Position measuring apparatus utilizing two-beam interferences to create phase displaced signals
First Claim
1. An apparatus for measuring the relative position of two objects comprising:
- an illumination source;
a detector attached to one of the two objects;
a measuring graduation in the form of a diffraction grating attached to the other object wherein a light beam emitted from said source is diffracted into partial beam clusters;
deflection means for deflecting said partial beam clusters onto said measuring graduation wherein said partial beam clusters are diffracted once again so that a two-beam interference is created; and
at least one detector for detecting and converting the modulation in the intensity of said two-beam interference into an electrical signal,said diffraction grating being configured such that at least one partial beam cluster of the zero order of diffraction is involved at least in the formation of one of the two-beam interferences, and that the modulations that occur in the two-beam interference upon a motion of the measuring graduation in the measuring direction are phase-displaced relative to one another.
1 Assignment
0 Petitions
Accused Products
Abstract
A phase grating is provided in this length or angle measuring apparatus, which operates by interference. A beam striking the phase grating from a laser is diffracted into ±1st order beams at the phase grating. The diffracted ±1st order beams are reflected at retroreflecting elements and, diffracted once again at the phase grating, and made to interfere in pairs. The modulations in intensity of the two-beam interferences are converted by detectors into electrical signals that are phase-displaced from one another. The diffraction grating is configured such that at least one partial beam cluster of the zero order of diffraction is involved in the formation of at least one of the two-beam interferences.
-
Citations
14 Claims
-
1. An apparatus for measuring the relative position of two objects comprising:
-
an illumination source; a detector attached to one of the two objects; a measuring graduation in the form of a diffraction grating attached to the other object wherein a light beam emitted from said source is diffracted into partial beam clusters; deflection means for deflecting said partial beam clusters onto said measuring graduation wherein said partial beam clusters are diffracted once again so that a two-beam interference is created; and at least one detector for detecting and converting the modulation in the intensity of said two-beam interference into an electrical signal, said diffraction grating being configured such that at least one partial beam cluster of the zero order of diffraction is involved at least in the formation of one of the two-beam interferences, and that the modulations that occur in the two-beam interference upon a motion of the measuring graduation in the measuring direction are phase-displaced relative to one another. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
-
Specification