EEG spatial placement and enhancement method

• US 5,119,816 A
• Filed: 09/07/1990
• Issued: 06/09/1992
• Est. Priority Date: 09/07/1990
• Status: Expired due to Fees

• Current Assignee: SAM Technology, Inc.
• Original Assignee: SAM Technology, Inc.
• Inventors: Gevins, Alan S.
• Primary Examiner(s): HINDENBURG, MAX F
• Application Number:
  US07/578,880
• Time in Patent Office: 641 Days
• Field of Search: 128/639, 128/640, 128/644, 128/731, 128/732, 128/791, 128/845, 606/129, 606/130
• US Class Current: 600/383
• CPC Class Codes: A61B 5/1077 Measuring of profiles
• CPC Class Codes: A61B 5/291 for electroencephalography [EEG]
• CPC Class Codes: A61B 5/7264 Classification of physiological signals or data, e.g. using neural networks, statistical classifiers, expert systems or fuzzy systems neural networks per se G06N3/00; expert systems per se G06N5/00
• CPC Class Codes: G01R 33/28 Details of apparatus provided for in groups G01R33/44 - G01R33/64
• CPC Class Codes: Y10S 128/925 Neural network

Abstract

An improved brain wave electroencephalograph (EEG) method measures the physical positions of EEG electrodes applied to the subject'"'"'s scalp. A set of standard cross-directional lines are obtained to provide measurements of the subject'"'"'s head and a computer system automatically defines the subject'"'"'s head shape according to predetermined head shape classes. The position of the electrode on the subject'"'"'s scalp is then determined by scaling the measurements of the subject'"'"'s head to a head model of the same head shape class.

Claims

1. The method of measuring the positions of a plurality of electroencephalographic (EEG) electrodes removably electrically connected to the head of a subject by:

(a) measuring the head of the subject by measuring a plurality of standard cross-directional lines on the head to obtain a set of head measurements;

(b) entering the set of head measurements into a computer system which automatically determines the classification of the head shape according to a plurality of predetermined head shape classes;

(c) comparing the subject head size to a predetermined head model of the same class in which the position of electrodes corresponding in position to the electrodes to be measured have been determined; and

(d) determining the position of the electrodes connected to the head of the subject by scaling the measurements of the electrode positions on the head of the subject in accordance with the determined electrode positions of said head model.

2. The method of claim 1 wherein the measurements of step (a) are obtained by using a stretchable hat having piezoelectric ribbons embedded therein.

3. The method of claim 2 wherein the measurements are stretch measurements obtained from stretching of the ribbons and including the steps of obtaining a vector of said stretch measurements and scaling said stretch measurements.

4. The method of claim 1 wherein said computer system is a pattern recognition neural network computer.