Cantilevered air-gap type thin film piezoelectric resonator

• US 5,162,691 A
• Filed: 01/22/1991
• Issued: 11/10/1992
• Est. Priority Date: 01/22/1991
• Status: Expired due to Fees

• Current Assignee: The United States of America As Represented By The Secretary of Agriculture
• Original Assignee: The United States Of America As Represented By The Secretary Of The Army
• Inventors: McGowan, Raymond, Mariani, Elio A.
• Primary Examiner(s): BUDD, MARK OSBORNE
• Application Number:
  US07/643,634
• Time in Patent Office: 658 Days
• Field of Search: 310/311, 310/324, 310/330-332, 310/321, 310/323
• US Class Current: 310/321
• CPC Class Codes: H03H 9/172 Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
• CPC Class Codes: H10N 30/074 by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing

Abstract

A method and apparatus directed to a thin film piezoelectric resonator deposited on a support layer of dielectric material and being configured in the form of a cantilever structure having a base portion formed on an integrated circuit substrate and having an overhanging beam portion joined at one end to the base portion, with the opposite end being unsupported with an air-gap intermediate the beam portion and the substrate. In the fabrication of the resonator, a thin film of dielectric material, e.g. zinc oxide (ZnO) is first deposited on the substrate, but is subsequently removed from beneath the beam portion resulting in the air-gap which is open on three sides and thus results in a greater ease of fabrication. A completely monolithic chemical detector is implemented utilizing a matched pair of these cantilevered air-gap thin film resonators, with one of the resonators further including a coating on one of its electrodes and which is responsive to a predetermined chemical to cause a frequency shift in the presence of the chemical to be detected. In one embodiment of the chemical detector, the frequency outputs of the two resonators are compared with the difference frequency providing an indication of the chemical being detected.

Claims

1. An air gap type piezoelectric resonator, comprising:

a substrate;

a support layer of dielectric material in the form of a cantilever structure including a base portion formed on said substrate and an overhanging beam portion joined at one end to said base portion with the opposite end of said beam portion being unsupported;

an air gap between said beam portion and said substrate;

a first electrode formed on a top surface of said support layer, and covering at least a portion of said beam portion;

a thin film of piezoelectric resonator material on said first electrode at said beam portion; and

a second electrode on a top surface of said thin film of piezoelectric material,

whereby upon being excited, a compressional wave will be generated across said electrodes having a fundamental frequency which is a function of the thickness of said thin film of piezoelectric material.

2. The resonator as defined by claim 1 wherein said support layer includes an inclined outer surface on said base portion.

3. The resonator as defined by claim 2 wherein said first electrode comprises a metallic electrode on the inclined outer surface of said base portion.

4. The resonator as defined by claim 1 wherein said substrate comprises a semiconductor substrate selected from the semiconductor materials including silicon (Si) and gallium arsenide (GaAs).

5. The resonator as defined by claim 4 wherein said thin film of dielectric material is comprised of non-piezoelectric zinc oxide (ZnO).

6. The resonator as defined by claim 5 wherein said thin film of piezoelectric material is comprised of polycrystalline piezoelectric material for supporting a compressional wave.

7. The resonator of claim 6 wherein said polycrystalline piezoelectric material is selected from the materials including zinc oxide (ZnO) and aluminum nitride (AlN).