Bootstrapped FET sampling switch

• US 5,172,019 A
• Filed: 01/17/1992
• Issued: 12/15/1992
• Est. Priority Date: 01/17/1992
• Status: Expired due to Term

• Current Assignee: Burr-Brown Corporation (Texas Instruments, Inc.)
• Original Assignee: Burr-Brown Corporation (Texas Instruments, Inc.)
• Inventors: Naylor, Jimmy R., Shill, Mark A.
• Primary Examiner(s): Howell, Janice A.
• Assistant Examiner(s): Cunningham, Terry D.
• Application Number:
  US07/822,586
• Time in Patent Office: 333 Days
• Field of Search: 307/352, 307/353, 307/362, 307/494, 307/572, 307/578, 328/151, 341/163, 341/172
• US Class Current: 327/390
• CPC Class Codes: G11C 27/024 using a capacitive memory element G11C27/04 takes precedence
• CPC Class Codes: H03F 3/3001 with field-effect transistors
• CPC Class Codes: H03K 17/063 in field-effect transistor switches
• CPC Class Codes: H03K 17/145 in field-effect transistor switches

Abstract

In an analog-to-digital converter, a circuit for sampling an analog input signal that has a signal range above and below a ground reference voltage includes a divider circuit scaling the analog input signal down to a lower magnitude such that all values of the scaled analog input signal are above the ground reference voltage. The scaled down analog input signal is applied to a source electrode of a sampling MOSFET. A body-to-source voltage of the sampling MOSFET is maintained at approximately zero volts by applying the scaled down signal to a non-inverting input of a first operational amplifier and applying an output voltage produced by the first operational amplifier to its inverting input and a body electrode of the sampling MOSFET. A gate-to-source voltage of the sampling MOSFET is maintained at approximately 1.5 volts by applying the scaled down analog input signal to a non-inverting input of a second operational amplifier, an output of which is applied to a gate electrode of the sampling MOSFET and to a gate electrode of a first MOSFET. A constant current is forced through the first MOSFET, producing therein a constant gate-to-source voltage independent of variation in the analog input signal. The resulting voltage on the source of the first MOSFET is applied to an inverting input of the second operational amplifier, so the constant gate-to-source voltage of the first MOSFET is imposed between the gate and source of the sampling MOSFET.

Claims

1. A bootstrapped analog MOSFET sampling switch circuit, comprising in combination:

(a) a sampling MOSFET having a drain electrode coupled to an output conductor;

(b) a divider circuit coupling an analog input signal to a source electrode of the sampling MOSFET;

(c) a first operational amplifier having a non-inverting input coupled to the source electrode of the sampling MOSFET and an inverting input coupled to an output of the first operational amplifier and a body electrode of the sampling MOSFET;

(d) a second operational amplifier having an output coupled to a gate electrode of the sampling MOSFET and a non-inverting input coupled to the source electrode of the sampling MOSFET;

(e) a first MOSFET having a gate electrode coupled to the gate electrode of the sampling MOSFET, a drain electrode coupled to receive a positive supply voltage and a source electrode coupled to an inverting input of the second operational amplifier;

(f) a second MOSFET having a drain electrode coupled to the source electrode of the first MOSFET;

(g) a first resistor coupled between a source electrode of the second MOSFET and a ground voltage conductor;

(h) a third operational amplifier having an output coupled to a gate electrode of the second MOSFET, a non-inverting input coupled to a bias voltage source, and an inverting input coupled to the source electrode of the second MOSFET,

whereby a constant current flows through the first MOSFET, maintaining constant its gate-to-source voltage, and thereby maintaining constant the gate-to-source voltage of the sampling MOSFET despite large variations in the analog input signal.

2. The bootstrapped analog MOSFET sampling switch circuit of claim 1 wherein the sampling MOSFET and the first and second MOSFETs are N channel MOSFETs.

3. The bootstrapped analog MOSFET sampling switch circuit of claim 2 wherein the first and second operational amplifiers are CMOS operational amplifiers.

4. The bootstrapped analog MOSFET sampling switch circuit of claim 3 wherein the divider circuit includes a first resistor coupling the analog input signal to the source electrode of the sampling MOSFET, a second resistor coupling the source electrode of the sampling MOSFET to the ground voltage conductor, and a third resistor coupling the source electrode of the sampling MOSFET to a reference voltage conductor.

