Vibrating beam transducer drive system

• US 5,113,698 A
• Filed: 02/26/1990
• Issued: 05/19/1992
• Est. Priority Date: 02/26/1990
• Status: Expired due to Term

• Current Assignee: Alliedsignal Inc.
• Original Assignee: Sundstrand Data Control, Inc.
• Inventors: Cornelius, Craig J., Grlj, Steven F.
• Primary Examiner(s): Chapman, John E.
• Application Number:
  US07/485,188
• Time in Patent Office: 813 Days
• Field of Search: 73/862.59, 73/517 AV, 73/DIG. 1, 73/704
• US Class Current: 73/862.59
• CPC Class Codes: G01L 1/162 using piezoelectric resonators
• CPC Class Codes: G01P 15/097 by vibratory elements
• CPC Class Codes: G01P 2015/0828 the mass being of the paddle type being suspended at one of its longitudinal ends

Abstract

A drive system for providing different excitation voltages to the separate beams of a multiple beam vibrating transducer is disclosed. In one embodiment of the invention an amplified voltage at the resonant frequency of a master beam is amplified and applied to a secondary beam, to force the secondary beam to vibrate at the resonant frequency and amplitude of the master beam to force the transducer to resonate at the frequency of the master beam. Since the transducer vibrates at the resonant frequency of one of the beams, the transducer energy losses to the adjacent mounting structure are reduced. This results in a higher transducer quality factor so that frequency shifts in the resonant frequency can be readily measured as changes in the parameter that the transducer is intended to monitor.

Claims

1. A sensor assembly comprising:

(a) a vibrating transducer having two mechanically coupled vibrating beams, each of said beams having a separate isolated resonant frequency; and

(b) a drive system for applying different drive signals to said beams so that when said different drive signals are applied, said transducer has a quality factor greater than when the same drive signal is applied to both beams.

2. The sensor of claim 1 wherein said drive signals are applied to said beams so that said beams vibrate at a single resonant frequency closer to said isolated resonant frequency of one of said beams than to the resonant frequency of said beams when a single drive signal is applied to said beams.

3. The sensor of claim 1 wherein said beams include a master beam and a secondary beam, said drive system applies a drive signal to said secondary beam such that said secondary beam resonates at approximately said isolated resonant frequency of said master beam.

4. The sensor assembly of claim 3 wherein said drive system applies a first signal to said master beam so as to cause the oscillation thereof at said isolated resonant frequency thereof, and further applies a second signal at the aforesaid isolated resonant frequency to said secondary beam, said second signal at a different voltage level than said first signal.

5. The sensor assembly of claim 3 wherein said assembly comprises an oscillator circuit including said master beam, and a drive amplifier means for receiving the output of said oscillator circuit at a given oscillator output voltage and amplifying same to produce a second signal having second voltage, and a means for applying said second signal to said secondary beam.

6. The sensor assembly of claim 1 further including the difference in isolated frequencies between said beams being less than three percent.

7. The sensor assembly of claim 1 wherein the differences in isolated resonant frequencies between said beams is less than one percent.

8. The sensor assembly of claim 1 wherein said drive signals are applied to said beams at a common frequency.

9. The sensor assembly of claim 4 wherein said second signal applied by said drive system applied to said secondary beam is 180°

out of phase with said first signal applied to said master beam.

10. The sensor assembly of claim 5 wherein said oscillator circuit and said drive amplifier means are arranged so that said second voltage is 180°

out of phase with said oscillator output voltage.

11. The sensor assembly of claim 4 wherein said master beam is said beam with the highest isolated resonant frequency of said beams, and said second signal applied by said drive system has a greater voltage than the voltage of said first signal.

12. The sensor assembly of claim 4 wherein said master beam is said beam with the lowest isolated resonant frequency of said beams, and said second signal applied by said drive system has a lesser voltage than the voltage of said first signal.

13. The sensor assembly of claim 10 wherein said master beam is said beam with the highest isolated resonant frequency of said beams, and said second voltage generated by said drive amplifier means is greater than said oscillator output voltage.

14. The sensor assembly of claim 10 wherein master beam is said beam with the lowest isolated resonant frequency of said beams, and said second voltage produced by said drive amplifier means is less than said oscillator output voltage.

15. The sensor assembly of claim 1 wherein said different drive signals applied by said drive system to said beams are out of phase with each other.