×

Method of three-dimensional atomic imaging

  • US 5,095,207 A
  • Filed: 01/07/1991
  • Issued: 03/10/1992
  • Est. Priority Date: 01/07/1991
  • Status: Expired due to Fees
First Claim
Patent Images

1. In a method for three-dimensional imaging of the atomic environment of a sample, including the steps of directing a beam against said surface to form a localized source electron diffraction interference pattern, detecting the intensity distribution of said pattern, calculating numerical image intensity data corresponding to said intensity distribution, and reconstructing the interference data to form a pattern indicating the location of a scatterer atom on said surface relative to an associated emitter atom on said surface, the improvement which comprises:

  • phase shift-correcting the data using a function Pi (k) dependent on the polar angle between the emitter atom and a scatterer atom i.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×