Sample supply device and sample inspection apparatus using the device

• US 5,182,617 A
• Filed: 06/29/1990
• Issued: 01/26/1993
• Est. Priority Date: 07/20/1989
• Status: Expired due to Fees

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Toge, Yoshiyuki, Yoneyama, Yoshito, Yuguchi, Naoki
• Primary Examiner(s): McGraw, Vincent P.
• Assistant Examiner(s): KEESEE, LACHARLES
• Application Number:
  US07/545,589
• Time in Patent Office: 942 Days
• Field of Search: 356/440, 356/39, 356/72, 356/73, 356/410, 356/315, 356/336, 356/246, 324/71.4, 436/534, 422/67, 137/625 H, 137/624.13, 137/624.14, 137/625.11, 137/93, 137/112, 137/625.18
• US Class Current: 356/440
• CPC Class Codes: G01N 15/1404 Handling flow, e.g. hydrodynamic focusing
• CPC Class Codes: G01N 15/1409 Handling samples, e.g. injecting samples
• CPC Class Codes: G01N 21/11 Filling or emptying of cuvettes
• CPC Class Codes: G01N 35/1097 characterised by the valves valves in general F16K
• CPC Class Codes: Y10T 137/2509 By optical or chemical property
• CPC Class Codes: Y10T 137/2567 Alternate or successive inflows

Abstract

A sample supply device includes first and second sample supply means for independently receiving respective samples via a common channel and for supplying the samples to an inspection position. The device is controlled so that the second sample supply means performs a sample receiving operation and/or a washing operation with the channel, while the first sample supply means supplies the sample to the inspection position. A sample inspection apparatus inspects the sample at the inspection position principally using an optical method.

Claims

1. A sample supply device comprising:

a sample receiving channel for receiving a plurality of samples from a source;

a sample supply channel for supplying the samples to a position to be supplied;

first and second sample storage means for storing respective samples;

first and second pressurizing means, in communication with said first and second sample storage means, respectively, for extruding and aspirating samples stored in said first and second storage means; and

channel switching means capable of switching between a first mode and a second mode, with the first mode being a state in which said first sample storage means is connected to said sample suppy channel and said second sample storage means is connected to said sample receiving channel, and the second mode being a state in which said first sample storage means is connected to said sample receiving channel and said second sample storage means is connected to said sample supply channel.

2. A sample supply device according to claim 1, further comprising control means for controlling said channel switching means so as to switch between the first mode and the second mode, and for controlling said first and second pressurizing means so as to receive a sample from said sample receiving channel, store the sample in said second sample storage means, and supply the supply unit with a sample stored in said first sample storage means via said sample supply channel in the first mode, and to receive a sample from said sample receiving channel, store a sample in said first sample storage means, and supply the supply unit with the sample stored in said second sample storage means in the second mode.

3. A sample supply device according to claim 1, further comprising auto-sampler means for serially supplying said receiving channel with a plurality of samples.

4. A sample supply device according to claim 1, wherein each said pressurizing means includes a syringe.

5. A sample supply device according to claim 1, wherein said channel switching means includes a switching valve.

6. A sample supply device according to claim 5, wherein said switching valve comprises a four-way switching valve.

7. A sample supply device according to claim 1, further comprising means for washing said sample receiving channel before or after a sample is received therein.

8. A sample supply device according to claim 7, wherein said washing means causes a washing liquid to flow in reverse through said sample receiving channel.

9. A sample supply device according to claim 1, further comprising means for washing said sample supply channel by flowing a washing liquid therethrough substantially immediately after the sample flows through said sample supply channel.

29. A sample supply device according to claim 1, wherein the samples contain fine particles.

10. A sample supply device comprising:

first and second sample supply means for independently receiving samples via a common sample receiving channel and for supplying the sample to a position to be supplied; and

control means for controlling said supply means so that said second sample supply means can either receive a sample from said sample receiving channel or wash said sample receiving channel while said first sample supply means supplies the sample to the position to be supplied.

