Automatic circuit tester employing a three-dimensional switch-matrix layout

• US 5,124,638 A
• Filed: 02/22/1991
• Issued: 06/23/1992
• Est. Priority Date: 02/22/1991
• Status: Expired due to Term

• Current Assignee: Genrad Incorporated (Teradyne Incorporated)
• Original Assignee: Genrad Incorporated (Teradyne Incorporated)
• Inventors: Winroth, Calvin S.
• Primary Examiner(s): NGUYEN, VINH P
• Application Number:
  US07/660,277
• Time in Patent Office: 487 Days
• Field of Search: 324/538, 324/73.1, 324/158 R, 371/15.1, 371/16.1, 371/27, 371/22.4, 371/22.6, 371/25, 364/481, 307/115, 307/112, 361/411, 361/412, 361/413, 361/416, 361/395
• US Class Current: 324/73.1
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736

Abstract

An automatic circuit tester (10) employs a scanner (20) embodied in a group of interconnected main scanner boards (46, 47) that provide switching by means of mechanical relays. In order to provide a cross-point matrix and structure without unacceptable stub lengths, the relays are mounted on auxiliary boards (114) that extend transversely from the surface of each main board (46, 47). The main scanner boards plug into a scanner bus (50) in such a manner as to permit them to connect or disconnect adjacent links (70A-H, 72A-H) in sequences of links in the scanner bus (50).

Claims

1. An automatic circuit tester including:

A) a plurality of test instruments;

B) a plurality of system pins adapted for connection to test points in a device under test (DUT);

C) a control circuit for operating the instruments so as to perform a test on the device under test;

D) a generally planar main circuit board providing a plurality of instrument condition paths thereon from which the tester separately provides a signal path to at least one of the test instruments and further providing a plurality of DUT conduction paths from each of which the tester provides a signal path to a different respective system pin;

E) at least one generally planar auxiliary circuit board so mounted on the main circuit board as to extend generally transversely thereof; and

F) a plurality of matrix switches, each of which is mounted on one of the at least one auxiliary circuit board, each auxiliary circuit board connecting each matrix switch thereon between one of the DUT conduction paths and one of the instrument conduction paths, a plurality of said matrix switches being connected in this manner between each DUT conduction path and a plurality of respective instrument conduction paths, and a plurality of the matrix switches being connected in this manner between each instrument conduction path and a plurality of respective DUT conduction paths.

2. An automatic circuit tester as defined in claim 1 comprising a plurality of auxiliary circuit boards so mounted on the main circuit board as to extend generally transversely thereof, each auxiliary circuit board connecting each matrix switch thereon between one of the DUT conduction paths and one of the instrument conduction paths.

3. An automatic circuit tester as defined in claim 2 further including a scanner bus, to which the main circuit board is connected, by which the tester provides the signal path from the instrument conduction paths on the main circuit board to at least one of the test instruments.

4. An automatic tester as defined in claim 3 further including:

A) a generally planar second main circuit board providing a plurality of instrument conduction paths thereon from which the tester separately provides a signal path to at least one of the test instruments and further providing a plurality of DUT conduction paths from each of which the tester provides a signal path to a different respective system pin;

B) at least one generally planar second auxiliary circuit board so mounted on the second main circuit board as to extend generally transversely thereof; and

C) a plurality of second matrix switches, each of which is mounted on one of the at least one second auxiliary circuit board, each second auxiliary circuit board connecting each second matrix switch thereon between one of the DUT conduction paths on the second main circuit board and one of the instrument conduction paths on the second main circuit board, a plurality of said second matrix switches being connected in this manner between each DUT conduction path on the second main circuit board and a plurality of respective instrument conduction paths on the second main circuit board, and a plurality of the second matrix switches being connected in this manner between each instrument conduction path on the second main circuit board and a plurality of respective DUT conduction paths on the second main circuit board.

5. An automatic circuit tester as defined in claim 4, wherein the matrix switches comprise mechanical relays operable by the control circuit.

6. An automatic circuit tester as defined in claim 2 wherein the matrix switches comprise mechanical relays operable by the control circuit.

7. An automatic circuit tester as defined in claim 1 further including a scanner bus, to which the main circuit board is connected, by which the tester provides the signal path from the instrument conduction paths on the main circuit board to at least one of the test instruments.

