Semiconductor circuit having an excess voltage protection circuit

• US 5,105,328 A
• Filed: 12/12/1989
• Issued: 04/14/1992
• Est. Priority Date: 12/15/1988
• Status: Expired due to Fees

• Current Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Schoofs, Franciscus A. C. M.
• Primary Examiner(s): Pellinen, A. D.
• Assistant Examiner(s): SCHULTZ, CHRISTOPHER
• Application Number:
  US07/449,634
• Time in Patent Office: 854 Days
• Field of Search: 361/18, 361/91, 361/56, 361/111, 361/59
• US Class Current: 361/91.5
• CPC Class Codes: H02H 3/202 for dc systems

Abstract

A semiconductor circuit has d.c. supply lines (10/13,11/14) and an excess voltage protection circuit. The protection circuit comprises a switching transistor (T1) connected in series with one of the supply lines (10/13) and a control circuit (15) which is responsive to a voltage detector circuit (16) coupled to the one supply line (10/13). The control circuit triggers the switching transistor to a non-conductive state upon detection of an excess voltage. The voltage detector circuit comprises a semiconductor element (T8) having a voltage breakdown characteristic correlated with one or more of the remaining semiconductor elements (T10). The semiconductor element (T8) is adapted to be driven to breakdown in response to a voltage across the supply lines less than that which will cause breakdown of the one or more remaining semiconductor elements T10. The increased current drawn by the semiconductor element (T8) at the onset of breakdown is effective to cause the control circuit to trigger the switching transistor to its non-conductive state.

Claims

1. A semiconductor circuit comprising d.c. supply lines and an excess voltage protection circuit, wherein the protection circuit comprises;

at least one load terminal for connection to a load including one or more semiconductor elements to be protected against said excess voltage, a switching transistor connected in series with one of the supply lines, and a control circuit which is responsive to a voltage detector circuit coupled to the one supply line so as to trigger the switching transistor to a non-conductive state upon detection by the voltage detector of an excess voltage, wherein the voltage detector circuit comprises;

a semiconductor element having a voltage breakdown characteristic correlated with said one or more semiconductor elements and driven to breakdown in response to a voltage across the supply lines less than that which will cause breakdown of said one or more semiconductor elements, and wherein an increased current drawn at the onset of breakdown of the semiconductor element causes the control circuit to trigger the switching transistor to its non-conductive state.

2. A circuit as claimed in claim 1, wherein said semiconductor element has the same breakdown characteristic as said one or more semiconductor elements but is connected in the circuit so as to be exposed to a voltage component in addition to the voltage which occurs across the supply lines such that it is exposed to a voltage greater than that of said one or more semiconductor elements.

3. A circuit as claimed in claim 1, wherein said semiconductor element has a lower voltage breakdown characteristic than that of said one or more semiconductor elements.

4. A circuit as claimed in claim 3 wherein said semiconductor element and said one or more semiconductor elements are fabricated on a single integrated circuit chip.

5. A circuit as claimed in claim 4, wherein the lower voltage breakdown characteristic is effected during manufacture of the integrated circuit chip by introduction of a different doping concentration in said semiconductor element than in said one or more semiconductor elements.

6. A circuit as claimed in claim 4, wherein the lower voltage breakdown characteristic is effected during manufacture of the integrated circuit chip by employing in said semiconductor element a dopant different from that in said one or more semiconductor elements.

7. A circuit as claimed in claim 4, characterised in that the lower breakdown characteristic is effected during manufacture of the integrated circuit chip by providing a layout such that different overlap of the masks occur for said semiconductor element relative to said one or more semiconductor elements.

8. A circuit as claimed in claim 4 wherein all of the circuitry is fabricated on the same single 7 integrated circuit chip.

9. A circuit as claimed in claim 1 further comprising a current detector circuit responsive to current flow in one of the supply lines to trigger the switching transistor to a non-conductive state upon detection of an excess current flow in the one of the supply lines.

10. A circuit as claimed in claim 1 wherein the switching transistor is fabricated by the resurf principle and is integrated on a common semiconductor chip with the control circuit and with the detector circuit.

11. A circuit as claimed in claim 10, wherein the switching transistor has a high voltage input comprising a supply wire connected to a bonding pad on the integrated circuit structure, the switching transistor being formed by layers surrounding the pad.

12. A circuit as claimed in claim 1 wherein the switching transistor is of the field effect type having a gate coupled to a source of triggering voltage, a drain to source path connected in series with one of the supply lines and coupled to the other one of the supply lines via a resistor in series with the drain to source path of said semiconductor element, wherein the control circuit comprises a degenerate thyristor connected between the gate and the source of the switching transistor, and the voltage detector circuit includes a transistor whose emitter-collector path is connected in series with said semiconductor element and a triggering input of the thyristor, and means coupling a base of said transistor to an end of the resistor remote from said semiconductor element such that when there is an overvoltage a current is drawn by said semiconductor element that switches the transistor and triggers the thyristor into conduction which causes the switching transistor to be triggered to a non-conductive state.

13. A circuit as claimed in claim 1 wherein the switching transistor is of the field effect type having a gate coupled to a source of voltage and a drain to source path connected in series with one of the supply lines, wherein the control circuit comprises a degenerate thyristor connected between the gate and the source of the switching transistor, and wherein the semiconductor element is connected between a triggering input of the thyristor and the other one of the supply lines such that when there is an overvoltage a current drawn thereby is effective to trigger the thyristor into conduction and cause the switching transistor to be triggered to a non-conductive state.

