Rotate/rotate method and apparatus for computed tomography x-ray inspection of large objects

• US 5,119,408 A
• Filed: 10/31/1990
• Issued: 06/02/1992
• Est. Priority Date: 10/31/1990
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Galish, Andrew J., Little, Francis H., Isaacs, Ralph G.
• Primary Examiner(s): Howell, Janice A.
• Assistant Examiner(s): Porta, David P.
• Application Number:
  US07/607,337
• Time in Patent Office: 580 Days
• Field of Search: 378/4, 378/10, 378/20, 378/57, 378/58, 378/62, 378/208
• US Class Current: 378/4
• CPC Class Codes: G01N 2223/419 computed tomograph
• CPC Class Codes: G01N 23/046 using tomography, e.g. computed tomography [CT]

Abstract

A method for inspecting a component having dimensions larger than a fan beam angle of an x-ray inspection system includes the steps of: providing an x-ray beam having a selected fan angle in a source focal point; positioning a portion of the component substantially completely within the x-ray beam; rotating the component 360 degrees around a component inspection rotational axis; collecting the attenuated x-ray beam that passes through the component during rotation; generating a multiplicity of electrical signals responsive to the collected x-ray beam; incrementally moving the component inspection rotational axis about the x-ray source focal point to position another portion of the component within the x-ray beam; and repeating the steps of rotating the part 360 degrees about a component inspection rotational axis and incrementally moving the part inspection rotational axis about the x-ray source focal point until the entire component has passed through the fan beam.

Claims

1. A method for inspecting a component having a dimension larger than a fan beam of an x-ray inspection system, comprising the steps of:

(a) providing an x-ray beam having a selected fan angle and a source focal point;

(b) positioning a first portion of the component substantially completely within the x-ray beam;

(c) rotating the component 360 degrees around a component inspection rotational axis;

(d) collecting an attenuated x-ray beam that passes through the component during rotation;

(e) generating a multiplicity of electrical signals responsive to the collected attenuated x-ray beam;

(f) incrementally moving the component inspection rotational axis around the x-ray source focal point to position a next portion of the component within the x-ray beam, the component inspection rotational axis being maintained at a selected radius from the x-ray source focal point;

(g) repeating steps (c), (d), (e) and (f) until all portions of the component to be inspected have passed through the x-ray fan beam; and

(h) combining the electrical signals from step (e) to construct a cross-sectional image of the component at a selected plane through the component.

2. The method of claim 1, further comprising the step of moving the x-ray beam focal point and an x-ray beam detector parallel to the inspection rotational axis to construct another cross-sectional image of the component at a different selected plane through the component perpendicular to the inspection rotational axis.

3. The method of claim 1, wherein the selected x-ray fan angle is between about 5°

and about 30°

.

4. The method of claim 1, wherein step (f) comprises the step of rotating the component inspection rotational axis around the x-ray source focal point by an angle equal to about the selected fan angle to ensure that all portions of the component to be inspected fall within the x-ray beam during at least one 360°

rotation around the component inspection rotational axis.

5. The method of claim 1, wherein the attenuated x-ray beam is collected by a xenon gas detector having a multiplicity of detector elements formed in a linear array.

6. The method of claim 5, wherein the detector elements are mounted in the detector at a spacing between about 0.005 inches and about 0.01 inches.

7. The method of claim 1, wherein the attenuated x-ray beam is collected by a solid state scintillator.

8. The method of claim 1, further comprising the step of moving the component along the component inspection rotational axis to construct another cross-sectional image of the component at a different selected plane through the component perpendicular to the inspection rotational axis.

9. The method of claim 1, further comprising the step of storing the electrical signals for each portion of the component inspected to facilitate reconstruction of a cross-sectional image of substantially the entire component.

10. The method of claim 1, further comprising the step of choosing the selected radius to prevent the part from contacting the x-ray inspection system during step (c).

11. The method of claim 1, wherein the part inspection rotational axis is located proximate to a geometric center of the component cross-section to be reconstructed.

12. A CT x-ray system for inspecting a component having a dimension larger than a fan beam of the system, comprising:

an x-ray source for generating a beam having a focal point;

first means for rotating the component 360°

around a component inspection rotation axis with at least a portion of the component within the x-ray beam;

component manipulator means having at least two linear axes of motion for incrementally rotating the component around the x-ray source focal point to position another portion of the component within the x-ray beam, said component inspection rotational axis being maintained at a selected radius from the x-ray source focal point; and

detector means for collecting an attenuated x-ray beam which passes through the component to reconstruct a component cross-sectional image at a selected plane through the component.

13. The CT system of claim 12, further comprising a gantry structure having at least one vertical member and a horizontal member extending outwardly from said at least one vertical member, said x-ray source and said detector means both being mounted to said horizontal member at a spacing from each other and said horizontal member being movably mounted to said vertical member to permit vertical movement of said x-ray source and said detector relative to the component under inspection such that a cross-sectional image may be reconstructed at a multiplicity of different selected planes through the component.

14. The CT system of claim 12, wherein the detector means is a xenon gas detector having a multiplicity of detector elements formed in a linear array.

15. The CT system of claim 14, wherein the detector elements are mounted in the detector at a spacing between about 0.005 inches and 0.01 inches.

16. The CT system of claim 14, wherein the xenon gas detector comprises a sufficient number of detector elements to provide an inherent resolution of at least about 20 mils.

17. The CT system of claim 16, wherein the xenon gas detector comprises about 1,280 detector elements.