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Semiconductor switch including a device for measuring a depletion layer temperature of the switch

  • US 5,162,669 A
  • Filed: 09/25/1990
  • Issued: 11/10/1992
  • Est. Priority Date: 09/25/1989
  • Status: Expired due to Fees
First Claim
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1. A semiconductor switch including a device for measuring a depletion-layer temperature of a semiconductor switch (V) which conducts load current through load current conductors including at least first and second load current conductors, the device comprising:

  • a network (N) having an output and at least one RC member which electrically simulates thermal characteristics of the semiconductor switch (V), a converter (W) provided between the first load current conductor of the semiconductor switch (V) and the network (N) for producing a current (iV) which is proportional to a power dissipation in the semiconductor switch (V) and a comparator (A) having a first input which is connected to the output of the network (N), a second input to which a signal which is proportional to a permissible depletion-layer temperature is supplied and having an output, the semiconductor switch (V) having an electrode (G) which controls the load current in the semiconductor switch (V), the converter element (W) being constructed as an ohmic resistor (RW), a first series circuit including the converter element (W), a first switch element (S1), and a capacitor (C1) of the network (N) connected parallel to the first and second load current conductors;

    a second series circuit including an ohmic resistor (R1) of the network (N), a second switch element (S2) and a first voltage source (Uoff) connected parallel to the capacitor (C1);

    the electrode (G) which controls the load current being connected via a third switch element (S0) to a second voltage source (Uon);

    the comparator output being coupled to act on said first switch element (S1), said second switch element (S2), and said third switch element (S0).

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