X-ray analysis apparatus

• US 5,132,995 A
• Filed: 08/07/1990
• Issued: 07/21/1992
• Est. Priority Date: 03/07/1989
• Status: Expired due to Term

• Current Assignee: Hologic Incorporated
• Original Assignee: Hologic Incorporated
• Inventors: Stein, Jay A.
• Primary Examiner(s): Porta, David P.
• Application Number:
  US07/564,156
• Time in Patent Office: 714 Days
• Field of Search: 378/51-56, 378/145, 378/146, 378/147, 378/155, 378/62, 378/19, 378/11, 378/4, 378/196
• US Class Current: 378/56
• CPC Class Codes: A61B 6/505 for diagnosis of bone
• CPC Class Codes: G01N 23/083 the radiation being X-rays

Abstract

X-ray analysis apparatus and related method including a bone densitometer apparatus, in which detectors are translatable in the plane of the fan beam for each scan line position to provide enhanced signal-to-noise ratio and resolution, and detector-to-detector normalization. In this motion, the detectors move relative to an x-ray source and an object or patient. Indexing or moving from one scan line position to the next involves relative movement between the object or patient, and the x-ray source and detectors, which are fixed in relationship to each other during this indexing.

Claims

1. A method of performing normalization in x-ray analysis comprising

scanning an object utilizing an x-ray beam in a plane,

detecting through x-ray radiation with a linear array of detectors,

translating said linear array of detectors in the plane of the beam so that each detector in said linear array of detectors moves a distance of at least two detector dimensions, and sampling the signal of said detectors repeatedly in the manner that each detector detects x-rays at the same pixel as a neighboring detector,

comparing said gain of each detector with a gain of said neighboring detector for said same pixel, and

adjusting said gain of each detector by a correction factor dependent upon said comparison.

2. The method of claim 1 further comprising determining said correction factor as the difference between said gain of one detector and the gain of at least one other detector, said one detector being used as a standard, and the correction factor further comprising an offset value.

3. The method of claim 2 further comprising averaging gains measured for said one detector during a longitudinal scan, and comparing said average to an average of gains measured for at least one other detector during said longitudinal scan.

4. The method of claim 1 further comprising averaging gains measured for said one detector during a scan perpendicular to said scanning direction and transverse to the object, and comparing said average to an average of gains measured for at least one other detector during a scan perpendicular to said scanning direction and transverse to the object.

5. An x-ray analysis apparatus comprising

an x-ray source means which generates and projects at least one x-ray beam of fan shape in a plane transverse to a desired direction of scan of an object,

detector array means arranged on the opposite side of the object to detect x-rays to produce signals corresponding to the amount of x-rays transmitted through the object,

said detector array means comprising a plurality of detector elements having a continually exposed sensitive region of predetermined dimension,

said detector array means, together with and in fixed relation to said x-ray source means, being movable relative to the object in a scanning direction normal to the plane of the beam through a multiplicity of scan line positions, and

said detector array means at each scan line position of said x-ray source means being movably driven in a set of selected equal increments relative to said x-ray source means and the object in a second direction in the plane of the beam, transverse to the scanning direction, a said increment having a length corresponding to a fraction of said predetermined continually exposed dimension of said sensitive region,

means to produce, in correspondence with said set of selected equal increments, multiple samples of the signals from each said detector element of the detector array means at each scan line position of said x-ray source means during said movement of said detector array means in said second, transverse direction, and

signal processing means responsive to signals from the detector array means corresponding to said multiple samples to produce an image of the object.

6. The apparatus of claim 5 wherein said plurality of detector elements comprise a single linear array in which said detector elements are evenly spaced from center to center.

7. The apparatus of claim 6 wherein each said detector element in said linear array comprises a photomultiplier tube associated with a scintillation crystal.

8. The apparatus of claim 6 further comprising a mask movable into and out of position in front of said detector elements, said mask constructed to limit the exposed region of each of said detector elements, said apparatus operable to produce an image with and without said mask in position, said mask, when moved in position, being effectively attached to and movable with said linear array of detector elements during both movement in said scanning direction and said incremental movement in said second , transverse direction.

9. The apparatus of claim 6 wherein said detector elements in said linear array are incremented and sampled at equally spaced positions between the center-to-center spacing of said detector elements.

10. The apparatus of claim 5 wherein said x-ray source means comprises an x-ray source and a slit collimator to produce the fan-shaped beam.

11. The apparatus of claim 10 wherein said x-ray source comprises an x-ray tube and a power supply, said power supply being constructed to generate both a low energy and a high energy x-ray pulse during said scan of the object.

12. The apparatus of claim 5 further comprising normalizing means for comparing the signal associated with a particular location on the object as detected by at least one said detector element with the signal associated with the same location on the object as detected by at least one other said detector element and adjusting the response of one of said detector elements on the basis of said comparison.

13. The apparatus of claim 5 further comprising offset adjusting means for compensating for the residual current generated by each said detector element when not being exposed to x-rays.

14. The apparatus of claim 5 wherein said x-ray source means and said detector array means are translatable in a direction orthogonal to said second, transverse direction to produce said movement in said scanning direction.

15. The apparatus of claim 5 wherein said x-ray source means and said detector array means are rotatable together to produce said movement in said scanning direction.