8. An automatic tester as defined in claim 7 further including:

A) a generally planar second main circuit board providing a plurality of instrument conduction paths thereon from which the tester separately provides a signal path to at least one of the test instruments and further providing a plurality of DUT conduction paths from each of which the tester provides a signal path to a different respective system pin;

B) at least one generally planar second auxiliary circuit board so mounted on the second main circuit board as to extend generally transversely thereof; and

C) a plurality of second matrix switches, each of which is mounted on one of the at least one second auxiliary circuit board, each second auxiliary circuit board connecting each second matrix switch thereon between one of the DUT conduction paths on the second main circuit board and one of the instrument conduction paths on the second main circuit board, a plurality of said second matrix switches being connected in this manner between each DUT conduction path on the second main circuit board and a plurality of respective instrument conduction paths on the second main circuit board, and a plurality of the second matrix switches being connected in this manner between each instrument conduction path on the second main circuit board and a plurality of respective DUT conduction paths on the second main circuit board.

9. An automatic circuit tester as defined in claim 8 wherein the matrix switches comprise mechanical relays operable by the control circuit.

11. An automatic circuit tester as defined in claim 1 wherein the tester provides the connection between the instrument conductive paths and at least one of the instruments by means of tree conductive paths and tree switches connected in a tree structure, of at least three levels, in which the instrument conductive paths include tree paths in the top level and in which each given path in a level below the top level is linked by a plurality of tree switches to a plurality of paths of the next higher level in a group thereof separately associated with the given path, the tree conductive paths being provided by the main circuit board and the tree switches being mounted on the at least one auxiliary circuit board.

12. An automatic circuit tester as defined in claim 11 further including a scanner bus to which the main circuit board is connected in such a manner that the scanner provides the connection between the instrument conductive paths and at least one of the instruments by means of the serial combination of the tree structure and the scanner bus.

13. An automatic tester as defined in claim 12 further including:

A) a generally planar second main circuit board providing a plurality of instrument conduction paths thereon from which the tester separately provides a signal path to at least one of the test instruments and further providing a plurality of DUT conduction paths from each of which the tester provides a signal path to a different respective system pin;

B) at least one generally planar second auxiliary circuit board so mounted on the second main circuit board as to extend generally transversely thereof; and

C) a plurality of second matrix switches, each of which is mounted on one of the at least one second auxiliary circuit board, each second auxiliary circuit board connecting each second matrix switch thereon between one of the DUT conduction paths on the second main circuit board and one of the instrument conduction paths on the second main circuit board, a plurality of said second matrix switches being connected in this manner between each DUT conduction path on the second main circuit board and a plurality of respective instrument conduction paths on the second main circuit board, and a plurality of the second matrix switches being connected in this manner between each instrument conduction path on the second main circuit board and a plurality of respective DUT conduction paths on the second main circuit board.

14. An automatic circuit tester as defined in claim 13 wherein the matrix and tree switches comprise mechanical relays controllable by the control circuit.

15. An automatic circuit tester as defined in claim 11 wherein the matrix and tree switches comprise mechanical relays controllable by the control circuit.

10. An automatic circuit tester as defined in claim I wherein the matrix switches comprise mechanical relays operable by the control circuit.

16. An automatic circuit tester including:

A) at least one test instrument;

B) a plurality of system pins adapted for connection to test points in a device under test (DUT);

C) a control circuit for operating the instruments so as to perform a test on the device under test;

D) a generally planar main circuit board providing a plurality of DUT conduction paths from each of which the tester provides a signal path to a different respective system pin and further providing a plurality of tree conductive paths;

E) at least one generally planar auxiliary circuit board so mounted on the main circuit board as to extend generally transversely thereof; and

F) a plurality of tree switches, each of which is mounted on one of the at least one auxiliary circuit board, the at least one auxiliary circuit board connecting the tree switches to the tree conductive paths in a tree structure of at least three levels, in which each given path in a level below the top level is linked by a plurality of tree switches to a plurality of paths of the next higher level in a group thereof separately associated with the given path, the tester providing separate signal paths between the tree paths in the top level and respective DUT conductive paths, the tester further providing a signal path between the test instrument and a tree conductive path at the bottom level,

whereby the instrument can be connected selectively to the system pins by operation of the tree switches.