Method and apparatus for co-ordinate measuring using a capacitance probe

• US 5,189,377 A
• Filed: 09/04/1990
• Issued: 02/23/1993
• Est. Priority Date: 09/04/1990
• Status: Expired due to Term

• Current Assignee: The ExOne Company (Desktop Metal, Inc.)
• Original Assignee: Extrude Hone Corporation
• Inventors: Rose, John R., Rhoades, Lawrence J., Resnick, Ralph L.
• Primary Examiner(s): Harvey, Jack B.
• Assistant Examiner(s): Regan, Maura K.
• Application Number:
  US07/577,021
• Time in Patent Office: 903 Days
• Field of Search: 324/662, 324/663, 324/684, 324/687, 324/457, 324/458, 324/671
• US Class Current: 324/662
• CPC Class Codes: G01B 7/004 for measuring coordinates of points
• CPC Class Codes: G01B 7/28 for measuring contours or curvatures

Abstract

The surface parameters and characteristics of a conductive workpiece are determined by applying a voltage between the workpiece and a capacitance probe having proximity sensing capabilities, and moving the probe in two or three co-ordinate axes relative to the workpiece while measuring the capacitance between the probe and workpiece, and controlling the probe velocity and/or direction within a stand-off band adjacent to the workpiece as a function of the capacitance value measured for purposes of effecting significant real time process controls, and determining the workpiece surface parameters as a function of the probe movement and capacitance measured.

Claims

1. A method for measuring surface characteristics which comprise dimensions and contour of a conductive workpiece utilizing a non-contacting, conductive probe sensor, the steps comprising;

a) applying a voltage across said workpiece and said sensor,

b) causing a relative motion between said sensor and said workpiece so that said sensor defines a path of travel with reference to said workpiece by which said sensor is moved generally parallel to a first workpiece surface at a velocity dependent upon the measured capacitance so that said velocity is increased when the capacitance indicates that the sensor is in no danger of impacting with or moving past the workpiece, and said velocity is reduced in proportion to capacitance changes indicating that the sensor is approaching a second workpiece surface intersecting with said first workpiece surface,

c) measuring and recording said path of travel,

d) measuring and recording the capacitance between said sensor and said workpiece relative to said path of travel,

e) determining the surface parameters of the workpiece as a function of the said recorded path of travel and the corresponding recorded capacitance.

2. A method according to claim 1 in which a parameter of the sensor relative motion selected from one of the group consisting of velocity, and direction within a stand-off band adjacent to said workpiece surface and both, is a function of the measured capacitance.

3. A method according to claim 1 in which said sensor is moved at a velocity dependent upon the measured capacitance so that said velocity is increased when the capacitance indicates that the sensor is in no danger of impacting with or moving past the workpiece, and said velocity is reduced in proportion to capacitance changes indicating that the sensor is approaching changes in the characteristics of the adjacent workpiece surface where said sensor is approaching a condition for impacting with or moving past the workpiece.

4. A method according to claim 1 in which the sensor relative motion is halted before the sensor can contact said second workpiece surface.

5. A method according to claim 1 in which the sensor direction of motion is changed before the sensor can contact or move beyond said second workpiece surface, and thereafter move generally parallel to said second workpiece surface.

6. A method according to claim 1 in which said sensor is moved in a continuous, uninterrupted motion generally parallel to said workpiece surface while said measured capacitance controls the direction of motion to keep the sensor motion within a given stand-off band spaced from the workpiece surface until the desired measurement is completed.

7. A method according to claim 6 in which said stand-off band represents a band of acceptable sensitivity so that the distance between the sensor and workpiece surface can be determined by the capacitance within an acceptable degree of accuracy.

8. A method according to claim 1 further including the steps of continually measuring the capacitance effected by environmental conditions and correcting the measured and record capacitance between the sensor and workpiece by deleting the environmental capacitance effect.

9. A method according to claim 1 further including the steps of shielding said processor-controller from environmental interference of temperature, dust, electromagnetic interference and radio frequency interference.

10. A method according to claim 9 in which said shielding comprises wrapping said processor-controller in a grounded conductive metal and housing the wrapped processor-controller in a non-metallic thermal housing.

11. Apparatus for measuring surface characteristics which comprise dimensions and contour of a conductive workpiece comprising;

a) a capacitance probe having a conductive sensor,

b) means for applying a voltage across said conductive sensor and said workpiece,

c) drive means for causing a relative motion between said sensor and said workpiece so that said sensor will define a path of travel by which said sensor is moved generally parallel to a first workpiece surface at a velocity dependent upon the measured capacitance so that said velocity is increased when the capacitance indicates that the sensor is in no danger of impacting with or moving past the workpiece, and said velocity is reduced in proportion to capacitance changes indicating that the sensor is approaching a second workpiece surface intersecting with said first workpiece surface,

d) means for measuring and recording said path of travel,

e) means for measuring and recording the capacitance between said sensor and workpiece with respect to said path of travel,

f) means for calculating the parameters of the workpiece surface as a function of the recorded path of travel and the recorded capacitance corresponding thereto.

12. Apparatus according to claim 11 further including means for controlling said drive means for moving said sensor in response to the measured capacitance so that a parameter of the sensor motion selected from one of the group consisting of velocity, direction within a stand-off band adjacent to said workpiece, and both, is a function of the measured capacitance.

13. Apparatus according to claim 11 in which said means for moving said sensor and said means for means for continuously measuring and recording the position of said sensor comprise a co-ordinate measuring machine.

14. Apparatus according to claim 11 further including a means for continually measuring the capacitance effected by environmental conditions and correcting the measured and record capacitance between the sensor and workpiece by deleting the environmental capacitance effect.

15. Apparatus according to claim 14 wherein said means for continually measuring the capacitance effected by environmental conditions comprises an environmental probe substantially similar to said capacitance probe.

16. Apparatus according to claim 14 wherein said environmental probe is positioned in the vicinity of said capacitance probe but adequately spaced from said workpiece to avoid significant capacitance measurements with regard to said workpiece.

17. Apparatus according to claim 14 wherein said means for continually measuring the capacitance effected by environmental conditions and correcting the measured and recorded capacitance between the sensor and workpiece by deleting the environmental capacitance effect comprises said processor-controller.

18. Apparatus according to claim 11 further including a means for shielding said processor-controller from environmental interference of temperature, dust, electromagnetic interference and radio frequency interference.

19. Apparatus according to claim 18 wherein said means for shielding said processor-controller from environmental interference of temperature, dust, electromagnetic interference and radio frequency interference comprises wrapping said process-controller in grounded conductive foil disposed within a thermal insulating container.