Circuit for measuring the level of an electrical signal and including offset correction means, and application thereof to amplifiers having automatic gain control

• US 5,132,609 A
• Filed: 12/19/1990
• Issued: 07/21/1992
• Est. Priority Date: 12/22/1989
• Status: Expired due to Term

• Current Assignee: Semiconductor Components Industries LLC (ON Semiconductor Corporation)
• Original Assignee: Alcatel-Lucent France, SA (Nokia Corporation)
• Inventors: Nguyen, Quang-Tan
• Primary Examiner(s): Wieder, Kenneth A.
• Assistant Examiner(s): BURNS, WILLIAM
• Application Number:
  US07/629,904
• Time in Patent Office: 580 Days
• Field of Search: 324/130, 324/142, 324/111, 307/491, 328/127, 341/140, 330/9
• US Class Current: 324/130
• CPC Class Codes: G01R 19/16571 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533, G01R19/1659 take precedence; measuring currents by using elements sensitive to the magnetic field generated G01R15/14; measuring earth resistance G01R27/18; testing for leakage or short circuits in electrical apparatus G01R31/52
• CPC Class Codes: H03F 3/45479 characterised by the way of common mode signal rejection

Abstract

A measurement circuit for measuring the level of an input electrical signal, the circuit comprising an input amplifier biased from a bias voltage, receiving the input signal, and producing an output signal, followed by a detector module itself followed by an integrator delivering an integration signal, these three components constituting a measurement channel, the integration signal being the sum of an offset signal and of a level signal which is proportional to the level of the input signal. The measurement circuit further includes a generator producing a reference voltage, a compensation module receiving the reference voltage and producing a compensation signal, and a differential measurement amplifier receiving the integration signal and the compensation signal and producing a measurement signal, wherein the bias voltage is constituted by the reference voltage, and wherein the compensation module comprises stages corresponding to the components of the measurement channel for conveying the reference voltage through conditions that match the conditions of the measurement channel, thereby producing, in particular, a correction signal having the same value as the offset signal, the correction signal being included in the compensation signal.

Claims

1. A measurement circuit for measuring the level of an input electrical signal, the circuit comprising an input amplifier biased from a bias voltage, receiving said input signal, and producing an output signal, followed by a detector module itself followed by an integrator delivering an integration signal, these three components constituting a measurement channel, said integration signal being the sum of an offset signal and of a level signal which is proportional to the level of said input signal, said measurement circuit further including a generator producing a reference voltage, a compensation module receiving said reference voltage and producing a compensation signal, and a differential measurement amplifier receiving said integration signal and said compensation signal and producing a measurement signal, wherein said bias voltage is constituted by said reference voltage, and wherein said compensation module comprises stages corresponding to said components of said measurement channel for conveying said reference voltage through conditions that match the conditions of said measurement channel, thereby producing, in particular, a correction signal having the same value as said offset signal, said correction signal being included in said compensation signal.

2. A measurement circuit according to claim 1, wherein said compensation module produces a compensation signal comprising, in addition to said correction signal, an evaluation signal which is proportional to said reference voltage generating a comparison signal through said measurement amplifier, which comparison signal is also proportional to said reference voltage, said measurement signal being proportional to the difference between said comparison signal and the level of said input signal.

3. A measurement circuit according to claim 1, wherein said input signal is a differential signal, said input amplifier comprising identical first and second transistors each receiving a respective one of the input signal paths on its base, the collector of the first transistor being connected to a power supply voltage via a first resistor, the collector of the second transistor being connected to said power supply voltage via a second resistor having the same resistance as said first resistor, the emitters of said transistors being connected to the collector of a third transistor whose emitter is connected to ground via a third resistor and whose base receives said reference voltage via a first diode which matches the base-emitter junction of said third transistor, said diode being biased by a first diode resistor connected to said power supply voltage.

4. A measurement circuit according to claim 3, wherein said detector module comprises a fourth transistor whose base is connected to the collector of said second transistor and whose collector is connected to said power supply voltage, and a fifth transistor whose base is connected to the collector of said first transistor and whose collector is connected to said power supply voltage, the emitters of said fourth and fifth transistors having a common point which is connected to ground via a common resistor.

5. A measurement circuit according to claim 4, wherein said integrator is constituted by an R-C cell, the integration resistor of said cell connecting said common point to the first input of said measurement amplifier and the integration capacitor of said cell being connected firstly to said first input and secondly either to ground or to the output of said measurement amplifier.

6. A measurement circuit according to claim 4, wherein said compensation module comprises both a first stage corresponding to said input amplifier and constituted by a sixth transistor matching said third transistor with the emitter of the sixth transistor being connected to ground by a sixth resistor, with its collector connected to said power supply voltage via a seventh resistor, and with its base receiving said receiving voltage via a second diode matching said first diode and the base-emitter junction of said sixth transistor, said second diode being biased by a second diode resistor connected to said power supply voltage, and a second stage corresponding to said detector module and constituted by a seventh transistor matching said fourth transistor and connected in common collector mode, with the base of the seventh transistor being connected to the collector of said sixth transistor, and with its emitter being connected firstly to ground via a resistor and secondly to the second input of the measurement amplifier via a compensation resistor.

7. A measurement circuit according to claim 6, wherein said first and second diodes are constituted by a single diode which matches the base-emitter junctions of both of said third and the sixth transistors, and said diode resistors are constituted by a single resistor.

8. A measurement circuit according to claim 1, wherein all of the components of said measurement channel and of said compensation module are integrated in a monolithic circuit.

9. A measurement circuit according to claim 5, wherein all of the components of said compensation module and of said measurement channel other than said integration capacitor are integrated in a monolithic circuit.

10. A measurement circuit according to claim 8, wherein said generator is also integrated in said monolithic circuit.

11. A measurement circuit according to claim 8, wherein said measurement amplifier is also integrated in said monolithic circuit.

12. A measurement circuit according to claim 1, wherein said generator is a module whose output voltage is referenced to the band gap of a semiconductor.

13. An application of the measurement circuit of claim 1 to an automatic gain control circuit, said circuit comprising an AGC amplifier producing said input signal from a reference signal, wherein the control signal of said AGC amplifier is said measurement signal.

14. An application according to claim 13, wherein said input amplifier is the output stage of said AGC amplifier.

15. An application of the measurement circuit of claim 1 to demodulating an amplitude modulated signal, wherein said correction signal constitutes said compensation signal.