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Device for testing a network of components, in particular an electronic circuit

  • US 5,182,717 A
  • Filed: 07/05/1990
  • Issued: 01/26/1993
  • Est. Priority Date: 07/13/1989
  • Status: Expired due to Fees
First Claim
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1. An electronic device for testing a network of components, comprising(A) interface means comprising(Aa) means for defining sampling instants in a chosen time interval,(Ab) means for identifying at least one component of the network,(Ac) probe means for the acquisition of a physical value relating to the state of functioning of this component, and(Ad) means cooperating with the probe for providing a series of samples of this physical value within the chosen time interval;

  • (B) a functional models memory contains component expressions relating to physical values concerning at least one particular kind of component;

    (C) a values memory for storing several sample series of physical values corresponding to the same time interval but relating to different components of said network; and

    (D) processing means connected to said values memory and to said functional models memory and to said interface means for effecting a processing procedure comprising an estimation of the physical values over said time interval, taking into account the expressions contained in said models memory and the acquired samples and their storage in the values memory, as well as tests on the values contained in the values memory,wherein said functional models memory further contains law-expressions representing general relationships between physical values;

    wherein at least some of said acquired samples are stored in said functional models memory with precision brackets;

    wherein the expressions for functional models stored in said functional models memory are at least in part provided with uncertainty brackets;

    wherein any estimation is stored in said functional models memory with its estimated uncertainty bracket deriving from at least some of said uncertainty brackets and said precision brackets; and

    wherein when said functional models memory contains, for at least some of the sampling instants, a first bracket and a second bracket of different origins for the same physical value established on the basis of the contribution of a primary set of components, these two brackets are compared, and the processor means is adapted for deducing therefrom first information regarding the functioning of the components of this primary set.

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