Method and apparatus for high resolution inspection of electronic items
First Claim
1. A high resolution laminography system comprising:
- a source of X-rays wherein said source of X-rays further comprises;
a source of electrons which generates an electron beam;
a deflector for steering said electron beam;
a target wherein X-rays are emitted from said target when said electron beam impinges upon said target, said target further comprising an imagable feature;
an SEM detector for producing an SEM micrograph of said target imagable feature in response to illumination of said feature by said electron beam;
an image analysis system for analyzing characteristics of said SEM micrograph image of said target imagable feature, and providing an output signal in response to said analysis; and
a feedback system which receives said output signal from said image analysis system, processes said output signal and provides a control signal to said electron beam deflector; and
a laminographic detector for producing a cross sectional image of a cutting plane of an object illuminated by said X-rays emitted by said target.
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Abstract
A high resolution laminography system for the inspection of integrated circuits wherein a beam of highly focused electrons is traced in a circular pattern on a flat target within a vacuum chamber. The target converts the electron beam into X-rays, so that a source of X-rays is produced which rotates in synchronization with a rotating detector assembly. An object is placed within the vacuum chamber, between the X-ray source and the detector so that an X-ray cross sectional image of a cutting plane of the object is produced. A computer and feedback system controls image acquisition and an automated positioning system. The computer system can also operate under program control to automatically analyze data, measure characteristics of the object under inspection, and make decisions regarding the acceptability of the object'"'"'s quality. The invention also employs a channeltron imager to directly image the target so that the condition of the target may be monitored, and electron drift within the system can be compensated for.
92 Citations
14 Claims
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1. A high resolution laminography system comprising:
a source of X-rays wherein said source of X-rays further comprises; a source of electrons which generates an electron beam; a deflector for steering said electron beam; a target wherein X-rays are emitted from said target when said electron beam impinges upon said target, said target further comprising an imagable feature; an SEM detector for producing an SEM micrograph of said target imagable feature in response to illumination of said feature by said electron beam; an image analysis system for analyzing characteristics of said SEM micrograph image of said target imagable feature, and providing an output signal in response to said analysis; and a feedback system which receives said output signal from said image analysis system, processes said output signal and provides a control signal to said electron beam deflector; and a laminographic detector for producing a cross sectional image of a cutting plane of an object illuminated by said X-rays emitted by said target. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of producing high resolution laminographs, comprising the steps of:
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producing a source of X-rays, wherein said step of producing X-rays further comprises the steps of; generating an electron beam; steering said electron beam with a deflector; striking a target with said electron beam, wherein X-rays are emitted from said target when said electron beam impinges upon said target, said target having an imagable feature; producing an SEM micrograph of said target imagable feature in response to illumination of said feature by said electron beam; analyzing characteristics of said SEM micrograph image of said feature, and providing an output signal in response to said analysis; and providing a feedback system which receives said output signal from said image analysis system, processes said output signal and provides a control signal to said electron beam deflector; and producing a cross sectional image of a cutting plane of an object illuminated by said X-rays using a laminographic detector. - View Dependent Claims (12)
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13. A high resolution laminography system comprising:
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a source of X-rays wherein said source of X-rays further comprises; a source of electrons which generates an electron beam; a deflector for steering said electron beam; a target wherein X-rays are emitted from said target when said electron beam impinges upon said target, said target further comprising a target imagable feature; a first detector for producing an image of said target imagable feature; an image analysis system for analyzing characteristics of said image of said target imagable feature, and providing an output signal in response to said analysis; and a feedback system which receives said output signal from said image analysis system, processes said output signal and provides a control signal to said electron beam deflector; and a laminographic detector for producing a cross sectional image of a cutting plane of an object illuminated by said X-rays emitted by said target. - View Dependent Claims (14)
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Specification