Light emitting diode scanner

• US 5,136,147 A
• Filed: 08/27/1990
• Issued: 08/04/1992
• Est. Priority Date: 08/27/1990
• Status: Expired due to Term

• Current Assignee: Symbol Technologies, Inc. (Zebra Technologies Corporation)
• Original Assignee: Symbol Technologies, Inc. (Zebra Technologies Corporation)
• Inventors: Goren, David P., Barkan, Edward D., Shepard, Howard, Swartz, Jerome, Metlitsky, Boris, Biuso, Tony
• Primary Examiner(s): PITTS, HAROLD I
• Application Number:
  US07/572,446
• Time in Patent Office: 708 Days
• Field of Search: 235/462, 235/472, 235/463, 235/469, 350/6.5, 250/566, 250/555
• US Class Current: 235/462.21
• CPC Class Codes: G06K 7/10594 Beam path
• CPC Class Codes: G06K 7/10702 Particularities of propagating elements, e.g. lenses, mirrors G06K7/10831 takes precedence

Abstract

A portable scanning head emits and receives light from a light emitting diode to read symbols, such as bar-code symbols. The optics within the scanner are operative for focusing a light beam and the view of a light sensor in different planes exteriorly of a scanner housing. Imaging means are provided in the unit for imaging a viewing window. The viewing window has an area smaller than that of the scan spot. The system can employ an LED as a light source and tolerate the relatively large-sized (on the order of millimeters) scan spot without sacrificing reading performance since the photodiode "sees" only that portion of the scan spot visible through the viewing window.

Claims

1. A system for reading symbols, comprising:

(a) light source means for generating a light beam;

(b) focusing means for focusing the light beam to a scan spot of predetermined area at scan plane and for positioning the scan spot on a symbol located in a working distance range in the vicinity of the scan plane;

(c) scanning means for sweeping the scan spot across the symbol in a scan, thereby reflecting off the symbol reflected light, at least a returning portion of which travels away from the symbol back in the direction of the light source, the returning portion of the reflected light having a variable intensity over the scan;

(d) a sensor for viewing and detecting the variable intensity of the returning portion of the reflected light over a field of view, and for generating an electrical signal indicative of the detected variable light intensity;

(e) a signal processor for processing the electrical signal and generating therefrom data descriptive of the symbol, the signal processor including

(i) a converter for receiving the electrical signal and developing an amplified, filtered, and inverted first voltage signal relative to the electrical signal,

(ii) a delay circuit for developing a delayed version of the first voltage signal

(iii) a peak-locating comparator for receiving the first voltage signal and the delayed version of the first voltage signal, the peak locating comparator changing state whenever the first voltage signal and the delayed version of the first voltage signal are equal, and the peak-locating comparator generating an output,

(iv) a gating comparator for receiving the first voltage signal, for changing state on pulses of the first voltage signal that are greater than positive and negative noise thresholds, and for generating an output, and

(v) a latch comparator for receiving the outputs of the peak-locating comparator and the gating comparator, the latch comparator changing state only if the gating comparator has changed state since the last change of state of the peak-locating comparator, the latch comparator providing data descriptive of the symbol; and

(f) imaging means for imaging a viewing window of the sensor means, said viewing window having an area smaller than that of the scan spot, and for positioning the viewing window at a viewing plane that is spaced away from the scan plane.

2. The system according to claim 1, wherein the light source means includes a non-laser source.

3. The system according to claim 2, wherein the non-laser source is a light emitting diode.

4. The system according to claim 1, wherein the focusing means includes a focusing mirror operative to optically form the scan spot to have a generally circular area.

5. The system according to claim 4, wherein the focusing mirror has a generally spherical reflecting surface.

6. The system according to claim 1, wherein the sensor means includes a photodiode having a sensor opening, and wherein the imaging means includes an apertured wall having an aperture adjacent the sensor opening and through which aperture said returning portion of the reflected light passes.

