High sensitivity acousto-optic tunable filter spectrometer

• US 5,120,961 A
• Filed: 03/16/1990
• Issued: 06/09/1992
• Est. Priority Date: 03/16/1990
• Status: Expired due to Term

• Current Assignee: Infared Fiber Systems Inc.
• Original Assignee: Infared Fiber Systems Inc.
• Inventors: Li, Frank Y., Levin, Kenneth H.
• Primary Examiner(s): Hannaher, Constantine
• Assistant Examiner(s): Glick, Edward J.
• Application Number:
  US07/494,342
• Time in Patent Office: 816 Days
• Field of Search: 250/339, 250/343, 350/358, 350/372, 356/300, 356/346, 356/436, 356/326, 356/51, 359/285, 359/286, 359/287
• US Class Current: 250/339.07
• CPC Class Codes: G01J 2001/4242 Modulated light, e.g. for synchronizing source and detector circuit
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0218 using optical fibers
• CPC Class Codes: G01J 3/1256 using acousto-optic tunable filter; acousto-optic elements or systems G02F1/11, G02F1/33
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08

Abstract

An acousto-optical filter (AOTF) is used in a spectrometer for analysis of samples. The spectrometer provides continuous wave RF excitation through the crystal, and the spectrometer provides control and modulation for said RF source. The signal to noise ratio is improved by use of a lock-in amplifier which demodulates the modulation frequency. Fiber optics are used to connect the crystal to the source, and the source to the detection system. A digital lock-in amplifier is designed which increases the efficiency, accuracy, sensitivity and decreases the cost of conventional analog lock-in amplifier.

Claims

1. A spectrometer comprising in combination:

incoherent radiation source;

an AOTF crystal for passing selective bands of light, having an RF input;

a radio frequency source connected to said AOTF RF input, said source having an output which is continuous and which varies in frequency,

and wherein said selected bands of light are the birefringent beam from said crystal.

2. The spectrometer of claim 1 wherein said AOTF crystal is tellurium dioxide (TeO₂).

3. The spectrometer of claim 1 wherein said RF source is modulated with a reference frequency to improve the signal to noise ratio.

4. The spectrometer of claim 3 wherein said reference frequency is at one Hz to five MHz.

5. The spectrometer of claim 4 wherein said reference frequency is sinusoidal.

6. The spectrometer of claim 4 wherein said reference frequency is 100 Hz to 100 KHz.

7. A spectrometer having an AOTF crystal having in combination:

a radiation source;

a AOTF crystal for passing selected bands of light, having a RF input;

a source of radio frequency connected to said AOTF RF input, said source having an output which is continuous and which varies in frequency;

means for passing light from said light source to said AOTF crystal;

means for passing light from said AOTF crystal into a sample cell;

means for detecting light from said sample cell;

means for passing light from the sample cell to a detector means;

and wherein said selected bands of lights are the birefringent beam from said crystal.

8. The spectrometer of claim 7 wherein said AOTF crystal is tellurium dioxide (TeO₂).

9. The spectrometer of claim 7 wherein said RF source is modulated with a reference frequency to improve the signal to noise ratio.

10. The spectrometer of claim 9 wherein said reference frequency is at one Hz to five MHz.

11. The spectrometer of claim 10 wherein said RF source is modulated at 100 Hz to 100 KHz.

12. The spectrometer of claim 9 wherein said reference frequency is sinusoidal.

13. The spectrometer in accordance with claim 7 further including means for changing said RF frequency.

14. The spectrometer of claim 13 further including a lock-in amplifier demodulator which rejects noise having frequencies other than at said reference frequency.

15. The spectrometer of claim 14 wherein said lock-in amplifier is selected from the group of an analog lock-in amplifier, a precision demodulator and a digital lock-in amplifier.

16. The spectrometer of claim 15 wherein said lock-in amplifier comprises a high speed analog to digital converter and a digital signal processor.

17. A spectrometer having an AOTF crystal comprising in combination:

a light source;

means for passing light from said light source into a sample cell;

means for passing light from said sample cell to a detector;

said detector comprising;

(1) a AOTF crystal for receiving light from said means for passing light from said sample cell, said AOTF crystal having an RF input and passing selected bands of light;

(2) a radio frequency (RF) source connected to said AOTF input, said RF source having an output which is continuous;

(3) means for detecting the magnitude said selected bands of light from said AOTF crystal; and

wherein said selected bands of light are the birefringent beam from said crystal.

18. The spectrometer of claim 17 wherein said AOTF crystal is tellurium dioxide (TeO₂).

19. The spectrometer of claim 17 wherein said means for passing light from said sample cell to a detector and said means for passing light into said sample cell is zirconium fluoride glass optical fibers.

20. The spectrometer of claim 17 wherein said RF source is modulated with a reference frequency to improve the signal to noise ratio.

21. The spectrometer of claim 20 wherein said reference frequency is at one Hz to 5 MHz.

22. The spectrometer of claim 21 wherein said reference frequency is 100 Hz to 100 KHz.

23. The spectrometer of claim 20 wherein said reference frequency is sinusoidal.