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Semiconductor memory with multiple clocking for test mode entry

  • US 5,161,159 A
  • Filed: 08/17/1990
  • Issued: 11/03/1992
  • Est. Priority Date: 08/17/1990
  • Status: Expired due to Term
First Claim
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1. An integrated circuit having a normal operating mode, and having a special operating mode enabled by an enable signal, comprising:

  • a first terminal for receiving pulses of a mode initiate signal indicating entry into a special operating mode; and

    an enable circuit, having an input coupled to said first terminal, and having an output for presenting said enable signal responsive to receipt, at said first terminal, of a plurality of pulses of said mode initiate signal, wherein said enable circuit comprises sequential logic for storing a state indicating the receipt of a single pulse of said mode initiate signal and for not presenting said enable signal responsive to receipt, at said first terminal, of a signal pulse of said mode initiate signal.

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