8 further comprising the steps obtaining said phase information from a camera defining a matrix of pixel positions along said first and second axis, deriving digital data signals from said positions, processing said digital data signals to remove the variation in value thereof at positions corresponding to said marked area, and obtaining said phase information from said digital data signals from which said variation in value due to said marked area has been removed.

12. The method according to claim 4 wherein said steps of deriving said phase information is carried out in terms of unwrapped phase by accumulating phase at a preceding position, 360°

of phase times the number of lines between said preceding and a succeeding position, and the phase at said succeeding position.

13. The method according to claim 12 wherein said optical marking step is carried out by marking said predetermined line in a region of said ruling approximately at the center of said line, the first said preceding position being that of said region.

14. The method according to claim 4 further comprising the step of deriving an offset distance measurements in said volume, and correcting the distances derived from said profile of said object in accordance with said offset distance measurements.

15. The method according to claim 14 wherein said offset distance measurements are obtained by illuminating a target in said volume having a pattern of lines thereon to obtain offsets corresponding to temperature variation.

16. The method according to claim 14 whereby said offset distance measurements are obtained from an object of reference profile, using the steps set forth in claim 4.

17. A system for measuring the profile of an object by digital moire interferometry which comprises means for calibrating a volume in space which volume the object is disposed during measurement to provide reference phase information identifying the locations of a multiplicity of sets of positions in said volume, each of said sets being in a different one of a multiplicity of parallel calibration planes spaced from each other in said volume;

means for obtaining phase information from the profile of said object in said volume at said plurality of positions;

means for identifying from the phase information obtained from said profile, the ones of said calibration planes on opposite sides of said profile; and

means for determining from the differences between said phase information for said calibration planes on said opposite sides of said profile absolute distance measurements of the dimensions of said profile, at least through a cross-section thereof.

18. The system according to claim 17 wherein said object is three dimensional and said calibrating means includes means for calibrating said volume in a plurality of angularly offset aspects of said volume, a different plurality of said parallel planes in each of said aspects being perpendicular to radial lines through an axis of rotating, the angular offset being the angle between said radial lines.

19. The system according to claim 18 wherein there are at least three of said aspects and said angle is 120°

.

20. A system for measuring the profile of an object by digital moire interferometry which comprises means for calibrating a volume in space which volume the object is disposed during measurement to provide reference phase information identifying the locations of a plurality of sets of positions in said volume, each of said sets being in a different one of a plurality of parallel calibration planes spaced from each other in said volume;

means for obtaining phase information from the profile of said object in said volume at said plurality of positions;

means for identifying from the phase information obtained from said profile, the ones of said calibration planes on opposite sides of said profile;

means for determining from the differences between said phase information from said profile and said sets of phase information for said calibration planes on said opposite sides of said profile absolute distance measurements of the dimensions of said profile, at least through a cross-section thereof; and

wherein said calibrating means comprises a target having a pattern of lines spaced from each other and paralleling a first of three orthogonal axes;

means for illuminating said target, means for deriving a plurality of first tables each containing data representing a matrix of distance values derived from the phase variations in the intensity of light reflected from said target at said set of positions from each of said plurality of said planes, said set of positions from each of said plurality of said planes, said set of positions being along a second of said orthogonal axes which is also perpendicular to said lines of said target, said planes being spaced along a third of said orthogonal axes, each of said tables being derived with said target pattern disposed in a different one of said plurality of parallel planes;

means for projecting a ruling having a plurality of spaced parallel lines upon said target pattern so that the lines of said ruling are perpendicular to the lines of said target;

means for optically marking at least a predetermined one of said ruling lines;

means for deriving a table containing data representing the difference in the phase in the intensity of the light reflected from said marked line and at a predetermined position in a window spaced at a predetermined position perpendicular to the projected lines, said last named table identifying the positions of each of said planes along said third of said orthogonal axes;

means for deriving a second plurality of tables each containing data representing a matrix of phase information from light reflected from said target pattern with said ruling projected thereon at said set of positions in each of said plurality of planes; and

said means for determining said dimensions comprising means for deriving said dimensions comprising means for deriving said dimensions of said profile along said second axis from those of said first plurality of tables for planes straddling said profile and from the phase information from said object, said means for deriving said dimensions along said third of said axes from those of said second plurality of tables for the planes straddling said profile and from the phrase information from said object.

