Wire bonding inspecting apparatus with moving imaging area
First Claim
1. A wire bonding inspecting apparatus for inspecting wires bonded between a semiconductor chip and leads, comprising:
- imaging means for optically taking an image of the wire and converting the optical image into electric image signals;
moving means for moving said imaging means;
inspecting means for obtaining positional coordinates of the wire on the basis of the converted image signals and inspecting the wire on the basis of the obtained positional coordinates; and
control means for controlling the operations of said imaging means, said moving means and said inspecting means, andwherein when a whole wire does not lie within a single image area obtained by said imaging means, said control means controls said moving means so as to be moved;
said imaging means so as to take a plurality of optical images of the wire whenever moved and convert the optical images into image signals, respectively; and
said inspecting means so as to obtain the positional coordinates on the basis of the image signals obtained whenever the optical images are taken, and transform the obtained positional coordinates into those of a single uniform coordinate system for wire inspection.
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Accused Products
Abstract
A wire bonding inspecting apparatus for inspecting wires bonded between a semiconductor chip and leads comprises an imaging device for optically taking an image of the wire and converting the optical image into electric image signals; a moving device for moving the imaging device; an image processing inspecting unit for obtaining wire positional coordinates on the basis of image signals and inspecting the wire on the basis of the positional coordinates; and a main controller. When a whole wire does not lie within an image area of the imaging device, the moving device moves the imaging device; the imaging device takes plural optical wire images whenever moved and converts the optical images into image signals, respectively; and the image processing inspecting unit obtains the relative wire positional coordinates on the basis of the image signals whenever the optical images are taken and transforms the relative wire positional coordinates into the absolute wire positional coordinates for wire inspection, thus enabling a long wire to be inspected without adjusting the lens magnification, that is, under a constant high resolution.
21 Citations
4 Claims
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1. A wire bonding inspecting apparatus for inspecting wires bonded between a semiconductor chip and leads, comprising:
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imaging means for optically taking an image of the wire and converting the optical image into electric image signals; moving means for moving said imaging means; inspecting means for obtaining positional coordinates of the wire on the basis of the converted image signals and inspecting the wire on the basis of the obtained positional coordinates; and control means for controlling the operations of said imaging means, said moving means and said inspecting means, and wherein when a whole wire does not lie within a single image area obtained by said imaging means, said control means controls said moving means so as to be moved;
said imaging means so as to take a plurality of optical images of the wire whenever moved and convert the optical images into image signals, respectively; and
said inspecting means so as to obtain the positional coordinates on the basis of the image signals obtained whenever the optical images are taken, and transform the obtained positional coordinates into those of a single uniform coordinate system for wire inspection. - View Dependent Claims (2, 3, 4)
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Specification