Serrated electromagnetic absorber

• US 5,208,599 A
• Filed: 08/28/1991
• Issued: 05/04/1993
• Est. Priority Date: 08/28/1991
• Status: Expired due to Fees

• Current Assignee: Ohio State University
• Original Assignee: Ohio State University
• Inventors: Yang, Chang-Fa, Rudduck, Roger C., Burnside, Walter D.
• Primary Examiner(s): Sotomayor, John B.
• Application Number:
  US07/751,419
• Time in Patent Office: 615 Days
• Field of Search: 342/4, 342/1, 342/2, 342/3
• US Class Current: 342/4
• CPC Class Codes: G01R 29/105 using anechoic chambers; Chambers or open field sites used therefor test sites used for measuring on other objects than aerials G01R29/0828; wave absorbing devices H01Q17/00
• CPC Class Codes: H01Q 17/008 with a particular shape H01Q17/007 takes precedence

Abstract

Electromagnetic absorber having serrations on a surface or surfaces thereof to reduce reflectivity of incident electromagnetic waves thereon. The serrations form a plurality of fins, the height of adjacent fins being spaced by a small distance. Preferably the total absorber wedge height is greater than about 1 wavelength at the lowest design frequency and the height between the serration tips is less than 1/4 wavelength at the lowest design frequency.

Claims

1. An electromagnetic absorber having a geometrical configuration comprising a plurality of surfaces, at least one of said surfaces having formed thereon a plurality of serrations defining a plurality of fins projecting from said at least one surface, the difference in height between adjacent fins being less than 1/4 freespace wavelengths at the lowest design frequency for reducing the reflection of incident electromagnetic waves from said absorber.

2. The electromagnetic absorber of claim 1, wherein said geometrical configuration is selected from the group consisting of pyramidal, conical and wedge.

3. The electromagnetic absorber of claim 1, wherein said serrations form asymmetrical fins.

4. The electromagnetic absorber of claim 1, wherein said serrations cause the heights of said fins on one surface of said absorber to lie midway between the heights of the fins on another surface of said absorber.

5. The electromagnetic absorber of claim 1, wherein the absorber is non-uniformly doped.

13. The electromagnetic absorber of claim 1, wherein said difference in height between adjacent substrates is about 0.2 freespace wavelengths at the lowest design frequency.

14. The electromagnetic absorber of claim 1 having a total height of greater than about 1 freespace wavelength at the lowest design frequency.

15. The electromagnetic absorber of claim 14, wherein said total height is about 2.1 freespace wavelengths at the lowest design frequency.

16. The electromagnetic absorber of claim 1, wherein said absorber has a width of about 0.7 freespace wavelengths at the lowest design frequency.

6. An anechoic chamber for providing an environment simulating that of freespace, wherein the interior surfaces of said chamber are lined with a plurality of electromagnetic absorbers each having a geometrical configuration comprising a plurality of surfaces, at least one of said surfaces having formed thereon a plurality of serrations defining a plurality of fins projecting from said at least one surface, the difference in height between adjacent fins being less than 1/4 freespace wavelengths at the lowest design frequency for reducing the reflection of incident electromagnetic waves from said absorber.

7. The anechoic chamber of claim 6, wherein said absorbers have geometrical configurations selected from the group consisting of pyramidal, conical and wedge.

8. The anechoic chamber of claim 6, wherein said serrations are asymmetrical.

9. The anechoic chamber of claim 6, wherein said serrations cause the heights of said fins on one surface of said absorber to lie midway between the heights of the fins on another surface of said absorber.

10. The anechoic chamber of claim 6, wherein at least some of said absorbers are non-uniformly doped.

17. The anechoic chamber of claim 6, wherein said difference in height between adjacent substrates is about 0.2 freespace wavelengths at the lowest design frequency.

18. The anechoic chamber of claim 6, wherein said absorbers each have a total height of greater than about 1 freespace wavelength at the lowest design frequency.

19. The anechoic chamber of claim 18, wherein said total height is about 2.1 freespace wavelengths at the lowest design frequency.

20. The anechoic chamber of claim 6, wherein said absorber has a width of about 0.7 freespace wavelengths at the lowest design frequency.

11. A method of reducing the reflectivity of incident electromagnetic waves on an electromagnetic absorber, comprising providing a plurality of serrations on at least one surface of said absorber such that said serrations define a plurality of fins projecting from said at least one surface, the difference in height between adjacent fins being less than 1/4 freespace wavelengths at the lowest design frequency.

12. The method of claim 11, wherein said serrations cause the heights of said fins on one surface of said absorber to lie midway between the heights of the fins on another surface of said absorber.