11. A sample supply device according to claim 10, wherein said first and second sample supply means include first and second sample storage means, respectively, for storing predetermined amounts of the respective samples received from said sample receiving channel.

12. A sample supply device according to claim 10, wherein said first and second sample supply means include a common channel for supplying samples to the supply position to be supplied.

30. A sample supply device according to claim 10, wherein the samples contain fine particles.

13. A sample inspection apparatus comprising:

a sample receiving channel for receiving a plurality of samples from a source;

a sample supply channel for supplying the samples to an inspection position;

first and second sample storage means for storing respective samples;

first and second pressurizing means in communication with said first and second sample storage means, respectively, for extruding and aspirating samples stored in said first and second storage means;

channel switching means capable of switching between a first mode and a second mode, with the first mode being a state in which said first sample storage means is connected to said sample supply channel and said second sample storage means is connected to said sample receiving channel, and the second mode being a state in which said first sample storage means is connected to said sample receiving channel and said second sample storage means is connected to said sample supply channel; and

inspection means for inspecting the sample supplied to the inspection position by said sample supply channel.

14. A sample inspection apparatus according to claim 13, further comprising control means for controlling said channel switching means so as to switch between the first mode and the second mode, and for controlling said first and second pressurizing means so as to receive a sample from said sample receiving channel, store the sample in said second sample storage means, and supply the supply unit with the sample stored in said first sample storage means via said sample supply channel in the first mode, and to receive a sample from said sample receiving channel, store the sample in said first sample storage means, and supply the supply unit with the sample stored in said second sample storage means in the second mode.

15. A sample inspection apparatus according to claim 13, further comprising auto-sampler means for serially supplying said sample receiving channel with a plurality of samples.

16. A sample inspection apparatus according to claim 13, wherein each said pressurizing means includes a syringe.

17. A sample inspection apparatus according to claim 13, wherein said channel switching means includes a switching valve.

18. A sample inspection apparatus according to claim 13, wherein said switching valve comprises a four-way switching valve.

19. A sample inspection apparatus according to claim 13, further comprising means for washing said sample receiving channel before or after a sample is received therein.

20. A sample inspection apparatus according to claim 19, wherein said washing means causes a washing liquid to flow in reverse through said sample receiving channel.

21. A sample inspection apparatus according to claim 13, further comprising means for washing said sample supply channel by flowing a washing liquid therethrough substantially immediately after the sample flows within said sample supply channel.

22. A sample inspection apparatus according to claim 13, wherein said inspection means includes means for optically inspecting the sample.

23. A sample inspection apparatus according to claim 22, wherein said inspection means includes light irradiating means for irradiating light for measurement upon the sample at the inspection position, and measuring means for measuring optical reactions by the sample.

24. A sample inspection apparatus according to claim 23, wherein said light irradiating means includes a laser light source.

31. A sample inspection apparatus according to claim 13, wherein the samples contain fine particles and the particles are inspected.

25. A sample inspection apparatus comprising:

first and second sample supply means for independently receiving samples via a commom sample receiving channel and for supplying the samples to an inspection position;

control means for controlling said supply means so that said second sample supply means can either receive a sample from said sample receiving channel or clean said sample receiving channel while said first sample supply means supplies the sample to the inspection position; and

inspection means for inspecting the sample supplied at the inspection position.

26. A sample inspection apparatus according to claim 25, wherein said inspection means includes means for optically inspecting the sample.

27. A sample inspection apparatus according to claim 25, wherein said sample supply means include first and second sample storage means, respectively, for storing the samples received via said sample receiving channel.

28. A sample inspection apparatus according to claim 25, wherein the samples are supplied to the inspection position via a common supply channel.

32. A sample inspection apparatus according to claim 25, wherein the samples contain fine particles and the particles are inspected.