21. The system according to claim 20 further comprising means for rotating said target about an axis of rotation parallel to said first axis to a plurality of angularly spaced portions and moving said target along said third axis to position said pattern in each of said planes, and means for deriving said tables at each of said planes in each said angularly spaced positions.

22. The system according to claim 20 wherein said calibrating means and said means for obtaining phase information from said profile of said object comprises a camera having a sensor defining a matrix of pixel positions along said first and second axes, means for deriving digital data signals from each of said positions, means for convolving said digital data from those of said positions in successive areas, each constituting a convolution window, with digital signals representing sine and cosine functions to provide digital outputs, and means for deriving said phase information in accordance with said digital outputs.

23. The system according to claim 20 whereby said first axis is a vertical y axis said second axis is a horizontal x axis, and said third axis is a horizontal z axis.

24. The system according to claim 20 wherein said optical marking means includes means for projecting a marked area at said predetermined one line.

25. The system according to claim 24 wherein said marking means includes means for projecting a plurality of said marked areas, one at said predetermined line and another at a line spaced a predetermined number of lines from said predetermined one line, each of said areas having different intensity of illumination.

26. The system according to claim 25 wherein said marking means includes means for projecting a plurality of said marked areas spaced from each other along said marked lines, at least one of said areas being centrally disposed of its respective line.

27. The system according to claim 24 wherein said calibrating means and said means for obtaining said phase information the profile of said object comprises a camera defining a matrix of pixel positions along said first and second axis, means for deriving digital data signals from said positions, means for processing said digital data signals to remove the variation in value thereof at positions corresponding to said marked area, and means for obtaining said phase information from said digital data signals from which said variation in value due to said marked area has been removed.

28. The system according to claim 20 wherein said calibrating means includes means for deriving said phase information in terms of unwrapped phase having means for accumulating phase at a preceding position, 360°

of phase times the number of lines between said preceding and a succeeding position, and the phase at said succeeding position.

29. The system according to claim 28 wherein said optical marking means includes means operative for marking said predetermined line in a region of said ruling approximately at the center of said line, the first said preceding position being that of said region.

30. The system according to claim 20 further comprising means for deriving offset distance measurements in said volume, and means for correcting the distances derived from said profile of said object in accordance with said offset distance measurements.

31. The system according to claim 30 wherein said offset distance measurements deriving means includes another target in said volume adjacent the object under test, said other target having a pattern of lines thereon, means for illuminating said other target in said volume to obtain offsets corresponding to temperature variation.

32. The system according to claim 30 whereby said offset distance deriving means includes an object of reference profile, and the means set forth in claim 20 for deriving said distances.

33. A method for measuring the profile of an object by digital Moire interferometry which comprises the following steps:

calibrating a volume in space in which volume the object is disposed during measurement to provide reference phase information identifying the locations and distance from an origin of a coordinate system of a plurality of sets of positions in said volume, each of said sets being in a different one of a plurality of parallel planes spaced a known distance from each other in said volume;

obtaining phase information from the profile of said object in said volume at said plurality of positions;

identifying from the phase information obtained from said profile, the ones of said planes on opposite sides of said profile;

determining from the differences between said phase information from said profile and said sets of phase information from said planes on said opposite sides of said profile absolute distance measurements of the dimensions of said profile, at least to a cross-section thereof; and

wherein said phase information is obtained by detecting the interference fringes between a target at each of said positions and a projected image both of which have spaced lines and one of which has a marked line which provides a marked fringe.

34. The method according to claim 33 wherein said identifying step is carried out using the phase information detected from said marked fringe, and said determining step is carried out by interpolation.

35. The method according to claim 33 wherein said detecting step is carried out with a plurality of said marked lines which provide a plurality of marked fringes which are spaced from each other.