Versatile, overpressure proof, absolute pressure sensor

• US 5,187,674 A
• Filed: 12/28/1989
• Issued: 02/16/1993
• Est. Priority Date: 12/28/1989
• Status: Expired due to Term

• Current Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Original Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Inventors: Bonne, Ulrich
• Primary Examiner(s): Teska, Kevin J.
• Application Number:
  US07/458,062
• Time in Patent Office: 1,146 Days
• Field of Search: 364/556-558, 73/25.03, 73/23.31, 73/25.04, 73/23.22, 73/204.16, 73/204.18, 73/204.25, 73/204.17, 73/204.21, 73/204.26, 374/29, 374/43, 374/44, 374/183
• US Class Current: 702/50
• CPC Class Codes: G01L 11/002 by thermal means, e.g. hypsometer

Abstract

A non membrane-based overpressure proof gas pressure microsensor. It is not a membrane-based microsensor but is based on an open microbridge sensor structure. A method and apparatus is described to determine gas pressure from thermal conductivity, k, and volumetric specific heat, c_pu, as well as pressure, P, using a microbridge sensor.

Claims

1. ) An apparatus for determining fuel gas pressure using a non membrane-based microsensor for a gas at unknown conditions comprising:

a non membrane semiconductor microbridge structure supported by a substrate having an electrically energizable heater film element thereon and resistive sensor film element(s) located proximate to the heater film element

such that said structure and substrate are so arranged and disposed so that they maintain contact. with the fuel gas of interest being immersed therein and such that when an electrical energy pulse source supplies an electrical energy pulse to said heater film element of sufficient time duration (also called pulse width) and power, the pulse causes a resulting transient temperature rise followed by a steady-state temperature (dU) in said gas of interest, to a degree detectable by said sensor element(s) such that said sensor element(s) produce an imbalance output corresponding to the voltage imbalance due to change in resistivity between said sensor element(s) and balancing resistor element(s);

W_hc measuring means for measuring heater power, W_hc, required to achieve a constant differential, dT, above ambient temperature and for producing an output representative of this value W_hc ;

S measuring circuit for measuring occurrences of changes in said imbalance output which are characteristic of the transient temperature rise signal, s, and means for determining its integral S for each occurrence and for producing an output representative of this value S;

dU measuring circuit for measuring the amplitude of the steady-state temperature signal, dU, from said imbalance output and for producing an output representative of this value dU;

T_g measuring sensor means for measuring gas temperature at the location of the structure substrate (T_g) and producing a signal representative thereof;

a computing device connected to received said signals dU, W_hd, T_g S, and employing signal processing circuitry, data, and processing components, said computing device configured to have k computing means, c_p computing means and p computing means, having;

k computing means for representing a function to compute thermal conductivity, k, of said gas of interest as a function of the measured signals representing dU, W_hc and T_g (gas temp.);

c_p computing means for representing a function to compute specific heat, c_p, as a function of the measured signals representing dU, W_hc, S, and T_g ; and

p computing means for representing a function to compute pressure, P, of said gas of interest, according to a relation;

space="preserve" listing-type="equation">P=V.sub.mo (T/T.sub.o) (P.sub.o) C.sub.pv /c.sub.p

where

c_p =specific heat, molar or weight -based and having been determined by said c_p computing means,

c_pv =volumetric specific heat, measured

V_mo =molar volume of ideal gases=22415 cm³ /mol @ 0°

C. and 1 atm

T=sensed gas temperature in degrees K

T_o =gas temperature at the reference condition of 0°

F. or 273.15°

K.

P_o =gas pressure at the reference condition of 1 atm, and

an output device connected to said computing device which outputs said electrical signals representative of at least one of said k, cp, and P values.

2. The apparatus according to claim 1 in which in the microbridge structure there are first and second resistive sensor films located on opposite sides of and proximate to the heater film.

3. The apparatus according to claim 1 in which the integral S is computed by said determining means for the temperature rise (i.e., heating) part of the heat pulse.

4. The apparatus according to claim 1 in which the electrical energy pulse to the heater film approximates a square wave electrical energy pulse.

5. The apparatus according to claim 4 in which the pulse width of the electrical energy pulse is on the order of 100 milliseconds.

6. The apparatus according to claim 5 in which the electrical energy pulse applied to the heater film has a height on the order of 4 volts.

10. The apparatus according to claim 1 in which the integral S is computed by said determining means for the cooling part of the heat pulse.

7. A method to determine fuel gas pressure using a non membrane-based microsensor for gases including the steps;

providing a non membrane semiconductor microbridge structure supported by a substrate, the structure having an electrically energizable heater film element thereon and resistive sensor film elements located proximate to the heater film;

locating the structure in immersed contact with the fuel gas to be sensed for determining gas pressure;

providing an electrical energy pulse source means for supplying an electrical energy pulse to said heater film element of sufficient time duration and power to cause a resulting transient temperature rise in said gas followed by a steady-state temperature in said gas, both said rise and said steady-state temperature level being measurable by said sensor(s) so as to produce an imbalance output corresponding to the voltage imbalance due to change in resistivity between said sensor element(s) and balancing resistor element(s);

measuring heater power, W_hc, required to achieve a constant differential, dT, above room temperature;

receiving said sensor(s) signal output and from it;

measuring temperature rise time, dT, between two temperature markers related to values said imbalance signal may achieve;

measuring the sensor steady-state temperature signal, dU based on said imbalance output;

measuring gas temperature at the structure substrate, t_g ; and

then

computing thermal conductivity, k, as a function of dU, W_hc and T_g (gas temp.);

computing specific heat, c_p, as a function of dU, W_hc, S (or dT) and T_g ; and

determining pressure, P, according to a relation;

space="preserve" listing-type="equation">P=V.sub.mo (T/T.sub.o) (P.sub.o) C.sub.pv /c.sub.p

where

c_p =specific heat, -based and having been determined by said c_p computing means,

c_pv =volumetric specific heat,

V_mo =molar volume of ideal gases=22415 cm³ /mol @ 0°

C. and 1 atm

T=sensed gas temperature in degrees K.

T_o =gas temperature at the reference condition of 0°

F. or 273.15°

K.

P_o =gas pressure at the reference condition of 1 atm,

and then outputting a signal whose value is representative of at least one of c_p, k, P.

8. The method according to claim 7 and further comprising the step of:

measuring one, the other, or both, ambient or electronics temperature, called, collectively, T_e ; and

in which the step of computing thermal conductivity is expanded to read "computing thermal conductivity k, as a function of dU, W_hc and T_g (gas temp.) while compensating for T_e ;

" and in which the step of computing specific heat, c_p, is expanded to read "computing specific heat, c_p, as a function of dU, W_hc, S (or dT) and T_g while compensating for T_e ;

".

9. The method according to claim 7 in which in the step of providing a microbridge structure there are first and second resistive sensor films located on opposite sides of and proximate to the heater film.

11. The method according to claim 7 in which the electrical energy pulse to the heater film approximates in form a square wave electrical energy pulse.

12. The method according to claim 11 in which the electrical energy pulse width is on the order of 100 milliseconds.

13. The method according to claim 12 in which the electrical energy pulse applied to the heater film has a height on the order of 4 volts.