16. The apparatus of claim 15 wherein said rotation is about a line in the plane of the fan beam passing through the x-ray source as center.

17. The apparatus of claim 5 further comprising means orienting said x-ray source means and said detector array means to expose the object to x-rays laterally along the thickness of the object.

20. The apparatus of claim 12, 18, or 19 wherein said normalizing means adjusts the response of each said detector element in a serial-dependent fashion over all said detector elements in said array, to approximately equal the response of a preselected one of said detector elements.

21. The apparatus of claim 20 wherein said normalizing means adjusts the gain of a second detector element in said array by a correction factor, said correction factor comprising the difference between the gain of said second detector element and the gain of a first neighboring detector element used as a reference, said second detector element being used to correct a third detector element in the same manner but using said second detector element as a reference, and so on throughout said array.

22. The apparatus of claim 20 wherein an average gain measured over the entire scan of the object for each said detector element is normalized to an average gain measured over the entire scan of the object for a chosen reference detector element.

23. The apparatus of claim 20 wherein an average gain measured over a scan in said second, transverse direction for each said detector element is normalized to an average gain measured over a scan in said second, transverse direction for a chosen reference detector element.

18. An x-ray analysis apparatus comprising

an x-ray source means which generates and projects at least one x-ray beam of fan shape in a plane transverse to a desired direction of scan of an object,

detector array means arranged on the opposite side of the object to detect x-rays to produce signals corresponding to the amount of x-rays transmitted through the object,

said detector array means comprising a plurality of detector elements having a continually exposed sensitive region of predetermined dimension,

said detector array means, together with and in fixed relation to said x-ray source means, being movable relative to the object in a scanning direction normal to the plane of the beam through a multiplicity of scan line positions, and

said detector array means at each scan line position of said x-ray source means being movably driven in a set of selected equal increments relative to said x-ray source means and the object in a second direction in the plane of the beam, transverse to the scanning direction,

the size and spacing of said detector elements and the size and number of said increments of movement causing each detector, at least at one of its positions in each scan line position, to overlie the same location on said object as does an adjacent detector element in at least one of its positions in said scan line position,

means to produce, in correspondence with said set of selected equal increments, multiple samples of the signals from each said detector element of the detector array means at each scan line position of said x-ray source means during said movement of said detector array means in said second, transverse direction, and

signal processing means responsive to signals from the detector array means corresponding to said multiple samples to produce an image of the object,

the apparatus further comprising normalizing means for comparing the signal associated with each pair of adjacent detector elements for a particular location on the object as detected by at least one of said pair of detector elements with the signal associated with the same location on the object as detected by the other of said pair of detector elements and adjusting the response of one of said detector elements of each pair on the basis of said comparison.

19. The apparatus of claim 18 wherein a said increment corresponds to a fraction of the center-to-center distance between adjacent detectors and the number of positions in said set of positions of the detector elements at each scan line is selected to cause the x-ray transmission characteristics of all points of the object along said line to be detected.

24. A bone densitometer apparatus for measuring the bone density of a patient comprising

x-ray source means comprising x-ray tube means, associated power supply, and collimator slit which generates and projects at least one x-ray beam in a fan beam shape,

detector array means arranged on the opposite side of the patient to detect x-rays to produce signals corresponding to the amount of x-rays transmitted through the patient,

said detector array means comprising a plurality of detector elements having a continually exposed sensitive region of predetermined dimension,

said detector array means, together with and in fixed relation to said x-ray source means, being translatable in a scanning direction normal to the plane of the beam through a multiplicity of scan line positions, and

said detector array means at each scan line position of said x-ray source means being translatable in a set of selected equal increments in a second direction in the plane of the beam, transverse to said scanning direction, a said increment having a length corresponding to a fraction of said predetermined continually exposed dimension of said sensitive region,

means to produce, in correspondence with said set of selected equal increments, multiple samples of the signals from each said detector element of the detector array means at each scan line position of said x-ray source means during said movement of said detector array means in said second, transverse direction, and

signal processing means responsive to signals from the detector array means corresponding to said multiple samples to produce an image of the bone density of the patient.

25. The apparatus of claim 24 further comprising means orienting said x-ray source means and said detector array means to expose the patient to x-rays laterally along the thickness of the patient.

26. A method of performing x-ray analysis on an object comprising:

generating, from an x-ray source means, at least one x-ray beam of fan shape in a plane;

exposing the object by passing said x-ray fan beam through it;

detecting x-rays attenuated by the object utilizing a detector array means, said detector array means comprising a plurality of detector elements having a continually exposed sensitive region of predetermined dimension;

translating said detectors and said beam together in fixed relation in a scanning direction normal to said plane of said x-ray fan beam through a number of scan line positions to perform a scan on the object;

at each scan line position, translating said detectors, relative to said x-ray source means and the object, in a set of selected equal increments in a direction transverse to said scanning direction, a said increment having a length corresponding to a fraction of said predetermined continually exposed dimension of said sensitive region;

producing, in correspondence with said set of selected equal increments, multiple samples of the signals from each said detector element of the detector array means at each scan line position of said x-ray source means during said movement of said detector array means in said transverse direction; and

producing, by utilizing signal processing means responsive to signals from the detector array means corresponding to said multiple samples, an image of the object.