Modular optical system for Fourier transform infrared spectrometer

• US 5,153,675 A
• Filed: 02/22/1990
• Issued: 10/06/1992
• Est. Priority Date: 02/22/1990
• Status: Expired due to Term

• Current Assignee: Thermo Nicolet Corporation
• Original Assignee: Nicolet Instrument Corporation
• Inventors: Beauchaine, Kenn A.
• Primary Examiner(s): Willis, Davis L.
• Assistant Examiner(s): Hantis, K. P.
• Application Number:
  US07/484,221
• Time in Patent Office: 957 Days
• Field of Search: 356/244, 356/346, 356/345, 250/339
• US Class Current: 356/451
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes
• CPC Class Codes: G01N 2201/024 Modular construction
• CPC Class Codes: G02B 7/1822 comprising means for aligning the optical axis G02B7/1821 takes precedence

Abstract

A modular optical system for a Fourier transform infrared spectrometer which has a baseplate assembly with a baseplate having a top surface and two mirrors mounted to focus at a point above the baseplate. At least two pins extend upwardly from the baseplate top surface and are fixed with respect to the foci of the mirrors. An accessory module has a flat bottomed positioning plate with portions defining pin holes to coincide with the pins of the face plate. A sample holding accessory platform extends from the positioning plate and is fixed with respect to the pin holes so that when the pin holes of the positioning plate are positioned over the pins of the baseplate and the positioning plate bottom surface is engaged with the locator pads on the baseplate, the sample is located at the foci of the mirrors. Three accessory module guides are located on the baseplate having spring-mounted retainer balls accurately spaced a common distance from the surface of the baseplate which engage beveled chamfers in the sides of the positioning plate and hold the accessory module in place. A sample to be analyzed may be placed in the accessory module and positioned in the FTIR spectrometer by hand, requiring no tools to accurately position the sample.

Claims

1. A modular optical system for a Fourier transform infrared spectrometer comprising:

(a) a baseplate assembly having a baseplate with a top surface and two mirrors mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors;

(b) an accessory module having a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position laterally, longitudinally, and rotationally with respect to the foci of the mirrors, and means for releasably clamping the positioning plate to the baseplate.

2. A modular optical system for a Fourier transform infrared spectrometer comprising:

(a) a baseplate assembly having a baseplate with a top surface and two mirrors mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors;

(b) an accessory module having a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position laterally, longitudinally, and rotationally with respect to the foci of the mirrors;

including three located pads with rounded tops, the pads mounted on the baseplate to engage the bottom surface of the positioning plate to locate precisely the accessory module in elevation and in rotation about an axis in the plane of the positioning plate.

3. A modular optical system for a Fourier transform infrared spectrometer comprising:

(a) a baseplate assembly having a baseplate with a top surface and two mirrors mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors;

(b) an accessory module having a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position laterally, longitudinally, and rotationally with respect to the foci of the mirrors;

further including accessory module guides rigidly attached to the baseplate and spaced from the focus of the mirrors and having spring-loaded retainer balls adapted to engage the positioning plate of the accessory module and cooperating with the baseplate to vertically position the accessory module.

4. The modular optical system of claim 3 wherein the positioning plate has four sides and beveled chamfers located along at least two sides of the positioning plate, the chamfers being adapted to be engaged by the retainer balls of the accessory module guides to restrict vertical motion and aid the horizontal stability of the positioning plate.

5. An accessory module for a Fourier transform infrared spectrometer modular optical system comprising:

(a) a positioning plate having front, back, left and right sides and a substantially flat bottom surface, a first pin hole therein spaced inwardly from the left side;

a second pin hole therein spaced inwardly from the right side; and

a pin notch opening therein on the front side; and

portions defining beveled chamfers on the top surface of the positioning plate along the left, right and back sides; and

(b) means for attaching a sample holding accessory to the positioning plate.

6. The accessory module of claim 5 wherein the first pin hole is circular and the second pin hole is oblong in shape.

7. The accessory module of claim 5 further including a sample holding accessory attached to the positioning plate by the means for attaching the sample holding accessory and including a mount extending upwardly from the positioning plate and having portions defining a beam aperture, and means on the mount for holding a sample to be analyzed in front of the beam aperture.

8. A baseplate assembly for a Fourier transform infrared spectrometer modular optical system, comprising:

(a) a baseplate having a substantially flat top surface;

(b) two mirrors with a common focus mounted on the baseplate;

(c) at least two pins mounted on the top surface of the baseplate between the mirrors;

(d) at least three accessory module guides having spring-loaded retainer balls accurately spaced a common distance from the surface of the baseplate.

