Universal pad pitch layout

• US 5,155,065 A
• Filed: 03/16/1992
• Issued: 10/13/1992
• Est. Priority Date: 03/16/1992
• Status: Expired due to Term

• Current Assignee: Freescale Semiconductor, Inc. (NXP Semiconductors NV)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: Schweiss, Helmut
• Primary Examiner(s): Hearn, Brian E.
• Assistant Examiner(s): Picardat, Kevin M.
• Application Number:
  US07/852,117
• Time in Patent Office: 211 Days
• Field of Search: 437/209, 437/211, 437/215, 437/210, 437/51, 437/220, 437/52, 357/70, 357/79, 357/80
• US Class Current: 438/599
• CPC Class Codes: H01L 2224/05553 being rectangular
• CPC Class Codes: H01L 2224/05599 Material
• CPC Class Codes: H01L 2224/45099 Material
• CPC Class Codes: H01L 2224/4943 the connecting portions being staggered
• CPC Class Codes: H01L 2224/49431 on the semiconductor or solid-state body
• CPC Class Codes: H01L 2224/85399 Material
• CPC Class Codes: H01L 23/50 for integrated circuit devices, e.g. power bus, number of leadsH01L23/482 - H01L23/498 take precedence
• CPC Class Codes: H01L 24/06 of a plurality of bonding areas
• CPC Class Codes: H01L 24/49 of a plurality of wire connectors
• CPC Class Codes: H01L 2924/00014 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
• CPC Class Codes: H01L 2924/01082 Lead [Pb]
• CPC Class Codes: H01L 2924/014 Solder alloys
• CPC Class Codes: H01L 2924/14 Integrated circuits

Abstract

A method for configuring a plurality of pads (305) on a semiconductor die (300) to accommodate more than one pad pitch. Pad sizes and pad to pad spacings are adjusted to achieve the pad configuration. A pattern may form in the pad configuration. The pattern is repeated to meet the number of pads needed in an application. Even though the pad pitch changes to accommodate various sizes of I/O'"'"'s and package lead pitches, a fixed contact pitch probe card can be used for various pad pitches and patterns.

Claims

1. A universal pad pitch layout method for incrementally varying pad pitches for a fixed row of pads comprising:

defining a grid size, wherein the grid size is a base unit of measure for pad widths and pad spacings;

defining a minimum pad width, wherein the pad width is an integer multiple of the grid size;

defining a uniform pad height;

defining a minimum pad pitch, wherein the minimum pad pitch is an integer multiple of the grid size;

forming a row of pads;

defining an incremental pad pitch, wherein predetermined pads in the row of pads can be contacted at a pad pitch equal to the minimum pad pitch plus an integer multiple of the incremental pad pitch;

varying the width of predetermined pads in the row of pads by increments of the grid size;

varying the pad pitch between predetermined pads by increments of the grid size; and

combining variations in the pad width and the pad pitch to create a pad pattern wherein all pads can be contacted at the minimum pad pitch and predetermined pads can be contacted at the minimum pad pitch plus an integer multiple of the incremental pad pitch.

2. The universal pad pitch layout method for incrementally varying pad pitches for a fixed row of pads of claim 1 further including:

adding at least another row of pads;

staggering pads from row to row;

creating a pad pattern for each row of pads; and

correlating the pad patterns from each row to create a pad pattern wherein all pads can be contacted at the minimum pad pitch and predetermined pads can be contacted at the minimum pad pitch plus an integer multiple of the incremental pad pitch.

3. The universal pad pitch layout method for incrementally varying pad pitches for a fixed row of pads of claim 2 further including:

repeating the pad patterns of each row to increase pad numbers.

4. The universal pad pitch layout method for incrementally varying pad pitches for a fixed row of pads of claim 3 further including:

forming a pad ring by repeating the pad patterns of each row around a semiconductor die to increase pad numbers.

5. A method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip comprising:

defining a minimum pad size, a minimum pad pitch and an incremental pad pitch;

defining a unique placement for each pad in a row of pads;

increasing pad areas of predetermined pads in the row of pads at integer multiples of the incremental pad pitch, wherein each pad area and the unique placement allows more than one pad pitch to be accommodated; and

providing pads to be used at a predetermined pad pitch, the predetermined pad pitch comprising the minimum pad pitch plus any integer multiple of the incremental pad pitch.

6. The method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip of claim 5 further including:

varying pad pitch between pads in the row of pads to create the unique placement of each pad.