5. The bootstrapped-analog MOSFET sampling switch circuit of claim 4 wherein the analog input signal is a sinusoidal signal varying between ±

10 volts and wherein the positive supply voltage is provided from a single power supply having a nominal output voltage of 5 volts.

6. An analog-to-digital converter comprising in combination:

(a) a bootstrapped analog MOSFET sampling switch circuit including

(1) sampling MOSFET having a drain electrode coupled by a sampling capacitor to an output conductor;

(2) a divider circuit coupling an analog input signal to a source electrode of the sampling MOSFET;

(3) a first operational amplifier having a non-inverting input coupled to the source electrode of the sampling MOSFET and an inverting input coupled to an output of the first operational amplifier and a body electrode of the sampling MOSFET;

(4) a second operational amplifier having an output coupled to a gate electrode of the sampling MOSFET and a non-inverting input coupled to the source electrode of the sampling MOSFET;

(5) a first MOSFET having a gate electrode coupled to the gate electrode of the sampling MOSFET, a drain electrode coupled to receive a positive supply voltage and a source electrode coupled to an inverting input of the second operational amplifier;

(6) a second MOSFET having a drain electrode coupled to the source electrode of the first MOSFET;

(7) a first resistor coupled between a source electrode of the second MOSFET and a ground voltage conductor;

(8) a third operational amplifier having an output coupled to a gate electrode of the second MOSFET, a non-inverting input coupled to a bias voltage source, and an inverting input coupled to the source electrode of the second MOSFET, whereby a constant current flows through the first MOSFET, maintaining constant its gate-to-source voltage, and thereby maintaining constant the gate-to-source voltage of the sampling MOSFET despite large variations in the analog input signal;

(b) a sampling capacitor having one terminal coupled to the drain electrode of the sampling MOSFET;

(c) a switched capacitor array coupled to another terminal of the sampling capacitor;

(d) comparator means for comparing a voltage on a junction between the sampling capacitor and the switch capacitor array with a predetermined threshold voltage;

(e) a successive approximation register means responsive to the comparator for switching the switched capacitor array and storing a digital successive approximation of a value corresponding to the analog input signal.

7. The analog-to-digital converter of claim 6 wherein the sampling MOSFET and the first and second MOSFETs are N channel MOSFETs.

8. The analog-to-digital converter of claim 7 wherein the first and second operational amplifiers are CMOS operational amplifiers.

9. The analog-to-digital converter of claim 8 wherein the divider circuit includes a first resistor coupling the analog input signal to the source electrode of the sampling MOSFET, a second resistor coupling the source electrode of the sampling MOSFET to the ground voltage conductor, and a third resistor coupling the source electrode of the sampling MOSFET to a reference voltage conductor.

10. The analog-to-digital converter of claim 9 wherein the analog input signal is a sinusoidal signal varying between ±

10 volts and wherein the positive supply voltage is provided from a single power supply having a nominal output voltage of 5 volts.

11. A method of sampling an analog input signal that has a signal range above and below a ground reference voltage, the method comprising the steps of:

(a) scaling the analog input signal down to a lower magnitude such that all values of the scaled analog input signal are above the ground reference voltage;

(b) applying the scaled down analog input signal to a source electrode of a sampling MOSFET;

(c) maintaining a body-to-source voltage of the sampling MOSFET at approximately zero volts by applying the scaled down analog input signal to a non-inverting input of a first operational amplifier and applying an output voltage produced by the first operational amplifier to its inverting input and a body electrode of the sampling MOSFET;

(d) maintaining a gate-to-source voltage of the sampling MOSFET at a constant value independent of analog input signal variation by

i. applying the scaled down analog input signal to a non-inverting input of a second operational amplifier,

ii. applying an output of the second operational amplifier to a gate electrode of the sampling MOSFET and to a gate electrode of a first MOSFET, and

iii. causing a constant current to flow through the first MOSFET and applying a resulting voltage on the source electrode of the first MOSFET to an inverting input of the second operational amplifier.