9. The baseplate assembly of claim 8 including three locator pads with rounded tops, the pads mounted on the baseplate at spaced positions so that the tops of the pads define a plane.

10. A modular optical system for a Fourier transform infrared spectrometer comprising:

(a) a baseplate having a flat top surface;

(b) two mirrors mounted on the baseplate with a common focus above the baseplate;

(c) three register pins extending upwardly from the baseplate top surface and spaced a fixed distance from the edges of the baseplate;

(d) a positioning plate having portions defining a circular pin hole, an oval pin hole and a pin notch which spaced and adapted to receive the pins of the baseplates so as to fix the positioning plate with respect to the baseplate;

(e) a sample holding accessory mounted to and extending vertically upwardly from the positioning plate and having portions defining a beam aperture, wherein when the positioning plate is fitted onto the baseplate the beam aperture is located at the foci of the mirror; and

(f) accessory module positioning guide means attached to the baseplate in position for releasably clamping the positioning plate to the baseplate.

11. The system of claim 10 including three locator pads with rounded tops, the pads mounted to the baseplate at spaced positions to engage the bottom of the positioning plate and support it in a desired plane.

12. A Fourier transform infrared spectrometer system comprising:

(a) a source of infrared radiation which provides a beam of infrared;

(b) an interferometer which receives the beam from the source and produces a modulated output beam;

(c) an infrared detector;

(d) focusing optics for focusing a received beam onto the detector;

(e) a modulator optical system which receives the beam from the interferometer and provides a beam to the focusing optics, comprising;

a baseplate assembly mounted in a fixed position with respect to the interferometer and the focusing optics and including,

a first mirror receiving the beam from the interferometer and directing the beam to a selected position and a second mirror receiving the beam from the selected position and directing it to the focusing optics,

an accessory module having means thereon for mounting a sample holding accessory,

means on the baseplate assembly and accessory module for detachably mounting the accessory module to the baseplate assembly such that a sample holding accessory will be in a predetermined position with respect to the first and second mirrors so that the infrared beam from the first mirror passes to or is reflected from the sample and is received from the second mirror,

wherein the baseplate assembly includes a baseplate with a top surface and wherein the two reflecting mirrors are mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors,

and wherein the accessory module has a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position with respect to the foci of the mirrors, and means for releasably clamping the positioning plate to the baseplate.

13. The spectrometer system of claim 12 wherein the baseplate has three register pins extending upwardly from the top surface of the baseplate at spaced positions and the accessory module positioning plate has three pin holes positioned to receive the register pins of the baseplate.

14. The spectrometer system of claim 12 further including a sample holding accessory attached to the positioning plate by the means for attaching the sample holding accessory and including a mount extending upwardly from the positioning plate and having portions defining a beam aperture, and means on the mount for holding a sample to be analyzed in front of the beam aperture.

15. A Fourier transform infrared spectrometer system comprising:

(a) a source of infrared radiation which provides a beam of infrared;

(b) an interferometer which receives the beam from the source and produces a modulated output beam;

(c) an infrared detector;

(d) focusing optics for focusing a received beam onto the detector;

(e) a modular optical system which receives the beam from the interferometer and provides a beam to the focusing optics, comprising;

a baseplate assembly mounted in a fixed position with respect to the interferometer and the focusing optics and including,

a first mirror receiving the beam from the interferometer and directing the beam to a selected position and a second mirror receiving the beam from the selected position and directing it to the focusing optics,

an accessory module having means thereon for mounting a sample holding accessory,

means on the baseplate assembly and accessory module for detachably mounting the accessory module to the baseplate assembly such that a sample holding accessory will be in a predetermined position with respect to the first and second mirrors so that the infrared beam from the first mirror passes to or is reflected from the sample and is received from the second mirror,

wherein the baseplate assembly includes a baseplate with a top surface and wherein the two reflecting mirrors are mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors.

and wherein the accessory module has a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position with respect to the foci of the mirrors, including three locator pads with rounded tops, the pads mounted to the baseplate at spaced positions to engage the bottom of the positioning plate to support it in a desired plane.

