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Piezoelectric sensor

  • US 5,191,791 A
  • Filed: 05/04/1990
  • Issued: 03/09/1993
  • Est. Priority Date: 01/10/1989
  • Status: Expired due to Fees
First Claim
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1. An apparatus for measuring localized ice thickness comprising:

  • an ice presence sensor having a first metallization layer facing towards an environment, a second metallization layer, and a dielectric layer between said first and second metallization layers, said second metallization layer being greater in surface area than said first metallization layer, wherein existence of ice in an area surrounding said first metallization layer causes a capacitance value associated with said ice presence sensor to change; and

    an ice thickness sensor having a dielectric layer, and having first and second metallization layers located on one side of said dielectric layer and facing towards the environment, wherein existence of ice in an area between said first and second layers of said ice thickness sensor causes a capacitance value associated with said ice thickness sensor to change.

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