×

Wire bonding inspecting apparatus with moving imaging area

  • US 5,170,062 A
  • Filed: 10/11/1991
  • Issued: 12/08/1992
  • Est. Priority Date: 10/12/1990
  • Status: Expired due to Term
First Claim
Patent Images

1. A wire bonding inspecting apparatus for inspecting wires bonded between a semiconductor chip and leads, comprising:

  • imaging means for optically taking an image of the wire and converting the optical image into electric image signals;

    moving means for moving said imaging means;

    inspecting means for obtaining positional coordinates of the wire on the basis of the converted image signals and inspecting the wire on the basis of the obtained positional coordinates; and

    control means for controlling the operations of said imaging means, said moving means and said inspecting means, andwherein when a whole wire does not lie within a single image area obtained by said imaging means, said control means controls said moving means so as to be moved;

    said imaging means so as to take a plurality of optical images of the wire whenever moved and convert the optical images into image signals, respectively; and

    said inspecting means so as to obtain the positional coordinates on the basis of the image signals obtained whenever the optical images are taken, and transform the obtained positional coordinates into those of a single uniform coordinate system for wire inspection.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×