Method for finding defective active array modules using an FFT over phase states

• US 5,122,806 A
• Filed: 05/31/1990
• Issued: 06/16/1992
• Est. Priority Date: 05/31/1990
• Status: Expired due to Term

• Current Assignee: Raytheon Company (Rtx Corporation)
• Original Assignee: Hughes Aircraft Company (Rtx Corporation)
• Inventors: Julian, Michael D.
• Primary Examiner(s): Sotomayor, John B.
• Application Number:
  US07/531,186
• Time in Patent Office: 747 Days
• Field of Search: 342/173, 342/174, 342/372, 342/371
• US Class Current: 342/173
• CPC Class Codes: G01R 23/16 Spectrum analysis; Fourier analysis
• CPC Class Codes: H01Q 3/267 Phased-array testing or checking devices

Abstract

All modules of an active antenna array with the exception of a module under test are disabled. Samples representative of the output of the transmit and receive phase shifter outputs of the module under test are taken for successive pairs of transmit/receive modes of operation at the N successive phase increments of the module under test. Fast Fourier transforms (FFTs) are performed over the samples separately for transmit and receive states, and the power in each FFT filter for each state is detected. Power comparison between the power in filter 1 (numbered from 0) and the power in the sum of filters 2 through (N-1) is then used to determine whether the module under test is defective.

Claims

1. A method for evaluating performance of a module of an active antenna array, said array comprising a plurality of modules, said method comprising the steps of:

turning off al modules of said array but the one module under test;

determining a fast fourier transform (FFT) power spectrum over the phase states, including a power component related to said module under test and a plurality of additional power components; and

comparing selected said components to evaluate the performance of said module under test.

2. The method of claim 1 wherein an FFT power spectrum is determined for both transmit and receive states of the module.

3. The method of claim 2 wherein said component related to the module under test is compared to the sum of the power of said plurality of additional components.

4. The method of claim I wherein said spectrum further includes a leakage power component.

5. The method of claim 4 wherein an FFT power spectrum is determined for both transmit and receive states of the module.

6. The method of claim 5 wherein said component related to the module under test is compared to the sum of the power of said plurality of additional components.

7. In an active antenna array comprising a plurality of array modules, each module including a transmit phase shifter and a receive phase shifter, a method of detecting a failed module of the array comprising the steps of:

turning off all modules of the array but one, said one module comprising a module under test;

cycling said module under test through alternating receive and transmit states;

shifting the phase of the module under test after each successive pair of receive and transmit states;

sampling first and second signals, the first signal being representative of the transmit phase shifter output, the second signal being representative of the receive phase shifter output, said first signal being sampled during each transmit state, said second signal being sampled during each receive state;

collecting the output samples taken in the receive state into a first set and those taken in the transmit state into a second set;

determining the average power in a succession of Fourier transform filters taken over the samples of said first set;

determining the average power in a succession of Fourier transform filters taken over the samples of said second set; and

comparing the power in selected said filters and rejecting the module under test as failed based upon said comparison.

8. The method of claim 7 wherein said samples comprise the output of a receiver supplied with in-phase and quadrature-phase signals and wherein one output sample is collected for each phase state through which the module under test is shifted for both the transmit and receive states.

9. The method of claim 8 wherein said step of determining the average power in each first set of samples includes the step of taking fast Fourier transforms (FFTs) over the samples of said first set.

10. The method of claim 9 wherein said step of taking FFTs includes the step of identifying the power in a plurality of FFT filters and the step of comparing the power in a selected FFT filter to the sum of the powers in a set of the remaining FFT filters.

11. The method of claim 10 wherein the FFT filters are numbered 0 through (N-1) and wherein filter 1 is compared to filters 2 through (N-1).

12. The method of claim 7 wherein said module includes adjustable transmit and receive gains and wherein said method further includes the step of reducing the transmit and receive gains and repeating said sampling, collecting, determining, and comparing steps.

13. The method of claim 12 wherein the transmit and receive gains are set initially to maximum gain and are then reset to half gain when said sampling, collecting, determining, and comparing steps are repeated.

14. The method of claim 7 wherein said module under test transmits and receives at an RF frequency and wherein the RF frequency is set to a midrange value.

15. The method of claim 10 wherein said module under test transmits and receives at an RF frequency and wherein the RF frequency is set to a midrange value.

16. The method of claim 13 wherein said module under test transmits and receives at an RF frequency and wherein the RF frequency is set to a midrange value.

17. The method of claim 11 wherein, if said sum is 10% greater than the power in said selected filter 1, said module is considered defective.

18. The method of claim 10 wherein, if said sum is 10% greater than the power in said selected filter, said module is considered defective.

19. The method of claim 18 wherein, if the half gain power of the module under test is greater than 0.8 or less than 0.3 of full gain power of the module under test, said module under test is considered defective.