14. A circuit as claimed in claim 12, wherein said semiconductor element is a field effect transistor.

15. A circuit as claimed in claim 9, wherein the switching transistor is of the field effect type having a gate coupled to a source of triggering voltage, a drain to source path connected in series with one of the supply lines and coupled to the other one of the supply lines via a resistor in series with the drain-source path of said semiconductor element, wherein the control circuit comprises a degenerate thyristor connected between the gate and the source of the switching transistor, and the voltage detector circuit includes a transistor whose emitter-collector path is connected in series with said semiconductor element and a triggering input of the thyristor, means coupling a base of said transistor to an end of the resistor remote from said semiconductor element such that when there is an overvoltage a current is drawn by said semiconductor element that switches the transistor and triggers the thyristor into conduction and causes the switching transistor to be triggered to a non-conductive state, and the current detector circuit comprises a second resistor connected in series with the switching transistor in the one supply line and a further transistor having its base coupled to the one supply line on the switching transistor side of the second resistor, its emitter coupled to the one supply line on the opposite side of the second resistor and its collector coupled to the triggering input of the thyristor such that an excess current through the second resistor triggers the further transistor into conduction and causes the switching transistor to be triggered to a non-conductive state.

16. A direct current power supply circuit comprising:

a pair of input terminals for a source of alternating current,

a voltage clamp and rectifier circuit coupled to said pair of input terminals,

a semiconductor circuit having d.c. supply lines coupled to said voltage clamp and rectifier circuit and having an excess voltage protection circuit, said excess voltage protection circuit comprising;

at least one load terminal for connection to a load including one or more semiconductor elements to be protected against said excess voltage,

a switching transistor connected in series with one of the d.c. supply lines, and a control circuit responsive to a voltage detector circuit coupled to the one supply line so as to trigger the switching transistor into a non-conductive state upon detection of an excess voltage, wherein the voltage detector circuit comprises;

a semiconductor element having a voltage breakdown characteristic correlated with said one or more semiconductor elements and driven to breakdown in response to a voltage across the supply lines less than that which will cause breakdown of said one or more semiconductor elements, and wherein an increased current drawn at the onset of breakdown of the semiconductor element causes the control circuit to trigger the switching transistor to its non-conductive state.

17. A discharge lamp unit comprising:

a switched mode power converter having an output coupled to a discharge tube and an input coupled to a direct current power supply circuit, and wherein said power supply circuit comprises;

a pair of input terminals for a source of alternating current,

a voltage clamp and rectifier circuit coupled to said pair of input terminals,

a semiconductor circuit have d.c. supply lines coupled to said voltage clamp and rectifier circuit and having an excess voltage protection circuit, said excess voltage protection circuit comprising;

at least one load terminal for connection to a load including one or more semiconductor elements to be protected against said excess voltage,

a switching transistor connected in series with one of the d.c. supply lines, and a control circuit responsive to a voltage detector circuit coupled to the one supply line so as to trigger the switching transistor into a non-conductive state upon detection of an excess voltage, wherein the voltage detector circuit comprises;

a semiconductor element having a voltage breakdown characteristic correlated with said one or more semiconductor elements and driven to breakdown in response to a voltage across the supply lines less than that which will cause breakdown of said one or more semiconductor elements, and wherein an increased current drawn at the onset of breakdown of the semiconductor element causes the control circuit to trigger the switching transistor to its non-conductive state.

18. A discharge lamp unit as claimed in claim 17, wherein the tube, power converter and direct current power supply circuit are incorporated in a housing equipped with a connector portion that permits removable electrical coupling with a socket for an incandescent light bulb.

19. A discharge lamp unit as claimed in claim 17, wherein the power converter and direct current power supply circuit are incorporated in a lamp socket or luminaire which is adapted to receive a removeable discharge tube.

20. A semiconductor circuit providing protection against excess voltages and comprising:

first and second input terminals for a source of supply voltage for the semiconductor circuit,

at least one load terminal for connection to a load including one or more semiconductor elements to be protected against said excess voltages,

a supply line including a switching transistor connected between the first input terminal and said one load terminal,

a control circuit coupled to a control electrode of the switching transistor to trigger the switching transistor into cut-off upon detection of the excess voltage,

a voltage detector circuit coupled to said supply line and responsive to a voltage thereat to trigger the switching transistor into cut-off via the control circuit upon detection by the voltage detector circuit of an excess voltage at said supply line, said voltage detector circuit comprising a semiconductor element having a voltage breakdown characteristic correlated with the breakdown characteristics of said one or more semiconductor elements and adapted to be driven into breakdown in response to a voltage at the supply line which is less than a voltage which will cause breakdown of said one or more semiconductor elements, and wherein an increased current drawn at the onset of breakdown of the semiconductor element causes the control circuit to trigger the switching transistor to its cut-off state.

21. A semiconductor circuit as claimed in claim 20 wherein said control circuit includes a second switching transistor coupled between the control electrode and one main electrode of the first switching transistor, and wherein

said voltage detector circuit has a control input coupled to a node in the supply line between an output side of the first switching transistor and said one load terminal.

22. A semiconductor circuit as claimed in claim 21 wherein said input terminals are coupled to a source of pulsatory unidirectional supply voltage, and

said semiconductor element and said one or more semiconductor elements comprise transistors.