7. The system according to claim 6, wherein the aperture has a generally rectangular shape, having a shorter dimension as considered longitudinally along the symbol, and a longer dimension as considered in a direction transversely of the symbol.

8. The system according to claim 6, wherein the aperture has a generally elliptical shape, having a shorter dimension as considered longitudinally along the symbol, and a longer dimension as considered in a direction transversely of the symbol.

9. The system according to claim 6, wherein the imaging means further includes an imaging mirror.

10. The system according to claim 9, wherein the imaging mirror has a generally spherical reflecting surface.

11. The system according to claim 1, wherein the focusing means includes a focusing mirror, and wherein the imaging means includes an imaging mirror, and wherein the mirrors are mounted in the housing for joint movement longitudinally across the symbol.

12. The system according to claim 11, wherein the scanning means includes a reciprocatingly oscillatable scanning component on which both the focusing mirror and the imaging mirror are mounted for joint movement herewith about an axis.

13. The system according to claim 12, wherein the imaging mirror is mounted on the focusing mirror and angularly offset relative to said axis.

14. The system according to claim 13, wherein the light source means generates the light beam along a first optical axis, and wherein the imaging means focuses the view of the sensor means along a second optical axis, and herein the angle included between said optical axes is on the order of twice the angular offset between the imaging and focusing mirrors.

15. The system according to claim 1, wherein the housing has a handle to enable hand-held operation, and wherein the housing is aimable by a user at the symbol to read at a longitudinal distant from a front wall, and wherein the scan plane and the viewing plane are longitudinally offset relative the front wall of the housing.

16. The system according to claim 1, wherein the sensor means includes a pair of photodiodes, each having a sensor opening, and wherein the imaging means includes a pair of apertured walls, each having an aperture situated adjacent a respective sensor opening, and wherein the imaging means is operative for focusing each view of the respective photodiodes to a pair of viewing windows positioned in different viewing planes exteriorly of the housing.

17. A method of reading symbols, comprising the steps of:

(a) generating a light beam;

(b) focusing the light beam to a scan spot of predetermined area at a scan plane, the scan spot being positioned on a symbol located in a working distance range in the vicinity of the scan plane;

(c) sweeping the scan spot across the symbol in a scan, at least a returning portion of light being reflected back from the symbol, said returning portion of the reflected light having a variable intensity over the scan;

(d) viewing and detecting the variable intensity of said returning portion of the reflected light over a field of view by sensor means, and generating an electrical signal indicative of the detected variable light intensity;

(e) processing the electrical signal and generating therefrom data representative of the symbol, the step of processing including

(i) converting the electrical signal into an amplified, filtered, and inverted first voltage relative to the electrical signal,

(ii) developing a delayed version of the first voltage signal,

(iii) comparing the first voltage signal and the delayed version of the first voltage signal in a peak-locating comparator, the peak locating comparator changing state when the first voltage signal and the delayed version of the first voltage signal are equal,

(iv) receiving the first voltage signal in a gating comparator, the gating comparator changing state when the first voltage signal exceeds positive and negative noise thresholds, and

(v) receiving the outputs of the peak-locating comparator and gating comparator, the latch comparator changing state only if the gating comparator has changed state since the last change of state of the peak-locating comparator, the latch comparator providing data descriptive of the symbol; and

(f) imaging a viewing window of the sensor means, the viewing window having an area much smaller than that of the scan spot, and positioning the viewing window at a viewing plane that is spaced away from the scan plane.

18. A method according to claim 17 wherein said step of focusing includes reflecting the light beam by a curved mirror.

19. A method according to claim 17 wherein said step of viewing includes reflecting said returning portion by a curved mirror.

20. A method according to claim 18 wherein said step of sweeping includes moving said curved mirror.

21. A method according to claim 17 wherein said viewing window has a width of about the same size as a minimum dimension of features of said symbol.