Phase shift vernier for automatic test systems

• US 5,191,295 A
• Filed: 03/11/1992
• Issued: 03/02/1993
• Est. Priority Date: 03/11/1992
• Status: Expired due to Term

• Current Assignee: Xcerra Corporation (COHU Incorporated)
• Original Assignee: LTX Corp. (COHU Incorporated)
• Inventors: Necoechea, R. Warren
• Primary Examiner(s): Heyman, John S.
• Assistant Examiner(s): OUELLETTE, SCOTT
• Application Number:
  US07/849,521
• Time in Patent Office: 356 Days
• Field of Search: 328/155, 328/223, 328/104, 377/19, 307/262
• US Class Current: 327/244
• CPC Class Codes: G01R 31/2846 using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
• CPC Class Codes: G01R 31/3191 Calibration
• CPC Class Codes: H03K 3/0231 Astable circuits H03K3/0315 takes precedence
• CPC Class Codes: H03L 7/0996 Selecting a signal among the plurality of phase-shifted signals produced by the ring oscillator

Abstract

A phase shift vernier for providing an output signal with continuously variable delay based on an input phase delay is disclosed. The apparatus comprises delay value means, a ring oscillator, a multiplexer, a DAC, and a signal combiner. The delay value means is adapted for receiving an input phase delay value, indicating the amount of delay for an output signal. The ring oscillator is adapted for circulating an oscillating signal through multiple differential stages to generate multiple quadrature signals. The oscillating signal has a predetermined frequency and each of the differential stages is connected in series. Each of the stages delays its inputs by a predetermined amount to generate its differential outputs from each stage. The multiplexor is coupled to the ring oscillator and to the delay value means to receive the quadrature signals from the ring oscillator. The multiplexor selects first and second quadrature signals from the ring oscillator in response to the input phase delay from the delay value means. The first and second quadrature signals are offset by 90 degrees. The DAC is coupled to the multiplexor and to the delay value means to generate a first and second currents based on the input phase delay from the delay value means. The signal combined is coupled to the DAC and to the multiplexor for generating the output signal phase-shifted by the input phase delay. The signal combiner multiplies the first and second quadrature signals with the first and second currents to generate third and fourth quadrature signals, respectively. The signal combiner further combines the third and fourth quadrature signals to generate the output signal.

Claims

1. A phase shift vernier for an automatic test system for testing integrated circuit devices, said phase shift vernier providing an output signal from an integrated circuit device with continuously variable delay based on an input phase delay value, comprising:

delay value means for receiving said input phase delay value, said input phase delay value indicating an amount of delay for said output signal from said integrated circuit device;

ring oscillator means for circulating an oscillating signal through a plurality of differential stages to generate a plurality of pairs of quadrature signals with a plurality of phase delays, said oscillating signal having a predetermined frequency, each of said differential stages being connected in series, each of said stages phase-shifting its inputs by a predetermined phase delay to generate its differential outputs from each stage;

multiplexor means coupled to said ring oscillator means and to said delay value means for receiving said plurality of pairs of quadrature signals from said ring oscillator means, said multiplexor means selecting first and second signals from said plurality of pairs of quadrature signals from said ring oscillator means in response to said input phase delay value from said delay value means;

DAC means coupled to said multiplexor means and to said delay value means for generating first and second currents, said DAC means generating a current amplitude ("M") based on a predetermined number of least significant bits of said input phase delay value from said delay value means, said first and second currents having an amplitude ratio of (1-0.2*M)/M;

combiner means coupled to said DAC means and to said multiplexor means for generating said output signal whose phase is said first quadrature signal shifted by said input phase delay value, said combiner means multiplying said first and second quadrature signals with said first and second currents to generate third and fourth quadrature signals, respectively, said third and fourth quadrature signals having amplitudes equal to the amplitudes of said first and second currents, respectively, said combiner means further adding said third and fourth quadrature signals to generate said output signal shifted by said input phase delay value.

2. A phase shift vernier according to claim 1, further comprising:

down counter means coupled to said delay value means for counting down to a terminal count from a start value, said start value being a most significant portion of said input phase delay value;

first D-type flip-flop coupled to receive as an input said terminal count and as clocks inverting and noninverting signals of said output signal from said combiner means, said first D-type flip-flop generating an output by clocking said terminal count; and

second D-type flip-flop coupled to receive the output from said first D-type flip-flop as input and to clock said input by the non-inverting and inverting signals of said output signal from said combiner means.

3. A phase shift vernier according to claim 2, further comprising PLL means coupled to said ring oscillator means for controlling said predetermined frequency of said ring oscillator means.

4. A phase shift vernier according to claim 3, wherein said PLL means comprises:

frequency divider means coupled to said ring oscillator means for dividing said predetermined frequency to a first frequency;

phase detector means coupled to said frequency divider means for receiving said first frequency and a reference frequency and detecting a phase difference thereof;

filter means coupled to said ring oscillator means and to said phase detector means for adjusting current to said ring oscillator means to control the speed of said ring oscillator means.

5. A phase shift vernier according to claim 1, wherein each of said differential stages in said ring oscillator means for generating differential quadrature signals comprises:

first pair of transistors for generating fast differential outputs, said first pair of transistors receiving differential inputs at the bases thereof, said first pair of transistors having emitters connected together;

first driver coupled to the emitters of said first pair of transistors at a collector thereof, said first driver supplying emitter current to said first pair of transistors in response to a first signal;

second pair of transistors for generating slow differential outputs, said second pair of transistors also receiving said differential inputs at the bases thereof, said second pair having emitters connected together, said second pair having capacitive loading transistors coupled to their bases and resistors between said differential inputs and their bases, collectors of said first and second pairs are connected such that the same swing is maintained between said fast and slow differential outputs.

6. A phase shift vernier according to claim 5, wherein said capacitive loading transistors are transistors having bases and emitters connected together.

7. A phase shift vernier according to claim 1, wherein said ring oscillator means circulates said oscillating signal through 4 differential stages to generate 8 quadrature signals.

8. A phase shift vernier according to claim 1, wherein said combiner means comprises:

a plurality of analog multipliers, each of said analog multipliers coupled to receive first and second quadrature outputs from each stage of said ring oscillator means;

selector means coupled to each of said plurality of analog multipliers for selecting first and second signals from among said quadrature outputs from said ring oscillator means;

current means coupled to each of said plurality of analog multipliers for providing first and second currents to be multiplied by said first and second signals;

output means coupled to said analog multipliers for generating an output signal shifted by said input phase delay value, said output signal being combined from said first and second signals multiplied by said first and second currents, respectively.

9. A phase shift vernier according to claim 8, wherein each of said analog multipliers comprises:

first pair of transistors having emitters connected together to receive said first quadrature output from each differential stage of said ring oscillator means;

second pair of transistors having emitters connected together to receive said second quadrature output, said first and second pairs being crosscoupled;

first driver pair coupled to said first pair of transistors for providing fixed and variable currents to said first pair of transistors when driven at their bases;

second driver pair coupled to said second pair of transistors for providing said fixed and variable currents to said second pair of transistors when driven at bases thereof.

10. A phase shift vernier according to claim 1, wherein said oscillating signal has a predetermined frequency at 800 MHz and is circulated by said ring oscillator means through four differential stages.

11. A phase shift vernier according to claim 10, wherein each of said four differential stages generates inverting and non-inverting outputs.