Variable frequency magnetic field device employing multiple antennae for measuring the surface impedance of a material

• US 5,086,274 A
• Filed: 06/11/1990
• Issued: 02/04/1992
• Est. Priority Date: 06/12/1989
• Status: Expired due to Term

• Current Assignee: Office National D'Etudes et de Recherches Aerospatiales
• Original Assignee: Avions Marcel Dassault-Breguet Aviation, Office National D'Etudes et de Recherches Aerospatiales
• Inventors: Labaune, Gerard, Gobin, Vincent, Issac, Francois
• Primary Examiner(s): Strecker, Gerard R.
• Application Number:
  US07/535,498
• Time in Patent Office: 603 Days
• Field of Search: 324/202, 324/207.17, 324/225, 324/229-234, 324/236-243, 324/262
• US Class Current: 324/239
• CPC Class Codes: G01R 27/02 Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00
• CPC Class Codes: G01R 27/04 in circuits having distributed constants , e.g. having very long conductors or involving high frequencies

Abstract

A surface impedance measurement device comprises a transmitting antenna producing a magnetic field in the area surrounding a material to be tested and a receiving antenna receiving the magnetic field. An electric voltage wobbled in frequency is applied to the transmitting antenna, and a circuit measures the voltage at the terminals of the second antenna. For the antennae to be applied on the same side of the material to be tested and of which the surface impedance is to be measured, the antennae are superposed by the intermediary of a dielectric wedge in a compact probe. The impedance measurements are then independent of the dimensions and geometry of the material.

Claims

1. A device for measuring the surface impedance of a material to be tested, said device comprising:

a first antenna and a second antenna, said first and second antennae being superposed by an intermediary of a dielectric material to constitute a compact probe;

means for deriving a first electrical voltage wobbled in frequency to be supplied to said first antenna whereby said first wobbled voltage produces a magnetic field emitted by said first antenna and crossing said second antenna;

voltage measuring means for measuring second and third wobbled voltages supplied successively by said second antenna, said second wobbled voltage being induced in said second antenna responsive to said magnetic field when said probe is moved away from said material to be tested so that said material does not perturb said magnetic field, and said third wobbled voltage being induced in said second antenna responsive to said magnetic field when said probe is substantially placed on said material to be tested so that said material perturbs said magnetic field;

means for calculating the variation of a ratio between said second and third wobbled voltages as a function of the frequency of said first wobbled voltage; and

means for comparing said ratio variation with low-pass type functions respectively depending on predetermined surface impedances thereby selecting one of said low-pass type functions nearest said ratio variation to determine the surface impedance of said material to be tested.

2. The device as claimed in claim 1, wherein said probe comprises a spacing member of dielectric material with two parallel sides supporting said first and second antennae, respectively.

3. The device as claimed in claim 2, wherein said probe comprises an exterior dielectric coating on said second antenna at least so as to apply said probe against said material.

4. The device as claimed in claim 1, wherein said probe comprises a spacing member of dielectric material, and two thin support members of dielectric material that are respectively fixed on two parallel sides of said spacing member and on which are printed said first and second antennae, respectively.

5. The device as claimed in claim 4, wherein said probe comprises an exterior dielectric coating on said second antenna at least so as to apply said probe against said material.

6. The device as claimed in claim 1, wherein at least one of said first and second antennae is a circular loop.

7. The device as claimed in claim 1, wherein at least one of said first and second antennae is a rectangular loop.

8. The device as claimed in claim 1, wherein at least one of said first and second antennae is comprised of several concentric and/or superposed spires.

9. A device for measuring the surface impedance of a material to be tested, said device comprising:

first, second and third antennae, said first antenna being interposed between said second and third antennae by an intermediary of a dielectric material to constitute a compact probe;

means for deriving a first electrical voltage wobbled in frequency to be supplied to said first antenna whereby said first wobbled voltage produces a magnetic field emitted by said first antenna and crossing said second and third antennae;

voltage measuring means for measuring second and third wobbled voltages respectively supplied by said second and third antennae, said second and third wobbled voltages being respectively induced in said second and third antennae responsive to said magnetic field when a side of said probe including said second antenna is substantially placed on said material to be tested so that said material to be tested perturbs said magnetic field in the vicinity of second antenna and does not perturb said magnetic field in the vicinity of said third antenna;

means for calculating the variation of a ratio between said second and third wobbled voltages as a function of the frequency of said first wobbled voltage; and

means for comparing said ratio variation with low-pass type functions respectively depending on predetermined surface impedances thereby selecting one of said low-pass type functions nearest said ratio variation to determine the surface impedance of said material to be tested.

10. The device as claimed in claim 9, wherein said second and third antennae are symmetrical with regard to said first antenna in said probe.

11. The device as claimed in claim 9, wherein said probe comprises:

first, second and third thin support members of dielectric material which respectively support said first, second and third antennae,

a first spacing member of dielectric material against two parallel sides of which said first and second support members are respectively fixed, and

a second spacing member of dielectric material against two parallel sides of which said first and third support members are fixed.