16. A Fourier transform infrared spectrometer system comprising:

(a) a source of infrared radiation which provides a beam of infrared;

(b) an interferometer which receives the beam from the source and produces a modulated output beam;

(c) an infrared detector;

(d) focusing optics for focusing a received beam onto the detector;

(e) a modulator optical system which receives the beam from the interferometer and provides a beam to the focusing optics, comprising;

a baseplate assembly mounted in a fixed position with respect to the interferometer and the focusing optics and including,

a first mirror receiving the beam from the interferometer and directing the beam to a selected position and a second mirror receiving the beam from the selected position and directing it to the focusing optics,

an accessory module having means thereon for mounting a sample holding accessory,

means on the baseplate assembly and accessory module for detachably mounting the accessory module to the baseplate assembly such that a sample holding accessory will be in a predetermined position with respect to the first and second mirrors so that the infrared beam from the first mirror passes to or is reflected from the sample and is received from the second mirror,

wherein the baseplate assembly includes a baseplate with a top surface and wherein the two reflecting mirrors are mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors,

and wherein the accessory module has a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position with respect to the foci of the mirrors, wherein the means for detechably mounting the accessory module to the baseplate assembly further includes accessory module guides rigidly attached to the baseplate and spaced from the focus of the mirrors and having spring loaded retainer balls adapted to engage the positioning plate of the accessory module and cooperating with the baseplate to vertically position the accessory module.

17. The spectrometer system of claim 16 wherein the positioning plate has four sides and beveled chamfers located along at least two sides of the positioning plate, chamfers being adapted to be engaged by the retainer balls of the accessory module guides to restrict the motion of the positioning plate.

18. A Fourier transform infrared spectrometer system comprising:

(a) a source of infrared radiation which provides a beam of infrared;

(b) an interferometer which receives the beam from the source and produces a modulated output beam;

(c) an infrared detector;

(d) focusing optics for focusing a received beam onto the detector;

(e) a modular optical system which receives the beam from the interferometer and provides a beam to the focusing optics, comprising;

a baseplate assembly mounted in a fixed position with respect to the interferometer and the focusing optics and including,

a first mirror receiving the beam from the interferometer and directing the beam to a selected position and a second mirror receiving the beam from the selected position and directing it to the focusing optics,

an accessory module having means thereon for mounting a sample holding accessory,

means on the baseplate assembly and accessory module for detachably mounting the accessory module to the baseplate assembly such that a sample holding accessory will be in a predetermined position with respect to the first and second mirrors so that the infrared beam from the first mirror passes to or is reflected from the sample and is received from the second mirror,

wherein the baseplate assembly includes a baseplate with a top surface and wherein the two reflecting mirrors are mounted to the baseplate to focus at a position above the baseplate, and including at least two register pins extending upwardly from the top surface of the baseplate which are fixed with respect to the foci of the mirrors,

and wherein the accessory module has a positioning plate with a substantially flat bottom surface adapted to be supported by the baseplate, at least two pin holes in the positioning plate positioned to receive the register pins of the baseplate, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed with respect to the pin holes such that when the pin holes receive the pins a sample holding accessory may be located at a desired position with respect to the foci of the mirrors, wherein a first pin hole in the positioning plate is circular and a second pin hole is oblong in shape.

19. A modular optical system for a Fourier transform infrared spectrometer comprising:

(a) a baseplate assembly having a baseplate with a top surface and two mirrors mounted to the baseplate to focus at a position above the baseplate, and including three locator pads with rounded tops mounted to the baseplate;

(b) an accessory module having a positioning plate with a substantially flat bottom surface adapted to engage with the top surfaces of the locator pads, and adapted to mount a sample holding accessory in a desired position, wherein the sample holding accessory will be fixed in a plane when the positioning plate is supported on the locator pads; and

(c) accessory module positioning guide means attached to the baseplate in position for releasably clamping the positioning plate to the baseplate.

20. The modular optical system of claim 19 wherein the guide means comprise accessory module guides rigidly attached to the baseplate and spaced from the focus of the mirrors and having spring-loaded retainer balls adapted to engage the positioning plate of the accessory module and cooperating with the baseplate to vertically position the accessory module.

21. The modular optical system of claim 20 wherein the positioning plate has four sides and beveled chamfers located along at least two sides of the positioning plate, the chamfers being adapted to be engaged by the retainer balls of the accessory module guides to restrict vertical motion and aid the horizontal stability of the positioning plate.

22. The modular optical system of claim 19 wherein the baseplate has at least two register pins extending upwardly from its top surface and the positioning plate has at least two pin holes positioned to received the pins.

23. A baseplate assembly for a Fourier transform infrared spectrometer modular optical system, comprising:

(a) a baseplate having a substantially flat top surface;

(b) two mirrors with a common focus mounted on the baseplate;

(c) three rounded top locator pads mounted to the baseplate on the top surface between the mirrors;

(d) at least three accessory module guides mounted to the baseplate having spring-loaded retainer balls accurately spaced a common distance from the surface of the baseplate.