12. The method of claim 11 including producing the constant current by maintaining a constant voltage on the source electrode of a second MOSFET by means of a third operational amplifier having a predetermined reference voltage applied to its non-inverting input, applying an output signal of the third operational amplifier to the gate electrode of the second MOSFET, and applying a voltage on the source electrode of the second MOSFET to an inverting input of the third operational amplifier, and also applying the voltage on the source electrode of the second MOSFET to one terminal of a resistor having another terminal connected to the ground reference voltage, and coupling a drain electrode of the second MOSFET to the source electrode of the first MOSFET, thereby causing the constant current to flow through the resistor, the second MOSFET, and the first MOSFET.

13. A circuit for sampling an analog input signal that has a signal range above and below a ground reference voltage, the circuit comprising in combination:

(a) means for scaling the analog input signal down to a lower magnitude such that all values of the scaled analog input signal are above the ground reference voltage;

(b) means for applying the scaled down analog input signal to a source electrode of a sampling MOSFET;

(c) means for maintaining a body-to-source voltage of the sampling MOSFET at approximately zero volts by applying the scaled down signal to a non-inverting input of a first operational amplifier;

(d) means for applying an output voltage produced by the first operational amplifier to its inverting input and a body electrode of the sampling MOSFET;

(e) means for maintaining a gate-to-source voltage of the sampling MOSFET at a constant value independent of analog input signal variation, including

i. first means for applying the scaled down analog input signal to a non-inverting input of a second operational amplifier,

ii. second means for applying an output of the second operational amplifier to a gate electrode of the sampling MOSFET and to a gate electrode of a first MOSFET having a drain coupled to a positive supply voltage, and

iii. third means coupled to the source of the first MOSFET for causing a constant current to flow through the first MOSFET and applying a resulting voltage on the source of the first MOSFET to an inverting input of the second operational amplifier.

14. The circuit of claim 13 wherein the third means includes

means for producing the constant current by maintaining a constant voltage on the source electrode of a second MOSFET with a third operational amplifier having a predetermined reference voltage applied to its non-inverting input,

means for applying an output signal of the third operational amplifier to the gate electrode of the second MOSFET,

means for applying a voltage on the source electrode of the second MOSFET to an inverting input of the third operational amplifier,

means for applying the voltage on the source electrode of the second MOSFET to one terminal of a resistor having another terminal connected to the ground reference voltage, and

means for coupling a drain electrode of the second MOSFET to the source electrode of the first MOSFET, thereby causing the constant current to flow through the resistor, the second MOSFET, and the first MOSFET.

15. An integrated circuit bootstrapped analog MOSFET sampling switch circuit, comprising in combination:

(a) a sampling MOSFET having a drain electrode coupled to an output conductor, a source electrode coupled to receive an analog input voltage, a gate electrode, and a body electrode;

(b) first means coupled between the body and source electrodes for maintaining a constant voltage relationship between the body electrode and the source electrode;

(c) second means comprising a first MOSFET coupled between the gate electrode and the source electrode for maintaining a constant gate-to-source voltage across the sampling MOSFET in response to a constant current flowing through the first MOSFET of the second means; and

(d) means coupled to the second means for forcing the constant current through the first MOSFET of the second means substantially independently of the analog input voltage.

16. The integrated circuit bootstrapped analog MOSFET sampling switch circuit of claim 15 wherein the first MOSFET is coupled to the gate electrode of the sampling MOSFET and also coupled to the constant current forcing means to produce the constant gate-to-source voltage across the sampling MOSFET during a sampling period.

17. A method of sampling an analog input signal that has a signal range above and below a ground reference voltage, the method comprising the steps of:

(a) applying the analog input signal to a source electrode of a sampling MOSFET;

(c) maintaining a body-to-source voltage of the sampling MOSFET at approximately zero volts by applying the scaled down analog input signal to a non-inverting input of a first operational amplifier and applying an output voltage produced by the first operational amplifier to its inverting input and a body electrode of the sampling MOSFET;

(d) maintaining a gate-to-source voltage of the sampling MOSFET at a constant value independent of analog input signal variation by

i. applying the analog input signal to a non-inverting input of a second operational amplifier,

ii. applying an output of the second operational amplifier to a gate electrode of the sampling MOSFET and to a gate electrode of a first MOSFET, and

iii. causing a constant current to flow through the first MOSFET and applying a resulting voltage on the source electrode of the first MOSFET to an inverting input of the second operational amplifier.