7. The method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip of claim 5 further including:

repeating the unique placement of pads to accommodate more pads on the semiconductor chip.

8. The method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip of claim 5 further including:

adding additional rows of pads to increase pad density, each row of pads having a unique pad placement pattern with varying pad areas.

9. The method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip of claim 8 further including:

staggering pads of different pad rows to increase pad density.

10. The method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip of claim 8 further including:

correlating the unique pad placement patterns of each pad row to one another to provide a fixed row of pads which accommodates variable pad pitches.

11. The method for accommodating variable pad pitches for a fixed row of pads on a semiconductor chip of claim 7 further including:

repeating the unique pad placement pattern in each row of pads to accommodate the number of pads needed for the semiconductor chip.

12. A method for configuring pads on a semiconductor die which allows pad contact at more than one pad pitch comprising:

defining a sequence of pads having a uniform size and a uniform pad pitch; and

adjusting pad areas of predetermined pads in the sequence of pads to change contact areas of pads;

forming a unique sequence of pads which can accommodate more than one pad pitch; and

fixing the unique sequence of pads in a predetermined area on the semiconductor die.

13. The method for configuring pads on a semiconductor die which allows pad contact at more than one pad pitch of claim 12 further including:

maintaining a uniform pad height through the sequence of pads; and

adjusting predetermined pad areas by increasing pad width, thereby increasing lateral area of a pad for contact at different pad pitches, wherein the adjusting is done in predetermined grid size increments.

14. The method for configuring pads on a semiconductor die which allows pad contact at more than one pad pitch of claim 12 further including:

adjusting pad to pad spacings in the unique sequence of pads to accommodate more than one pad pitch.

15. The method for configuring pads on a semiconductor die which allows pad contact at more than one pad pitch of claim 14 further including:

repeating the unique pad pattern to meet a required number of pads.

16. The method for configuring pads on a semiconductor die which allows pad contact at more than one pad pitch of claim 12 further including:

forming rows of pads to increase pad density, each row having a predetermined sequence of pads; and

staggering the rows to simplify interconnect and increase pad density.

17. A method for forming two rows of semiconductor pads which allows semiconductor pad contact at 50, 75, 100, 125, and 150 micron pad pitches comprising:

defining a semiconductor pad height;

defining a semiconductor pad width, wherein a semiconductor pad with is 50 microns wide or 75 microns wide;

defining spacings between adjacent pads as a 25 micron wide space or a 50 micron wide space;

staggering the two rows of semiconductor pads

defining a reference line which aligns the two rows of semiconductor pads to one another;

forming a first row of semiconductor pads, starting at the reference line and listing semiconductor pad widths and semiconductor pad spacings in sequential order, the first row of semiconductor pads comprising a 50 micron wide pad, 25 micron space, 75 micron wide pad, 50 micron space, 75 micron wide pad, 25 micron space, 50 micron wide pad, 25 micron space, 75 micron wide pad, 50 micron space, 75 micron wide pad, 25 micron space, 50 micron wide pad, 25 micron space, 75 micron wide pad, 50 micron space, 75 micron wide pad, 25 micron space, 50 micron wide pad, 25 micron space, 75 micron wide pad, 50 micron space, 75 micron wide pad, 25 micron space, 50 micron wide pad, 25 micron space, 75 micron wide pad, 50 micron space, 75 micron wide pad, and a 25 micron space; and

forming a second row of semiconductor pads adjacent to the first row of semiconductor pads, starting at the reference line and listing semiconductor pad widths and semiconductor pad spacings in sequential order, the second row of semiconductor pads comprising a 25 micron space, 75 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, 75 micron wide pad, 25 micron space, 50 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, 75 micron wide pad, 25 micron space, 50 micron wide pad, 50 micron space, 50 micron wide pad, 25 micron space, 75 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, 50 micron wide pad, 50 micron space, and a 50 micron wide pad.

18. The method for forming two rows of semiconductor pads which allows semiconductor pad contact at 50, 75, 100, 125, and 150 micron pad pitches of claim 17 further including:

forming all semiconductor pads having a uniform height.

19. The method for forming two rows of semiconductor pads which allows semiconductor pad contact at 50, 75, 100, 125, and 150 micron pad pitches of claim 17 further including:

repeating the sequential order of semiconductor pads and pad spacing of the first and second rows of semiconductor pads to form two rows of pads capable of accommodating a larger number of pads.